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In this paper, a theoretical analysis of current-controlled (CC-) MOS current mode logic (MCML) is reported. Furthermore, the circuit performance of the CC-MCML with the auto-detection of threshold voltage (Vth) fluctuation is evaluated. The proposed CC-MCML with the auto-detection of Vth fluctuation automatically suppresses the degradation of circuit performance induced by the Vth fluctuations of the transistors automatically, by detecting these fluctuations. When a Vth fluctuation of ± 0.1 V occurs on the circuit, the cutoff frequency of the circuit is increased from 0 Hz to 3.5 GHz by using the proposed CC-MCML with the auto-detection of Vth fluctuation.
Yoshinori ODA Yasuyuki OHKURA Kaina SUZUKI Sanae ITO Hirotaka AMAKAWA Kenji NISHI
A new analysis method for random dopant induced threshold voltage fluctuations by using Monte Carlo ion implantation were presented. The method was applied to investigate Vt fluctuations due to statistical variation of pocket dopant profile in 0.1µm MOSFET's by 3D process-device simulation system. This method is very useful to analyze a statistical fluctuation in sub-100 nm MOSFET's efficiently.