IEICE TRANSACTIONS on Communications
Radiated Harmonics Characterization of CMOS Test Chip with On-Chip Decoupling Capacitance
Summary :
This paper reports experimental results on far-field radiated emission for different on-chip chip power supply networks. Two types of test chips were developed as noise generators. One was with on-chip decoupling capacitance, and the other was without intentional on-chip decoupling capacitance. They were assembled in a CSP (Chip scale package). The effects of on-chip decoupling capacitance on far-field radiated emission were investigated for the operation of core logic circuits and output buffer circuits. Reduced radiated emission was observed for every harmonics for the operation of core logic circuits by the on-chip decoupling capacitance. While, reduced radiated emission was observed for the even-order harmonics for the operation of output buffer circuits due to the existence of on-chip decoupling capacitance.
- Publication
- IEICE TRANSACTIONS on Communications Vol.E88-B No.8 pp.3195-3199
- Publication Date
- 2005/08/01
- Publicized
- Online ISSN
- DOI
- 10.1093/ietcom/e88-b.8.3195
- Type of Manuscript
- Special Section PAPER (Special Section of 2004 International Symposium on Electromagnetic Compatibility)
- Category
- Printed Circuit Boards
Authors
Keyword
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Toshio SUDO, "Radiated Harmonics Characterization of CMOS Test Chip with On-Chip Decoupling Capacitance" in IEICE TRANSACTIONS on Communications,
vol. E88-B, no. 8, pp. 3195-3199, August 2005, doi: 10.1093/ietcom/e88-b.8.3195.
Abstract: This paper reports experimental results on far-field radiated emission for different on-chip chip power supply networks. Two types of test chips were developed as noise generators. One was with on-chip decoupling capacitance, and the other was without intentional on-chip decoupling capacitance. They were assembled in a CSP (Chip scale package). The effects of on-chip decoupling capacitance on far-field radiated emission were investigated for the operation of core logic circuits and output buffer circuits. Reduced radiated emission was observed for every harmonics for the operation of core logic circuits by the on-chip decoupling capacitance. While, reduced radiated emission was observed for the even-order harmonics for the operation of output buffer circuits due to the existence of on-chip decoupling capacitance.
URL: https://global.ieice.org/en_transactions/communications/10.1093/ietcom/e88-b.8.3195/_p
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@ARTICLE{e88-b_8_3195,
author={Toshio SUDO, },
journal={IEICE TRANSACTIONS on Communications},
title={Radiated Harmonics Characterization of CMOS Test Chip with On-Chip Decoupling Capacitance},
year={2005},
volume={E88-B},
number={8},
pages={3195-3199},
abstract={This paper reports experimental results on far-field radiated emission for different on-chip chip power supply networks. Two types of test chips were developed as noise generators. One was with on-chip decoupling capacitance, and the other was without intentional on-chip decoupling capacitance. They were assembled in a CSP (Chip scale package). The effects of on-chip decoupling capacitance on far-field radiated emission were investigated for the operation of core logic circuits and output buffer circuits. Reduced radiated emission was observed for every harmonics for the operation of core logic circuits by the on-chip decoupling capacitance. While, reduced radiated emission was observed for the even-order harmonics for the operation of output buffer circuits due to the existence of on-chip decoupling capacitance.},
keywords={},
doi={10.1093/ietcom/e88-b.8.3195},
ISSN={},
month={August},}
Copy
TY - JOUR
TI - Radiated Harmonics Characterization of CMOS Test Chip with On-Chip Decoupling Capacitance
T2 - IEICE TRANSACTIONS on Communications
SP - 3195
EP - 3199
AU - Toshio SUDO
PY - 2005
DO - 10.1093/ietcom/e88-b.8.3195
JO - IEICE TRANSACTIONS on Communications
SN -
VL - E88-B
IS - 8
JA - IEICE TRANSACTIONS on Communications
Y1 - August 2005
AB - This paper reports experimental results on far-field radiated emission for different on-chip chip power supply networks. Two types of test chips were developed as noise generators. One was with on-chip decoupling capacitance, and the other was without intentional on-chip decoupling capacitance. They were assembled in a CSP (Chip scale package). The effects of on-chip decoupling capacitance on far-field radiated emission were investigated for the operation of core logic circuits and output buffer circuits. Reduced radiated emission was observed for every harmonics for the operation of core logic circuits by the on-chip decoupling capacitance. While, reduced radiated emission was observed for the even-order harmonics for the operation of output buffer circuits due to the existence of on-chip decoupling capacitance.
ER -
English
