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IEICE TRANSACTIONS on Communications

Characteristics of Discharge Currents Measured through Body-Attached Metal for Modeling ESD from Wearable Electronic Devices

Takeshi ISHIDA, Fengchao XIAO, Yoshio KAMI, Osamu FUJIWARA, Shuichi NITTA

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Summary :

To investigate electrostatic discharge (ESD) immunity testing for wearable electronic devices, the worst scenario i.e., an ESD event occurs when the body-mounted device approaches a grounded conductor is focused in this paper. Discharge currents caused by air discharges from a charged human through a hand-held metal bar or through a semi-sphere metal attached to the head, arm or waist in lieu of actual wearable devices are measured. As a result, it is found that at a human charge voltage of 1kV, the peak current from the semi-sphere metal is large in order of the attachment of the waist (15.4A), arm (12.8A) and head (12.2A), whereas the peak current (10.0A) from the hand-held metal bar is the smallest. It is also found that the discharge currents through the semi-sphere metals decrease to zero at around 50ns regardless of the attachment positions, although the current through the hand-held metal bar continues to flow at over 90ns. These discharge currents are further characterized by the discharge resistance, the charge storage capacitance and the discharge time constant newly derived from the waveform energy, which are validated from the body impedance measured through the hand-held and body-mounted metals. The above finding suggests that ESD immunity test methods for wearable devices require test specifications entirely different from the conventional ESD immunity testing.

Publication
IEICE TRANSACTIONS on Communications Vol.E99-B No.1 pp.186-191
Publication Date
2016/01/01
Publicized
Online ISSN
1745-1345
DOI
10.1587/transcom.2015EBP3184
Type of Manuscript
PAPER
Category
Electromagnetic Compatibility(EMC)

Authors

Takeshi ISHIDA
  Noise Laboratory Co. LTD.
Fengchao XIAO
  The University of Electro-Communica-tions
Yoshio KAMI
  The University of Electro-Communica-tions
Osamu FUJIWARA
  The University of Electro-Communica-tions
Shuichi NITTA
  Noise Laboratory Co. LTD.

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