Shift margins in down and cross track directions and skew angle were investigated using micromagnetic simulation with a shielded planar head for patterned media with an areal density of 1 Tbit/in2. The shift margins were quantitatively estimated using parameters of the head field and the magnetic properties of media. It is essential to use a head with a higher field gradient and a medium with a small field width between saturation and nucleation fields, to obtain a larger down track shift margin, and a head with a narrower cross track field distribution to obtain a larger cross track shift margin and skew angle margin.
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Naoki HONDA, Kiyoshi YAMAKAWA, Kazuhiro OUCHI, "Simulation Study of Factors That Determine Write Margins in Patterned Media" in IEICE TRANSACTIONS on Electronics,
vol. E90-C, no. 8, pp. 1594-1598, August 2007, doi: 10.1093/ietele/e90-c.8.1594.
Abstract: Shift margins in down and cross track directions and skew angle were investigated using micromagnetic simulation with a shielded planar head for patterned media with an areal density of 1 Tbit/in2. The shift margins were quantitatively estimated using parameters of the head field and the magnetic properties of media. It is essential to use a head with a higher field gradient and a medium with a small field width between saturation and nucleation fields, to obtain a larger down track shift margin, and a head with a narrower cross track field distribution to obtain a larger cross track shift margin and skew angle margin.
URL: https://global.ieice.org/en_transactions/electronics/10.1093/ietele/e90-c.8.1594/_p
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@ARTICLE{e90-c_8_1594,
author={Naoki HONDA, Kiyoshi YAMAKAWA, Kazuhiro OUCHI, },
journal={IEICE TRANSACTIONS on Electronics},
title={Simulation Study of Factors That Determine Write Margins in Patterned Media},
year={2007},
volume={E90-C},
number={8},
pages={1594-1598},
abstract={Shift margins in down and cross track directions and skew angle were investigated using micromagnetic simulation with a shielded planar head for patterned media with an areal density of 1 Tbit/in2. The shift margins were quantitatively estimated using parameters of the head field and the magnetic properties of media. It is essential to use a head with a higher field gradient and a medium with a small field width between saturation and nucleation fields, to obtain a larger down track shift margin, and a head with a narrower cross track field distribution to obtain a larger cross track shift margin and skew angle margin.},
keywords={},
doi={10.1093/ietele/e90-c.8.1594},
ISSN={1745-1353},
month={August},}
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TY - JOUR
TI - Simulation Study of Factors That Determine Write Margins in Patterned Media
T2 - IEICE TRANSACTIONS on Electronics
SP - 1594
EP - 1598
AU - Naoki HONDA
AU - Kiyoshi YAMAKAWA
AU - Kazuhiro OUCHI
PY - 2007
DO - 10.1093/ietele/e90-c.8.1594
JO - IEICE TRANSACTIONS on Electronics
SN - 1745-1353
VL - E90-C
IS - 8
JA - IEICE TRANSACTIONS on Electronics
Y1 - August 2007
AB - Shift margins in down and cross track directions and skew angle were investigated using micromagnetic simulation with a shielded planar head for patterned media with an areal density of 1 Tbit/in2. The shift margins were quantitatively estimated using parameters of the head field and the magnetic properties of media. It is essential to use a head with a higher field gradient and a medium with a small field width between saturation and nucleation fields, to obtain a larger down track shift margin, and a head with a narrower cross track field distribution to obtain a larger cross track shift margin and skew angle margin.
ER -