Ga-doped ZnO thin films were prepared by RF magnetron sputtering. The effects of adding H2 to pure Ar sputtering gas were investigated. In the case of pure Ar at 2 Pa, the resistivity is 7.45
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Koichi MUTO, Satoru ODASHIMA, Norimitsu NASU, Osamu MICHIKAMI, "Characteristcs of Ga-Doped ZnO Films Prepared by RF Magnetron Sputtering in Ar+H2 Ambience" in IEICE TRANSACTIONS on Electronics,
vol. E91-C, no. 10, pp. 1649-1652, October 2008, doi: 10.1093/ietele/e91-c.10.1649.
Abstract: Ga-doped ZnO thin films were prepared by RF magnetron sputtering. The effects of adding H2 to pure Ar sputtering gas were investigated. In the case of pure Ar at 2 Pa, the resistivity is 7.45
URL: https://global.ieice.org/en_transactions/electronics/10.1093/ietele/e91-c.10.1649/_p
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@ARTICLE{e91-c_10_1649,
author={Koichi MUTO, Satoru ODASHIMA, Norimitsu NASU, Osamu MICHIKAMI, },
journal={IEICE TRANSACTIONS on Electronics},
title={Characteristcs of Ga-Doped ZnO Films Prepared by RF Magnetron Sputtering in Ar+H2 Ambience},
year={2008},
volume={E91-C},
number={10},
pages={1649-1652},
abstract={Ga-doped ZnO thin films were prepared by RF magnetron sputtering. The effects of adding H2 to pure Ar sputtering gas were investigated. In the case of pure Ar at 2 Pa, the resistivity is 7.45
keywords={},
doi={10.1093/ietele/e91-c.10.1649},
ISSN={1745-1353},
month={October},}
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TY - JOUR
TI - Characteristcs of Ga-Doped ZnO Films Prepared by RF Magnetron Sputtering in Ar+H2 Ambience
T2 - IEICE TRANSACTIONS on Electronics
SP - 1649
EP - 1652
AU - Koichi MUTO
AU - Satoru ODASHIMA
AU - Norimitsu NASU
AU - Osamu MICHIKAMI
PY - 2008
DO - 10.1093/ietele/e91-c.10.1649
JO - IEICE TRANSACTIONS on Electronics
SN - 1745-1353
VL - E91-C
IS - 10
JA - IEICE TRANSACTIONS on Electronics
Y1 - October 2008
AB - Ga-doped ZnO thin films were prepared by RF magnetron sputtering. The effects of adding H2 to pure Ar sputtering gas were investigated. In the case of pure Ar at 2 Pa, the resistivity is 7.45
ER -