IEICE TRANSACTIONS on Electronics
Micro-Structural Study of Fretting Contact Caused by the Difference of the Tin Plating Thickness
Summary :
In recent years, there has been increasing demand to miniaturize wiring harness connectors in automobiles due to the increasing volume of electronic equipment and the reduction of the installation space allocated for the electronic equipment in automobiles for the comfort of the passengers. With this demand, contact failure caused by the fretting corrosion is expected to become a serious problem. In this report, we examined micro-structural observations of fretting contacts of two different tin plating thicknesses using Scanning Electron Microscopy (SEM) and Transmission Electron Microscopy (TEM) and so on. Based on the results, we compared the microstructure difference of fretting contact caused by the difference of the tin plating thickness.
- Publication
- IEICE TRANSACTIONS on Electronics Vol.E91-C No.8 pp.1199-1205
- Publication Date
- 2008/08/01
- Publicized
- Online ISSN
- 1745-1353
- DOI
- 10.1093/ietele/e91-c.8.1199
- Type of Manuscript
- Special Section PAPER (Special Section on Recent Development of Electromechanical Devices(Selected Papers from IS-EMD2007))
- Category
- Contact Phenomena
Authors
Keyword
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Tetsuya ITO, Shigeru SAWADA, Yasuhiro HATTORI, Yasushi SAITOH, Terutaka TAMAI, Kazuo IIDA, "Micro-Structural Study of Fretting Contact Caused by the Difference of the Tin Plating Thickness" in IEICE TRANSACTIONS on Electronics,
vol. E91-C, no. 8, pp. 1199-1205, August 2008, doi: 10.1093/ietele/e91-c.8.1199.
Abstract: In recent years, there has been increasing demand to miniaturize wiring harness connectors in automobiles due to the increasing volume of electronic equipment and the reduction of the installation space allocated for the electronic equipment in automobiles for the comfort of the passengers. With this demand, contact failure caused by the fretting corrosion is expected to become a serious problem. In this report, we examined micro-structural observations of fretting contacts of two different tin plating thicknesses using Scanning Electron Microscopy (SEM) and Transmission Electron Microscopy (TEM) and so on. Based on the results, we compared the microstructure difference of fretting contact caused by the difference of the tin plating thickness.
URL: https://global.ieice.org/en_transactions/electronics/10.1093/ietele/e91-c.8.1199/_p
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@ARTICLE{e91-c_8_1199,
author={Tetsuya ITO, Shigeru SAWADA, Yasuhiro HATTORI, Yasushi SAITOH, Terutaka TAMAI, Kazuo IIDA, },
journal={IEICE TRANSACTIONS on Electronics},
title={Micro-Structural Study of Fretting Contact Caused by the Difference of the Tin Plating Thickness},
year={2008},
volume={E91-C},
number={8},
pages={1199-1205},
abstract={In recent years, there has been increasing demand to miniaturize wiring harness connectors in automobiles due to the increasing volume of electronic equipment and the reduction of the installation space allocated for the electronic equipment in automobiles for the comfort of the passengers. With this demand, contact failure caused by the fretting corrosion is expected to become a serious problem. In this report, we examined micro-structural observations of fretting contacts of two different tin plating thicknesses using Scanning Electron Microscopy (SEM) and Transmission Electron Microscopy (TEM) and so on. Based on the results, we compared the microstructure difference of fretting contact caused by the difference of the tin plating thickness.},
keywords={},
doi={10.1093/ietele/e91-c.8.1199},
ISSN={1745-1353},
month={August},}
Copy
TY - JOUR
TI - Micro-Structural Study of Fretting Contact Caused by the Difference of the Tin Plating Thickness
T2 - IEICE TRANSACTIONS on Electronics
SP - 1199
EP - 1205
AU - Tetsuya ITO
AU - Shigeru SAWADA
AU - Yasuhiro HATTORI
AU - Yasushi SAITOH
AU - Terutaka TAMAI
AU - Kazuo IIDA
PY - 2008
DO - 10.1093/ietele/e91-c.8.1199
JO - IEICE TRANSACTIONS on Electronics
SN - 1745-1353
VL - E91-C
IS - 8
JA - IEICE TRANSACTIONS on Electronics
Y1 - August 2008
AB - In recent years, there has been increasing demand to miniaturize wiring harness connectors in automobiles due to the increasing volume of electronic equipment and the reduction of the installation space allocated for the electronic equipment in automobiles for the comfort of the passengers. With this demand, contact failure caused by the fretting corrosion is expected to become a serious problem. In this report, we examined micro-structural observations of fretting contacts of two different tin plating thicknesses using Scanning Electron Microscopy (SEM) and Transmission Electron Microscopy (TEM) and so on. Based on the results, we compared the microstructure difference of fretting contact caused by the difference of the tin plating thickness.
ER -
English
