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IEICE TRANSACTIONS on Electronics

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Advance publication (published online immediately after acceptance)

Volume E91-C No.8  (Publication Date:2008/08/01)

    Special Section on Recent Development of Electromechanical Devices(Selected Papers from IS-EMD2007)
  • FOREWORD

    Shigeru UMEMURA  

     
    FOREWORD

      Page(s):
    1177-1177
  • High Speed Electronic Connector Design: A Review of Electrical and Electromagnetic Properties of Passive Contact Elements -- Part 1

    Roland S. TIMSIT  

     
    INVITED PAPER

      Page(s):
    1178-1191

    At high signal frequencies (i.e. in the GHz range), a connector must be considered as part of an electromagnetic transmission line. At these frequencies, the impedance characteristics of the connector stemming from the distributed inductance and capacitance of pins and the associated wiring, must be carefully controlled; insertion losses must be minimized and undesirable coupling between non-neighboring pins giving rise to crosstalk must be avoided to achieve optimal signal transmission. This paper reviews fundamental issues associated with the performance optimization of multi-conductor connector structures for high speed signal transmission. The paper complements an earlier publication that reviewed the major factors affecting electrical contact resistance at high frequencies [1].

  • Contact Resistance Characteristics of Improved Conductive Elastomer Contacts for Contaminated Printed Circuit Board in SO2 Environment

    Terutaka TAMAI  Yasushi SAITOH  Yasuhiro HATTORI  Hirosaka IKEDA  

     
    PAPER-Contact Phenomena

      Page(s):
    1192-1198

    Characteristics of conductive elastomer that is composed of silicone rubber and dispersed carbon black particles show conductive and elastic properties in one simple material. This material has been widely applied to make-break contacts of panel switches and connectors of liquid crystal panels. However, since surface state of the contact is very soft, it is difficult to remove contaminant films of contaminated opposite side contact surface and to obtain low contact resistance owing to break the film. This is an important problem to be solved not only for the application of make-break switching contact but also static connector contacts. This study has been conducted to examine some complex structures of the elastomer which indicate removal characteristics for contaminant films and low contact resistance. As specimens, six different types of elastomer contacts composed of different type of dispersed materials as carbon and metal fibers, metal mesh, and plated surfaces were used. The contacts of opposite side were Au and Sn plated contact surface on a printed circuit board (PCB) which is usually used in the static connector and make-break contacts. In order to contaminate contact surfaces of PCB, the surfaces were subjected to exposure in an SO2 gas environment. The elastomeric contacts contained hard materials showed lower contact resistance than only dispersed carbon particles in the elastomer matrix for both contaminated PCB contact surfaces.

  • Micro-Structural Study of Fretting Contact Caused by the Difference of the Tin Plating Thickness

    Tetsuya ITO  Shigeru SAWADA  Yasuhiro HATTORI  Yasushi SAITOH  Terutaka TAMAI  Kazuo IIDA  

     
    PAPER-Contact Phenomena

      Page(s):
    1199-1205

    In recent years, there has been increasing demand to miniaturize wiring harness connectors in automobiles due to the increasing volume of electronic equipment and the reduction of the installation space allocated for the electronic equipment in automobiles for the comfort of the passengers. With this demand, contact failure caused by the fretting corrosion is expected to become a serious problem. In this report, we examined micro-structural observations of fretting contacts of two different tin plating thicknesses using Scanning Electron Microscopy (SEM) and Transmission Electron Microscopy (TEM) and so on. Based on the results, we compared the microstructure difference of fretting contact caused by the difference of the tin plating thickness.

  • Breaking Contact Phenomena of a Time-coordinated Non-arcing Relay

    Noboru WAKATSUKI  Hiroshi HONMA  

     
    PAPER-Contact Phenomena

      Page(s):
    1206-1210

    VI time responses of a conventional electromagnetic relay during breaking contact operations were measured. In a conventional switching circuit, unstable contact resistance, irregular bouncing, and poor reproducibility were confirmed. Using a transient current switch circuit and two sharpened contact electrodes, bouncing during a breaking operation was suppressed, and unstable contact resistance changes and reproducibility of breaking operation were also improved.

  • A Study on Contact Spots of Earthquake Disaster Prevention Relays

    Yoshitada WATANABE  Yuichi HIRAKAWA  

     
    PAPER-Contact Phenomena

      Page(s):
    1211-1214

    This paper reports on the effect of switching action on the contact surfaces of earthquake disaster prevention relays. Large-scale earthquakes occur frequently in Japan and bring extensive damage with them, and fire caused by electrical equipments is one example of the serious damage which can occur. Earthquake sensors capable of maintaining a high level of reliability when earthquakes occur play an important role as a means of minimizing this damage. For this reason, we carried out observations by focusing on samples which had either been subjected to an electric current of 10 mA or 0.1 A. The samples of 10 mA exhibited low and constant contact resistance despite the addition of seismic motion, while the samples of 0.1 A samples exhibited varying contact resistance and damage on their contact spots resulting from the addition of seismic motion. The sample surfaces were then observed using an atomic force microscope (AFM) in tapping mode and a surface potential microscope (SPoM). As a result, we found that even the unused earthquake disaster prevention relay (standard sample) which had a surface lined with asperities on its parallel striations formed by irregular protrusions due to dust and other deposits. In addition, scanning the contact surface with the SPoM at the same potential revealed the occurrence of differences in surface potential which varied in response to the asperities on the striations.

  • 3-D Finite Element Analysis of Dynamic Characteristics of Twin-Type Relay Interfered by Uniform Constant Magnetic Field

    Guofu ZHAI  Wenying YANG  Xue ZHOU  

     
    PAPER-Contact Phenomena

      Page(s):
    1215-1221

    Research on the electromagnetic compatibility of functional module composed of two independent electromagnetic relays in a hermetically sealed shell is the technical foundation for integration and miniaturization of electronic equipment in the future. In this paper, 3D finite element method (FEM) was used to analyze the dynamic characteristics of twin-type relay interfered by uniform constant magnetic field and identify the sensitive direction in which the relay was easily interfered. The models of twin-type relay in three working states were founded. Through simulation and analysis, it was found out how the operation time and electromagnetic torque of twin-type relay changed with the outer interfered magnetic field. When the relay was on the point of operation failure, the critical value of magnetic field was calculated through simulation. The simulation results of the dynamic characteristics of twin-type relay agree well with the experimental data. The conclusion in this paper is of great value for research on the electromagnetic compatibility of relay functional module.

  • Research on Effect of Ferromagnetic Material on the Critical Current of Bi-2223 Tape

    Yi WU  Mingzhe RONG  Jian LI  Xiaohua WANG  

     
    PAPER-Contact Phenomena

      Page(s):
    1222-1227

    In this paper we mainly focus on the effect of a ferromagnetic material on the critical current of Bi-2223 tape. The magnetic field distributions of tapes with several different layouts of a ferromagnetic material are investigated by calculation and the corresponding critical current is tested experimentally. The analysis indicates that the critical current of the tape can be improved effectively by laying the ferromagnetic material perpendicularly next to the tape edge. Furthermore, various other ferromagnetic parameters are also important for reducing the magnetic field induced by the current flowing through the tape.

  • An Integrated Calculation Method to Predict Arc Behavior

    Xingwen LI  Degui CHEN  

     
    LETTER-Arc Discharge & Related Phenomena

      Page(s):
    1228-1229

    The precision of magnetic field calculation is crucial to predict the arc behavior using magnetohydrodynamic (MHD) model. A integrated calculation method is proposed to couple the calculation of magnetic field and fluid dynamics based on the commercial software ANSYS and FLUENT, which especially benefits to take into account the existence of the ferromagnetic parts. An example concerning air arc is presented using the method.

  • The Relationship between Voltage and Duration of Short-Time Arc Generated by Slowly Breaking Silver Contact

    Yoshiki KAYANO  Hikaru MIURA  Kazuaki MIYANAGA  Hiroshi INOUE  

     
    LETTER-Arc Discharge & Related Phenomena

      Page(s):
    1230-1232

    Arc discharge generated by breaking electrical contact is considered as a main source of an undesired electromagnetic (EM) noise. To clarify mechanism of generation of the EM noise, feature extraction of bridge and short-time arc waveforms generated by slowly breaking Ag contact was discussed experimentally. The short-duration time arc before the ignition of the continuous metallic arc discharge was observed. The highest probability density voltage is defined as short-arc sustainable voltage (SASV). The relationship between SASV and duration of short-time arc was quantified experimentally. It is revealed that as the arc voltage of the short-time arc is higher, its duration becomes longer.

  • Study on Arc Generated by Opening Electromagnetic Relay Contacts in DC Low-Current Resistive Circuit with Constant Velocity

    Guofu ZHAI  Xue ZHOU  

     
    PAPER-Arc Discharge & Related Phenomena

      Page(s):
    1233-1239

    An electrical arc is generated by opening the contacts of a relay when the current is above the minimum arc current in a circuit. A magneto-hydrodynamic (MHD) model was employed to simulate this dynamic arcing process. The distributions of arc parameters such as temperature, electrical field and magnetic flux density generated by opening the contacts in a circuit with a 5 A DC low current were obtained. The behaviors of the arc parameters with increasing gap length between the contacts were also simulated. The MHD model was then combined with structured dynamic layering, which is a dynamic meshing technique of computational fluid dynamics (CFD) to calculate the dynamic arcing process, and the arc parameters generated by opening the contacts in the circuit with a 5 A DC low current with a constant velocity were also obtained. It turned out that the computed time-varying contact voltage and arc duration agreed well with the test results. Thus, the validity of the simulation was demonstrated.

  • Simulation and Experimental Study of Arc Motion in a Low-Voltage Circuit Breaker Considering Wall Ablation

    Qiang MA  Mingzhe RONG  Anthony B. MURPHY  Yi WU  Tiejun XU  Fei YANG  

     
    PAPER-Arc Discharge & Related Phenomena

      Page(s):
    1240-1248

    This paper focuses on the numerical and experimental investigations of the influence of two polymers (PA6 and POM) on the arc behavior during arc motion process. The mathematical model of 3-dimentional air arc plasma considering the ablation of lateral walls is built based on magnetic hydro-dynamics (MHD). By adopting the commercial computational fluid dynamics (CFD) package based on control-volume method, the above MHD model is solved and the distribution of temperature field, concentration field, flow field and electrical potential field in the arc chamber are calculated. The simulation results indicate that the vapor concentration behind the arc column is higher than that in front of the arc column because of the existence of "double vortices" in the arc chamber. The use of polymers causes the maximal arc voltage increase 16.2% with POM and 18.9% with PA6 in this case and causes the average arc velocity increase 15.8% with POM and 21.1% with PA6 in this case. The experiments are also carried out to study the influence of polymers on arc voltage and arc root position in the arc chamber during arc motion. The experimental results prove the validity of the numerical investigation.

  • Relationship between Arc Duration and Motion of Arc Spots for Break Arcs of Ag and Ag/ZnO Electrical Contacts

    Junya SEKIKAWA  Takumi SUGIO  Takayoshi KUBONO  

     
    PAPER-Arc Discharge & Related Phenomena

      Page(s):
    1249-1254

    Break arcs are generated in a DC 42 V-10 A resistive circuit. The contact material is Ag or Ag/ZnO. The number of break operations is two hundreds for each contact material. The motion of break arcs is observed with a high-speed camera. Relationship between the dependence of arc duration on the number of operations and the motion of arc spots is investigated. The following results are shown. For Ag contacts the arc duration is almost constant independent to the number of break operations. For Ag/ZnO contacts, on the other hand, the arc duration changes irregularly to short (59 ms) or long (69 ms) arc-duration after 30th break operation. The moving range of arc spots on contact surfaces is broad for the case of short arc-duration and is narrow for the case of long arc-duration. The cause of the results for Ag/ZnO contacts is considered that the difference of the boiling points of Ag and ZnO leads to the porous structure on the contact surface.

  • Motion of Break Arcs Driven by External Magnetic Field in a DC42 V Resistive Circuit

    Junya SEKIKAWA  Takayoshi KUBONO  

     
    PAPER-Arc Discharge & Related Phenomena

      Page(s):
    1255-1260

    Motion of break arcs driven by external magnetic field is observed using a high-speed camera. The magnetic field is applied with a permanent magnet. Experimental circuit is DC42 V-10 A resistive circuit. Material of electrical contacts is silver. Following results are shown. The break arcs are driven in the direction according to Lorentz force. The arc duration decreases with decrease of the distance between the electrical contacts and the magnet. When the external magnetic-flux density at the position of the break arc is lower than a certain value, the effect of the magnetic field to drive the break arc becomes ineffective to shorten the arc duration. The result is explained with a relationship between the motion of break arc and the distribution of the external magnetic field.

  • Effect of Back-Volume of Arc-Quenching Chamber on Arc Behavior

    Ruicheng DAI  Degui CHEN  Xingwen LI  Chunping NIU  Weixiong TONG  Honggang XIANG  

     
    PAPER-Arc Discharge & Related Phenomena

      Page(s):
    1261-1267

    The gas-puffer effect has important effects on the interruption capability of a molded case circuit breaker (MCCB). In this paper, on the basis of a simplified model of an arc chamber with a single break, the effect of back-volume of an arc-quenching chamber on arc behavior in an MCCB is investigated. Firstly, using a 2-D optical-fiber arc-motion measurement system, experiments are performed to study the effect of back-volume on the arc-motion and gas pressure in an arc-quenching chamber. We demonstrate that the lower back-volume of the arc-quenching chamber is, the higher the pressure and the better the arc motion will be. Then, corresponding to the above experiments, the gas pressure inside the arc-quenching chamber is calculated using the integral conservation equation. The simulation results are consistent with the experimental results.

  • Time-Resolved Spectroscopic Temperature Measurement of Break Arcs in a D.C.42 V Resistive Circuit

    Junya SEKIKAWA  Naoki MORIYAMA  Takayoshi KUBONO  

     
    PAPER-Arc Discharge & Related Phenomena

      Page(s):
    1268-1272

    In a D.C.42 V-10A resistive circuit, break arcs are generated between electrical contact pairs. The materials of the contact pairs are Ag, Ag/C 2wt%, Ag/SnO2 12wt%, and Ag/ZnO 12wt%. The arc spectral intensities are measured by a time-resolved spectroscopic temperature measurement system. The arc temperature is calculated from the spectral intensities by using the method of relative intensities of two spectra. The experimental results are as follows. The arc temperature gradually decreases with increase of the gap of electrical contacts. The ranges of arc temperature for Ag, Ag/C 2wt%, Ag/SnO2 12wt%, and Ag/ZnO 12wt% contacts pairs are 4500-11000 K, 4000-6000 K, 4000-7000 K, and 4000-11000 K, respectively.

  • Analysis and Optimization for a Contactor with Feedback Controlled Magnet System

    Yingyi LIU  Degui CHEN  Chunping NIU  Liang JI  Weixiong TONG  

     
    PAPER-Contactors & Circuit Breakers

      Page(s):
    1273-1279

    In the optimum design of AC contactors, it is important to analyze the dynamic behavior. Moreover, movable contact and core bounces have remarkable effect on the lifetime of contactors. According to a new kind of contactor with feedback controlled magnet system, this paper builds two different sets of periodically inter-transferred equations to obtain the dynamic characteristics of the contactor. The equations describe the coupling of the electric circuit, electromagnetic field and mechanical system taking account of the influence of friction. Then, the paper gives an optimum design to the dimension and the duty ratio of the contactor' pulse modulated wave (PWM) under different exciting, and proves, by experiment and simulation, that the bounce time of the contactor working in the optimized duty ratio is much less than that of the general AC contactors.

  • Analysis and Optimization for the Operating Mechanism of Air Circuit Breaker

    Degui CHEN  Liang JI  Yunfeng WANG  Yingyi LIU  

     
    PAPER-Contactors & Circuit Breakers

      Page(s):
    1280-1285

    This paper simulates the dynamic behavior of the operating mechanism of ACB, and analyzes factors influencing the mechanism's operating time. First, it builds a dynamic model for the mechanism with virtual prototype technology. Experiment validation is carried out to prove the correctness of the model. Based on this model, it puts emphasis on analyzing the influence of electro-dynamic repulsion force on the operating time of the mechanism. Simulation and experimental results show that after adding electric repulsion force to the model, the operating time is shortened about 1.1 ms. Besides the repulsion force, other influencing factors including the stiffness of opening spring, locations of every key axis, mass and centroidal coordinates of every mechanical part are analyzed as well. Finally, it makes an optimum design for the mechanism. After optimization, the velocity of operating mechanism is improved about 6.7%.

  • Thermal Analysis of AC Contactor Using Thermal Network Finite Difference Analysis Method

    Chunping NIU  Degui CHEN  Xingwen LI  Yingsan GENG  

     
    PAPER-Contactors & Circuit Breakers

      Page(s):
    1286-1291

    To predict the thermal behavior of switchgear quickly, the Thermal Network Finite Difference Analysis method (TNFDA) is adopted in thermal analysis of AC contactor in the paper. The thermal network model is built with nodes, thermal resistors and heat generators, and it is solved using finite difference method (FDM). The main circuit and the control system are connected by thermal resistors network, which solves the problem of multi-sources interaction in the application of TNFDA. The temperature of conducting wires is calculated according to the heat transfer process and the fundamental equations of thermal conduction. It provides a method to solve the problem of boundary conditions in applying the TNFDA. The comparison between the results of TNFDA and measurements shows the feasibility and practicability of the method.

  • A New Method to Evaluate the Short-Time Withstand Current for Air Circuit Breaker

    Honggang XIANG  Degui CHEN  Xingwen LI  Weixiong TONG  

     
    PAPER-Contactors & Circuit Breakers

      Page(s):
    1292-1298

    Short-time withstand current is one of the crucial nominal parameters in air circuit breaker. A numerical method to evaluate the short-time withstand current is proposed. Cylindrical current carrying bridge is introduced to describe the contact spot between movable and fixed contacts. Taking into account the action of ferromagnetic splitter plates, the variation of the conductor properties with temperature and the variation of contact spot radius with the electro-dynamic repulsion force, a transient finite element calculation model is developed by coupling the electromagnetic field and thermal field. The loaded short circuit current is considered as the short-time withstand current once the highest temperature is near to the melting point of the contact material. It demonstrates that the method is useful to evaluate the performance of the air circuit breaker.

  • Research on Mechanical Fault Prediction Algorithm for Circuit Breaker Based on Sliding Time Window and ANN

    Xiaohua WANG  Mingzhe RONG  Juan QIU  Dingxin LIU  Biao SU  Yi WU  

     
    PAPER-Contactors & Circuit Breakers

      Page(s):
    1299-1305

    A new type of algorithm for predicting the mechanical faults of a vacuum circuit breaker (VCB) based on an artificial neural network (ANN) is proposed in this paper. There are two types of mechanical faults in a VCB: operation mechanism faults and tripping circuit faults. An angle displacement sensor is used to measure the main axle angle displacement which reflects the displacement of the moving contact, to obtain the state of the operation mechanism in the VCB, while a Hall current sensor is used to measure the trip coil current, which reflects the operation state of the tripping circuit. Then an ANN prediction algorithm based on a sliding time window is proposed in this paper and successfully used to predict mechanical faults in a VCB. The research results in this paper provide a theoretical basis for the realization of online monitoring and fault diagnosis of a VCB.

  • Fundamental Measurement of Electromagnetic Field Radiated from a Coaxial Transmission Line Caused by Connector Contact Failure

    Yu-ichi HAYASHI  Hideaki SONE  

     
    PAPER-Signal Transmission

      Page(s):
    1306-1312

    When contact failure occurs in a connector in a coaxial HF signal transmission line, an electromagnetic field is radiated around the line. We have measured the electromagnetic field and examined the characteristics of such radiation. The results show that the radiation is related to the contact resistance and the symmetry of the distribution of contact points at the connector. When contact resistance is low, radiation is observed at resonant frequencies related to the length of the transmission line. If a connector has axially asymmetric contact points, its radiation is higher than that when the contact points are symmetric. We show that if contact points in a connector are axially symmetrical with resistance lower than 0.25 Ω, the electromagnetic interference caused by the connector contact failure is as low as the background noise.

  • Special Section on Microelectronic Test Structures (ICMTS2007)
  • FOREWORD

    Yoshio MITA  

     
    FOREWORD

      Page(s):
    1313-1314
  • Leakage Current and Floating Gate Capacitor Matching Test

    Weidong TIAN  Joe R. TROGOLO  Bob TODD  

     
    INVITED PAPER

      Page(s):
    1315-1320

    Capacitor mismatch is an important device parameter for precision analog applications. In the last ten years, the floating gate measurement technique has been widely used for its characterization. In this paper we describe the impact of leakage current on the technique. The leakage can come from, for example, thin gate oxide MOSFETs or high dielectric constant capacitors in advanced technologies. SPICE simulation, bench measurement, analytical model and numerical analyses are presented to illustrate the problem and key contributing factors. Criteria for accurate capacitor systematic and random mismatch characterization are developed, and practical methods of increasing measurement accuracy are discussed.

  • Low-Capacitance and Fast Turn-on SCR for RF ESD Protection

    Chun-Yu LIN  Ming-Dou KER  Guo-Xuan MENG  

     
    PAPER

      Page(s):
    1321-1330

    With the smaller layout area and parasitic capacitance under the same electrostatic discharge (ESD) robustness, silicon-controlled rectifier (SCR) has been used as an effective on-chip ESD protection device in radio-frequency (RF) IC. In this paper, SCR's with the waffle layout structures are studied to minimize the parasitic capacitance and the variation of the parasitic capacitance within ultra-wide band (UWB) frequencies. With the reduced parasitic capacitance and capacitance variation, the degradation on UWB RF circuit performance can be minimized. Besides, the fast turn-on design on the low-capacitance SCR without increasing the I/O loading capacitance is investigated and applied to an UWB RF power amplifier (PA). The PA co-designed with SCR in the waffle layout structure has been fabricated. Before ESD stress, the RF performances of the ESD-protected PA are as well as that of the unprotected PA. After ESD stress, the unprotected PA is seriously degraded, whereas the ESD-protected PA still keeps the performances well.

  • A Test Structure for Asymmetry and Orientation Dependence Analysis of CMOSFETs

    Toshihiro MATSUDA  Yuya SUGIYAMA  Keita NOHARA  Kazuhiro MORITA  Hideyuki IWATA  Takashi OHZONE  Takayuki MORISHITA  Kiyotaka KOMOKU  

     
    PAPER

      Page(s):
    1331-1337

    A test structure to analyze asymmetry and orientation dependence of MOSFETs is presented. n-MOSFETs with 8 different channel orientation and three kinds of process conditions were measured and symmetry characteristics of IDsat and IBmax with respect to the interchange of source and drain was examined. Although both IDsat and IBmax have similar channel orientation dependence, IBmax in interchanged S/D measurements shows asymmetrical characteristics, which can be applied to a sensitive method for device asymmetry detection.

  • A Large-Scale, Flip-Flop RAM Imitating a Logic LSI for Fast Development of Process Technology

    Masako FUJII  Koji NII  Hiroshi MAKINO  Shigeki OHBAYASHI  Motoshige IGARASHI  Takeshi KAWAMURA  Miho YOKOTA  Nobuhiro TSUDA  Tomoaki YOSHIZAWA  Toshikazu TSUTSUI  Naohiko TAKESHITA  Naofumi MURATA  Tomohiro TANAKA  Takanari FUJIWARA  Kyoko ASAHINA  Masakazu OKADA  Kazuo TOMITA  Masahiko TAKEUCHI  Shigehisa YAMAMOTO  Hiromitsu SUGIMOTO  Hirofumi SHINOHARA  

     
    PAPER

      Page(s):
    1338-1347

    We propose a new large-scale logic test element group (TEG), called a flip-flop RAM (FF-RAM), to improve the total process quality before and during initial mass production. It is designed to be as convenient as an SRAM for measurement and to imitate a logic LSI. We implemented a 10 Mgates FF-RAM using our 65-nm CMOS process. The FF-RAM enables us to make fail-bit maps (FBM) of logic cells because of its cell array structure as an SRAM. An FF-RAM has an additional structure to detect the open and short failure of upper metal layers. The test results show that it can detect failure locations and layers effortlessly using FBMs. We measured and analyzed it for both the cell arrays and the upper metal layers. Their results provided many important clues to improve our processes. We also measured the neutron-induced soft error rate (SER) of FF-RAM, which is becoming a serious problem as transistors become smaller. We compared the results of the neutron-induced soft error rate to those of previous generations: 180 nm, 130 nm, and 90 nm. Because of this TEG, we can considerably shorten the development period for advanced CMOS technology.

  • Regular Section
  • Adaptive Impedance Matching System Using FPGA Processor for Efficient Control Algorithm

    Hirokazu OBA  Minseok KIM  Ryotaro TAMAKI  Hiroyuki ARAI  

     
    PAPER-Microwaves, Millimeter-Waves

      Page(s):
    1348-1355

    The input impedance of an antenna fluctuates because of various usage conditions, which causes a mismatch between an internal circuit and an antenna. An automatic matching system solves this problem, then this paper presents a reconfigurable impedance tuner that has a set of fixed capacitors controlled by switching p-i-n diodes. A fast control algorithm for selecting the appropriate conditions of an impedance tuner is proposed and mounted on FPGA to demonstrate the performance.

  • A CMOS Low Dropout Regulator with Extended Stable Region for the Effective Series Resistance of the Output Capacitor

    Hsuan-I PAN  Chern-Lin CHEN  

     
    PAPER-Electronic Circuits

      Page(s):
    1356-1364

    In this paper, a new compensation scheme and a corresponding pass element structure for a CMOS low-dropout regulator (LDO) are presented. The proposed approach effectively alleviates the strict stability constraint on the ESR of the output capacitor. Stability of a CMOS LDO with the conventional compensation requires the effective series resistance (ESR) of the output capacitor in a tunnel-like region. With the proposed design approach, an LDO can be stable using an output capacitor without ESR. A 2.5 V/150 mA LDO has been implemented using a 0.5-µm 1P2M CMOS process. The experimental results illustrate that the proposed LDO is stable with an output capacitor of 0.33 µF and no ESR.

  • A Single Input Change Test Pattern Generator for Sequential Circuits

    Feng LIANG  ShaoChong LEI  ZhiBiao SHAO  

     
    PAPER-Semiconductor Materials and Devices

      Page(s):
    1365-1370

    An optimized Built-In Self-Test technology is proposed in this paper. A simplified algebraic model is developed to represent the configurations of single input change circuits. A novel single input change sequence generation technique is designed. It consists of a modified scan shift register, a seed storage array and a series of XOR gates. This circuitry can automatically generate single input change sequences of more unique vectors. Experimental results based on the ISCAS-89 benchmark show that the proposed method can achieve high stuck-at fault coverage with low switching activity during test applications.

  • Quadrature Hartley VCO and Injection-Locked Frequency Divider

    Sheng-Lyang JANG  Chia-Wei CHANG  Sheng-Chien WU  Chien-Feng LEE  Lin-yen TSAI  Jhin-Fang HUANG  

     
    LETTER-Electronic Circuits

      Page(s):
    1371-1374

    Novel low phase noise quadrature voltage-controlled oscillator (QVCO) and quadrature injection locked frequency divider (QILFD) with two coupled Hartley VCOs are proposed and implemented using the standard TSMC 0.18 µm CMOS 1P6M process. The QVCO employs pMOS as the core to reduce the up-conversion of low-frequency device noise to RF phase noise. It uses super-harmonic coupling technique to couple two differential Hartley VCOs and four small-size coupling transistors to set the directivity of quadrature output phases. At the 1.7 V supply voltage, the output phase noise of the QVCO is -124 dBc/Hz at 1 MHz offset frequency from the carrier frequency of 4.12 GHz, and the figure of merit is -185 dBc/Hz. At the supply voltage of 1.7 V, the total power consumption is 13.1 mW. At the supply voltage of 1.5 V, the tuning range of the free-running QILFD is from 2.05 GHz to 2.36 GHz, about 310 MHz, and the locking range of the ILFD is from 3.99 to 5.19 GHz, about 1.20 GHz, at the injection signal power of 0 dBm.

  • Design of a 0.5 V Op-Amp Based on CMOS Inverter Using Floating Voltage Sources

    Jun WANG  Tuck-Yang LEE  Dong-Gyou KIM  Toshimasa MATSUOKA  Kenji TANIGUCHI  

     
    LETTER-Electronic Circuits

      Page(s):
    1375-1378

    This letter presents a 0.5 V low-voltage op-amp in a standard 0.18 µm CMOS process for switched-capacitor circuits. Unlike other two-stage 0.5 V op-amp architectures, this op-amp consists of CMOS inverters that utilize floating voltage sources and forward body bias for obtaining high-speed operation. And two improved common-mode rejection circuits are well combined to achieve low power and chip area reduction. Simulation results indicate that the op-amp has an open-loop gain of 62 dB, and a high unity gain bandwidth of 56 MHz. The power consumption is only 350 µW.

  • Compact Double-Gate Metal-Oxide-Semiconductor Field Effect Transistor Model for Device/Circuit Optimization

    Norio SADACHIKA  Takahiro MURAKAMI  Hideki OKA  Ryou TANABE  Hans Juergen MATTAUSCH  Mitiko MIURA-MATTAUSCH  

     
    LETTER-Semiconductor Materials and Devices

      Page(s):
    1379-1381

    We have developed a compact double-gate metal-oxide-semiconductor field-effect transistor model for circuit simulation considering the volume inversion effect by solving the Poisson equation explicitly. It is verified that applied voltage dependence of the calculated potential values both at the surface and at the center of the silicon layer reproduce 2 dimensional device simulation results for any device structure, confirming the validity of the model for device optimization.