An experimental 576K BiCMOS ECL-compatible SRAM that achieves 3.5-ns access and cycle is discussed. The SRAM is fully self-testable using less than 1K on-chip logic gates to assist characterization, wafer test, and package test. The I/O is also TTL programmable with the first-metal mask.
Henry A. BONGES,
R. Dean ADAMS
Archibald J. ALLEN
Roy FLAKER
Kenneth S. GRAY
Erik L. HEDBERG
W. Timothy HOLMAN
George M. LATTIMORE
David A. LAVALETTE
Kim Yen T. NGUYEN
Alan L. ROBERTS
The copyright of the original papers published on this site belongs to IEICE. Unauthorized use of the original or translated papers is prohibited. See IEICE Provisions on Copyright for details.
Copy
Henry A. BONGES,, R. Dean ADAMS, Archibald J. ALLEN, Roy FLAKER, Kenneth S. GRAY, Erik L. HEDBERG, W. Timothy HOLMAN, George M. LATTIMORE, David A. LAVALETTE, Kim Yen T. NGUYEN, Alan L. ROBERTS, "A 576K 3.5-ns Access BiCMOS ECL Static RAM with Array Built-in Self-Test" in IEICE TRANSACTIONS on Electronics,
vol. E75-C, no. 4, pp. 547-554, April 1992, doi: .
Abstract: An experimental 576K BiCMOS ECL-compatible SRAM that achieves 3.5-ns access and cycle is discussed. The SRAM is fully self-testable using less than 1K on-chip logic gates to assist characterization, wafer test, and package test. The I/O is also TTL programmable with the first-metal mask.
URL: https://global.ieice.org/en_transactions/electronics/10.1587/e75-c_4_547/_p
Copy
@ARTICLE{e75-c_4_547,
author={Henry A. BONGES,, R. Dean ADAMS, Archibald J. ALLEN, Roy FLAKER, Kenneth S. GRAY, Erik L. HEDBERG, W. Timothy HOLMAN, George M. LATTIMORE, David A. LAVALETTE, Kim Yen T. NGUYEN, Alan L. ROBERTS, },
journal={IEICE TRANSACTIONS on Electronics},
title={A 576K 3.5-ns Access BiCMOS ECL Static RAM with Array Built-in Self-Test},
year={1992},
volume={E75-C},
number={4},
pages={547-554},
abstract={An experimental 576K BiCMOS ECL-compatible SRAM that achieves 3.5-ns access and cycle is discussed. The SRAM is fully self-testable using less than 1K on-chip logic gates to assist characterization, wafer test, and package test. The I/O is also TTL programmable with the first-metal mask.},
keywords={},
doi={},
ISSN={},
month={April},}
Copy
TY - JOUR
TI - A 576K 3.5-ns Access BiCMOS ECL Static RAM with Array Built-in Self-Test
T2 - IEICE TRANSACTIONS on Electronics
SP - 547
EP - 554
AU - Henry A. BONGES,
AU - R. Dean ADAMS
AU - Archibald J. ALLEN
AU - Roy FLAKER
AU - Kenneth S. GRAY
AU - Erik L. HEDBERG
AU - W. Timothy HOLMAN
AU - George M. LATTIMORE
AU - David A. LAVALETTE
AU - Kim Yen T. NGUYEN
AU - Alan L. ROBERTS
PY - 1992
DO -
JO - IEICE TRANSACTIONS on Electronics
SN -
VL - E75-C
IS - 4
JA - IEICE TRANSACTIONS on Electronics
Y1 - April 1992
AB - An experimental 576K BiCMOS ECL-compatible SRAM that achieves 3.5-ns access and cycle is discussed. The SRAM is fully self-testable using less than 1K on-chip logic gates to assist characterization, wafer test, and package test. The I/O is also TTL programmable with the first-metal mask.
ER -