Conventionally, ultrahigh-speed 2:1 multiplexers and 1:2 demultiplexers have been demonstrated with HBT's, MESFET's, and Si BJT's. Multiplexers and demultiplexers with a high number of bits are desirable to simplify a system. An 8:1 multiplexer and a 1:8 demultiplexer operating at 6 Gb/s and a 16:1 multiplexer and a 1:16 demultiplexer operating at 10 Gb/s were realized by HBT's and MESFET's, respectively. This paper describes Si bipolar circuits and package design technology for a 5-Gb/s 8:1 multiplexer and a 4.2-Gb/s demultiplexer. These multigigabit LSI's have been mainly achieved by switching current optimization within the limit of keeping a maximum unity unilateral gain frequency (fmax), by careful circuit and layout design considering accurate parasitic capacitance modeling, and by using a high-speed Si bipolar technology. These LSI's are housed in a newly developed 56-pin six-layer ceramic package with chip resistors for ECL termination and chip capacitors for good RF grounding.
The copyright of the original papers published on this site belongs to IEICE. Unauthorized use of the original or translated papers is prohibited. See IEICE Provisions on Copyright for details.
Copy
M. OHUCHI, T. OKAMURA, A. SAWAIRI, F. KUNIBA, K. MATSUMOTO, T. TASHIRO, S. HATAKEYAMA, K. OKUYAMA, "A Si Bipolar 5-Gb/s 8:1 Multiplexer and 4.2-Gb/s 1:8 Demultiplexer" in IEICE TRANSACTIONS on Electronics,
vol. E75-C, no. 4, pp. 562-565, April 1992, doi: .
Abstract: Conventionally, ultrahigh-speed 2:1 multiplexers and 1:2 demultiplexers have been demonstrated with HBT's, MESFET's, and Si BJT's. Multiplexers and demultiplexers with a high number of bits are desirable to simplify a system. An 8:1 multiplexer and a 1:8 demultiplexer operating at 6 Gb/s and a 16:1 multiplexer and a 1:16 demultiplexer operating at 10 Gb/s were realized by HBT's and MESFET's, respectively. This paper describes Si bipolar circuits and package design technology for a 5-Gb/s 8:1 multiplexer and a 4.2-Gb/s demultiplexer. These multigigabit LSI's have been mainly achieved by switching current optimization within the limit of keeping a maximum unity unilateral gain frequency (fmax), by careful circuit and layout design considering accurate parasitic capacitance modeling, and by using a high-speed Si bipolar technology. These LSI's are housed in a newly developed 56-pin six-layer ceramic package with chip resistors for ECL termination and chip capacitors for good RF grounding.
URL: https://global.ieice.org/en_transactions/electronics/10.1587/e75-c_4_562/_p
Copy
@ARTICLE{e75-c_4_562,
author={M. OHUCHI, T. OKAMURA, A. SAWAIRI, F. KUNIBA, K. MATSUMOTO, T. TASHIRO, S. HATAKEYAMA, K. OKUYAMA, },
journal={IEICE TRANSACTIONS on Electronics},
title={A Si Bipolar 5-Gb/s 8:1 Multiplexer and 4.2-Gb/s 1:8 Demultiplexer},
year={1992},
volume={E75-C},
number={4},
pages={562-565},
abstract={Conventionally, ultrahigh-speed 2:1 multiplexers and 1:2 demultiplexers have been demonstrated with HBT's, MESFET's, and Si BJT's. Multiplexers and demultiplexers with a high number of bits are desirable to simplify a system. An 8:1 multiplexer and a 1:8 demultiplexer operating at 6 Gb/s and a 16:1 multiplexer and a 1:16 demultiplexer operating at 10 Gb/s were realized by HBT's and MESFET's, respectively. This paper describes Si bipolar circuits and package design technology for a 5-Gb/s 8:1 multiplexer and a 4.2-Gb/s demultiplexer. These multigigabit LSI's have been mainly achieved by switching current optimization within the limit of keeping a maximum unity unilateral gain frequency (fmax), by careful circuit and layout design considering accurate parasitic capacitance modeling, and by using a high-speed Si bipolar technology. These LSI's are housed in a newly developed 56-pin six-layer ceramic package with chip resistors for ECL termination and chip capacitors for good RF grounding.},
keywords={},
doi={},
ISSN={},
month={April},}
Copy
TY - JOUR
TI - A Si Bipolar 5-Gb/s 8:1 Multiplexer and 4.2-Gb/s 1:8 Demultiplexer
T2 - IEICE TRANSACTIONS on Electronics
SP - 562
EP - 565
AU - M. OHUCHI
AU - T. OKAMURA
AU - A. SAWAIRI
AU - F. KUNIBA
AU - K. MATSUMOTO
AU - T. TASHIRO
AU - S. HATAKEYAMA
AU - K. OKUYAMA
PY - 1992
DO -
JO - IEICE TRANSACTIONS on Electronics
SN -
VL - E75-C
IS - 4
JA - IEICE TRANSACTIONS on Electronics
Y1 - April 1992
AB - Conventionally, ultrahigh-speed 2:1 multiplexers and 1:2 demultiplexers have been demonstrated with HBT's, MESFET's, and Si BJT's. Multiplexers and demultiplexers with a high number of bits are desirable to simplify a system. An 8:1 multiplexer and a 1:8 demultiplexer operating at 6 Gb/s and a 16:1 multiplexer and a 1:16 demultiplexer operating at 10 Gb/s were realized by HBT's and MESFET's, respectively. This paper describes Si bipolar circuits and package design technology for a 5-Gb/s 8:1 multiplexer and a 4.2-Gb/s demultiplexer. These multigigabit LSI's have been mainly achieved by switching current optimization within the limit of keeping a maximum unity unilateral gain frequency (fmax), by careful circuit and layout design considering accurate parasitic capacitance modeling, and by using a high-speed Si bipolar technology. These LSI's are housed in a newly developed 56-pin six-layer ceramic package with chip resistors for ECL termination and chip capacitors for good RF grounding.
ER -