Measuring AC Emitter and Base Series Resistances in Bipolar Transistors

Youichiro NIITSU

Measuring AC Emitter and Base Series Resistances in Bipolar Transistors

Youichiro NIITSU

Full Text Views

0

Cite this

Summary :

A convenient method for determining emitter and base resistances from small signal measurements has been developed. This method is based on Neugroschel's method, but the frequency has been varied instead of varying β₀. It is demonstrated that the base resistance was successfully extracted. The extracted emitter resistance depended on the collector current because of the difference between the exact g_m value and the approximated one, I_C/V_T. It has also been shown that the proposed method is more robust than the conventional impedance-circle method even when cross-talk occurs.

Publication: IEICE TRANSACTIONS on Electronics Vol.E77-C No.4 pp.608-614

Publication Date: 1994/04/25

Publicized

Online ISSN

DOI

Type of Manuscript: PAPER

Category: Integrated Electronics

Cite this

Copy

Youichiro NIITSU, "Measuring AC Emitter and Base Series Resistances in Bipolar Transistors" in IEICE TRANSACTIONS on Electronics, vol. E77-C, no. 4, pp. 608-614, April 1994, doi: .
Abstract: A convenient method for determining emitter and base resistances from small signal measurements has been developed. This method is based on Neugroschel's method, but the frequency has been varied instead of varying β₀. It is demonstrated that the base resistance was successfully extracted. The extracted emitter resistance depended on the collector current because of the difference between the exact g_m value and the approximated one, I_C/V_T. It has also been shown that the proposed method is more robust than the conventional impedance-circle method even when cross-talk occurs.
URL: https://global.ieice.org/en_transactions/electronics/10.1587/e77-c_4_608/_p

Copy

@ARTICLE{e77-c_4_608,
author={Youichiro NIITSU, },
journal={IEICE TRANSACTIONS on Electronics},
title={Measuring AC Emitter and Base Series Resistances in Bipolar Transistors},
year={1994},
volume={E77-C},
number={4},
pages={608-614},
abstract={A convenient method for determining emitter and base resistances from small signal measurements has been developed. This method is based on Neugroschel's method, but the frequency has been varied instead of varying β₀. It is demonstrated that the base resistance was successfully extracted. The extracted emitter resistance depended on the collector current because of the difference between the exact g_m value and the approximated one, I_C/V_T. It has also been shown that the proposed method is more robust than the conventional impedance-circle method even when cross-talk occurs.},
keywords={},
doi={},
ISSN={},
month={April},}

Copy

TY - JOUR
TI - Measuring AC Emitter and Base Series Resistances in Bipolar Transistors
T2 - IEICE TRANSACTIONS on Electronics
SP - 608
EP - 614
AU - Youichiro NIITSU
PY - 1994
DO -
JO - IEICE TRANSACTIONS on Electronics
SN -
VL - E77-C
IS - 4
JA - IEICE TRANSACTIONS on Electronics
Y1 - April 1994
AB - A convenient method for determining emitter and base resistances from small signal measurements has been developed. This method is based on Neugroschel's method, but the frequency has been varied instead of varying β₀. It is demonstrated that the base resistance was successfully extracted. The extracted emitter resistance depended on the collector current because of the difference between the exact g_m value and the approximated one, I_C/V_T. It has also been shown that the proposed method is more robust than the conventional impedance-circle method even when cross-talk occurs.
ER -