A Method for Measuring Surface Impedance of Superconductor and Dielectric Characteristics of Substrate by Using Strip Line Resonator
Summary :
A method using the microstrip line resonator is applied to measurements of the dielectric properties of a substrate and the surface resistance of a conducting strip line versus the frequency as well as the temperature. The variational expressions for the capacitance per unit length of several microstrip lines such as an inverted microstrip line and multi-layer microstrip lines are derived. The expression involves an integral along a semi-infinite interval, but the numerical integration is very easy. Effects of a buffer layer deposited on the substrate are investigated by using a multi-layer microstrip line model. The permittivity and the loss tangent of several dielectric materials are measured by the MSL and the IMSL or the multi-layer microstrip resonator. The measured surface resistance of copper and iron is also presented to show the validity of the present method. The surface resistance of a BSCCO thick film is also presented.
- Publication
- IEICE TRANSACTIONS on Electronics Vol.E77-C No.8 pp.1234-1241
- Publication Date
- 1994/08/25
- Publicized
- Online ISSN
- DOI
- Type of Manuscript
- Special Section PAPER (Special Section on Superconducting Devices)
- Category
- HTS
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Akira TAKETOMI, Kunio SAWAYA, Saburo ADACHI, Shigetoshi OHSHIMA, Norihiko YAOI, "A Method for Measuring Surface Impedance of Superconductor and Dielectric Characteristics of Substrate by Using Strip Line Resonator" in IEICE TRANSACTIONS on Electronics,
vol. E77-C, no. 8, pp. 1234-1241, August 1994, doi: .
Abstract: A method using the microstrip line resonator is applied to measurements of the dielectric properties of a substrate and the surface resistance of a conducting strip line versus the frequency as well as the temperature. The variational expressions for the capacitance per unit length of several microstrip lines such as an inverted microstrip line and multi-layer microstrip lines are derived. The expression involves an integral along a semi-infinite interval, but the numerical integration is very easy. Effects of a buffer layer deposited on the substrate are investigated by using a multi-layer microstrip line model. The permittivity and the loss tangent of several dielectric materials are measured by the MSL and the IMSL or the multi-layer microstrip resonator. The measured surface resistance of copper and iron is also presented to show the validity of the present method. The surface resistance of a BSCCO thick film is also presented.
URL: https://global.ieice.org/en_transactions/electronics/10.1587/e77-c_8_1234/_p
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@ARTICLE{e77-c_8_1234,
author={Akira TAKETOMI, Kunio SAWAYA, Saburo ADACHI, Shigetoshi OHSHIMA, Norihiko YAOI, },
journal={IEICE TRANSACTIONS on Electronics},
title={A Method for Measuring Surface Impedance of Superconductor and Dielectric Characteristics of Substrate by Using Strip Line Resonator},
year={1994},
volume={E77-C},
number={8},
pages={1234-1241},
abstract={A method using the microstrip line resonator is applied to measurements of the dielectric properties of a substrate and the surface resistance of a conducting strip line versus the frequency as well as the temperature. The variational expressions for the capacitance per unit length of several microstrip lines such as an inverted microstrip line and multi-layer microstrip lines are derived. The expression involves an integral along a semi-infinite interval, but the numerical integration is very easy. Effects of a buffer layer deposited on the substrate are investigated by using a multi-layer microstrip line model. The permittivity and the loss tangent of several dielectric materials are measured by the MSL and the IMSL or the multi-layer microstrip resonator. The measured surface resistance of copper and iron is also presented to show the validity of the present method. The surface resistance of a BSCCO thick film is also presented.},
keywords={},
doi={},
ISSN={},
month={August},}
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TY - JOUR
TI - A Method for Measuring Surface Impedance of Superconductor and Dielectric Characteristics of Substrate by Using Strip Line Resonator
T2 - IEICE TRANSACTIONS on Electronics
SP - 1234
EP - 1241
AU - Akira TAKETOMI
AU - Kunio SAWAYA
AU - Saburo ADACHI
AU - Shigetoshi OHSHIMA
AU - Norihiko YAOI
PY - 1994
DO -
JO - IEICE TRANSACTIONS on Electronics
SN -
VL - E77-C
IS - 8
JA - IEICE TRANSACTIONS on Electronics
Y1 - August 1994
AB - A method using the microstrip line resonator is applied to measurements of the dielectric properties of a substrate and the surface resistance of a conducting strip line versus the frequency as well as the temperature. The variational expressions for the capacitance per unit length of several microstrip lines such as an inverted microstrip line and multi-layer microstrip lines are derived. The expression involves an integral along a semi-infinite interval, but the numerical integration is very easy. Effects of a buffer layer deposited on the substrate are investigated by using a multi-layer microstrip line model. The permittivity and the loss tangent of several dielectric materials are measured by the MSL and the IMSL or the multi-layer microstrip resonator. The measured surface resistance of copper and iron is also presented to show the validity of the present method. The surface resistance of a BSCCO thick film is also presented.
ER -
English
