Highly Sensitive Real Time Electro-Optic Probing for Long Logic Pattern Analysis

Hironori TAKAHASHI; Shin-ichiro AOSHIMA; Kazuhiko WAKAMORI; Isuke HIRANO; Yutaka TSUCHIYA

Highly Sensitive Real Time Electro-Optic Probing for Long Logic Pattern Analysis

Hironori TAKAHASHI, Shin-ichiro AOSHIMA, Kazuhiko WAKAMORI, Isuke HIRANO, Yutaka TSUCHIYA

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While Electro-Optic (E-O) sampling has achived the electric signal measurement with advantages of noninvasive, noncontact and ultrafast time resolution, it is unsuitable for measuring long logic patterns in fast ICs under the functional test conditions. To overcome this problem, a real time E-O probing using a continuous wave (CW) diode laser and a fast photodetector has been developed. By adopting a ZnTe E-O probe having a half-wave voltage of 3.6 kV, shot noise limited measurement with a frequency bandwidth of 480 MHz has been achieved using a low noise diode laser (wavelength of 780 nm, output power of 30 mW), a pin photodiode, a wideband low noise amplifier, and a digital oscilloscope having 500 MHz bandwidth as a waveform analyzer. The minimum detectable voltage was 23 mV under 700 times integration. In this paper, discussion of the voltage sensitivity of real time E-O probing is included. Key parameters for attaining the highly sensitive real time E-O probing are the sensitivity of the E-O probe and noises of the probing light and detection system.

Publication: IEICE TRANSACTIONS on Electronics Vol.E78-C No.1 pp.67-72

Publication Date: 1995/01/25

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Type of Manuscript: Special Section PAPER (Special Issue on Ultrafast Optoelectronics)

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Hironori TAKAHASHI, Shin-ichiro AOSHIMA, Kazuhiko WAKAMORI, Isuke HIRANO, Yutaka TSUCHIYA, "Highly Sensitive Real Time Electro-Optic Probing for Long Logic Pattern Analysis" in IEICE TRANSACTIONS on Electronics, vol. E78-C, no. 1, pp. 67-72, January 1995, doi: .
Abstract: While Electro-Optic (E-O) sampling has achived the electric signal measurement with advantages of noninvasive, noncontact and ultrafast time resolution, it is unsuitable for measuring long logic patterns in fast ICs under the functional test conditions. To overcome this problem, a real time E-O probing using a continuous wave (CW) diode laser and a fast photodetector has been developed. By adopting a ZnTe E-O probe having a half-wave voltage of 3.6 kV, shot noise limited measurement with a frequency bandwidth of 480 MHz has been achieved using a low noise diode laser (wavelength of 780 nm, output power of 30 mW), a pin photodiode, a wideband low noise amplifier, and a digital oscilloscope having 500 MHz bandwidth as a waveform analyzer. The minimum detectable voltage was 23 mV under 700 times integration. In this paper, discussion of the voltage sensitivity of real time E-O probing is included. Key parameters for attaining the highly sensitive real time E-O probing are the sensitivity of the E-O probe and noises of the probing light and detection system.
URL: https://global.ieice.org/en_transactions/electronics/10.1587/e78-c_1_67/_p

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@ARTICLE{e78-c_1_67,
author={Hironori TAKAHASHI, Shin-ichiro AOSHIMA, Kazuhiko WAKAMORI, Isuke HIRANO, Yutaka TSUCHIYA, },
journal={IEICE TRANSACTIONS on Electronics},
title={Highly Sensitive Real Time Electro-Optic Probing for Long Logic Pattern Analysis},
year={1995},
volume={E78-C},
number={1},
pages={67-72},
abstract={While Electro-Optic (E-O) sampling has achived the electric signal measurement with advantages of noninvasive, noncontact and ultrafast time resolution, it is unsuitable for measuring long logic patterns in fast ICs under the functional test conditions. To overcome this problem, a real time E-O probing using a continuous wave (CW) diode laser and a fast photodetector has been developed. By adopting a ZnTe E-O probe having a half-wave voltage of 3.6 kV, shot noise limited measurement with a frequency bandwidth of 480 MHz has been achieved using a low noise diode laser (wavelength of 780 nm, output power of 30 mW), a pin photodiode, a wideband low noise amplifier, and a digital oscilloscope having 500 MHz bandwidth as a waveform analyzer. The minimum detectable voltage was 23 mV under 700 times integration. In this paper, discussion of the voltage sensitivity of real time E-O probing is included. Key parameters for attaining the highly sensitive real time E-O probing are the sensitivity of the E-O probe and noises of the probing light and detection system.},
keywords={},
doi={},
ISSN={},
month={January},}

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TY - JOUR
TI - Highly Sensitive Real Time Electro-Optic Probing for Long Logic Pattern Analysis
T2 - IEICE TRANSACTIONS on Electronics
SP - 67
EP - 72
AU - Hironori TAKAHASHI
AU - Shin-ichiro AOSHIMA
AU - Kazuhiko WAKAMORI
AU - Isuke HIRANO
AU - Yutaka TSUCHIYA
PY - 1995
DO -
JO - IEICE TRANSACTIONS on Electronics
SN -
VL - E78-C
IS - 1
JA - IEICE TRANSACTIONS on Electronics
Y1 - January 1995
AB - While Electro-Optic (E-O) sampling has achived the electric signal measurement with advantages of noninvasive, noncontact and ultrafast time resolution, it is unsuitable for measuring long logic patterns in fast ICs under the functional test conditions. To overcome this problem, a real time E-O probing using a continuous wave (CW) diode laser and a fast photodetector has been developed. By adopting a ZnTe E-O probe having a half-wave voltage of 3.6 kV, shot noise limited measurement with a frequency bandwidth of 480 MHz has been achieved using a low noise diode laser (wavelength of 780 nm, output power of 30 mW), a pin photodiode, a wideband low noise amplifier, and a digital oscilloscope having 500 MHz bandwidth as a waveform analyzer. The minimum detectable voltage was 23 mV under 700 times integration. In this paper, discussion of the voltage sensitivity of real time E-O probing is included. Key parameters for attaining the highly sensitive real time E-O probing are the sensitivity of the E-O probe and noises of the probing light and detection system.
ER -