IEICE TRANSACTIONS on Electronics
Analysis of Microstrip Line with a Trapezoidal Dielectric Ridge in Multilayered Media by Partial-Boundary Element Method
Summary :
In this paper, we present an analysis of microstrip line with a trapezoidal dielectric ridge in multilayered media. The method employed in this characterization is called partial-boundary element method (p-BEM) which provides an efficient technique to the analysis of the structures with multilayered media. To improve the convergence of the Green's function used in the analysis with the P-BEM, we employ a technique based on a combination of the Fourier series expansion and the method of images. Treatment on convergence for the boundary integrals is also described. After this treatment, it requires typically one tenth or one hundredth of Fourier terms to obtain the same accuracy compared with the original Green's function. Numerical results are presented for two microstrip lines that have a trapezoidal dielectric ridge placed on a one-layered substrate and a two-layered substrate. These numerical results demonstrate the effects on the characteristics of the microstrip line due to the existence of the dielectric ridge as well as the second layer between the ridge and the fundamental substrate.
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- IEICE TRANSACTIONS on Electronics Vol.E79-C No.10 pp.1413-1419
- Publication Date
- 1996/10/25
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- Special Section PAPER (Special Issue on Electromagnetic Theory-Foundations and Applications)
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Keren LI, Kazuhiko ATSUKI, "Analysis of Microstrip Line with a Trapezoidal Dielectric Ridge in Multilayered Media by Partial-Boundary Element Method" in IEICE TRANSACTIONS on Electronics,
vol. E79-C, no. 10, pp. 1413-1419, October 1996, doi: .
Abstract: In this paper, we present an analysis of microstrip line with a trapezoidal dielectric ridge in multilayered media. The method employed in this characterization is called partial-boundary element method (p-BEM) which provides an efficient technique to the analysis of the structures with multilayered media. To improve the convergence of the Green's function used in the analysis with the P-BEM, we employ a technique based on a combination of the Fourier series expansion and the method of images. Treatment on convergence for the boundary integrals is also described. After this treatment, it requires typically one tenth or one hundredth of Fourier terms to obtain the same accuracy compared with the original Green's function. Numerical results are presented for two microstrip lines that have a trapezoidal dielectric ridge placed on a one-layered substrate and a two-layered substrate. These numerical results demonstrate the effects on the characteristics of the microstrip line due to the existence of the dielectric ridge as well as the second layer between the ridge and the fundamental substrate.
URL: https://global.ieice.org/en_transactions/electronics/10.1587/e79-c_10_1413/_p
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@ARTICLE{e79-c_10_1413,
author={Keren LI, Kazuhiko ATSUKI, },
journal={IEICE TRANSACTIONS on Electronics},
title={Analysis of Microstrip Line with a Trapezoidal Dielectric Ridge in Multilayered Media by Partial-Boundary Element Method},
year={1996},
volume={E79-C},
number={10},
pages={1413-1419},
abstract={In this paper, we present an analysis of microstrip line with a trapezoidal dielectric ridge in multilayered media. The method employed in this characterization is called partial-boundary element method (p-BEM) which provides an efficient technique to the analysis of the structures with multilayered media. To improve the convergence of the Green's function used in the analysis with the P-BEM, we employ a technique based on a combination of the Fourier series expansion and the method of images. Treatment on convergence for the boundary integrals is also described. After this treatment, it requires typically one tenth or one hundredth of Fourier terms to obtain the same accuracy compared with the original Green's function. Numerical results are presented for two microstrip lines that have a trapezoidal dielectric ridge placed on a one-layered substrate and a two-layered substrate. These numerical results demonstrate the effects on the characteristics of the microstrip line due to the existence of the dielectric ridge as well as the second layer between the ridge and the fundamental substrate.},
keywords={},
doi={},
ISSN={},
month={October},}
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TY - JOUR
TI - Analysis of Microstrip Line with a Trapezoidal Dielectric Ridge in Multilayered Media by Partial-Boundary Element Method
T2 - IEICE TRANSACTIONS on Electronics
SP - 1413
EP - 1419
AU - Keren LI
AU - Kazuhiko ATSUKI
PY - 1996
DO -
JO - IEICE TRANSACTIONS on Electronics
SN -
VL - E79-C
IS - 10
JA - IEICE TRANSACTIONS on Electronics
Y1 - October 1996
AB - In this paper, we present an analysis of microstrip line with a trapezoidal dielectric ridge in multilayered media. The method employed in this characterization is called partial-boundary element method (p-BEM) which provides an efficient technique to the analysis of the structures with multilayered media. To improve the convergence of the Green's function used in the analysis with the P-BEM, we employ a technique based on a combination of the Fourier series expansion and the method of images. Treatment on convergence for the boundary integrals is also described. After this treatment, it requires typically one tenth or one hundredth of Fourier terms to obtain the same accuracy compared with the original Green's function. Numerical results are presented for two microstrip lines that have a trapezoidal dielectric ridge placed on a one-layered substrate and a two-layered substrate. These numerical results demonstrate the effects on the characteristics of the microstrip line due to the existence of the dielectric ridge as well as the second layer between the ridge and the fundamental substrate.
ER -
English
