IEICE TRANSACTIONS on Electronics
Database with LSI Failure Analysis Navigator
Summary :
A detabase system that provides step-by-step guidance for LSI failure analysts has been developed. This system has three main functions: database, navigator, and chip tracking. The datebase stores failure analysis information such as analysis method and failure mechanisms including image data. It also stores conditions and results of each analysis step and decisions to proceeds to the next analysis step. With 2000 failure analysis cases, data retrieval takes 6.6 seconds, a table containing 20 photos is presented in 6.5 seconds, and a different set of data can be displayed in 0.6 seconds. The navigator displays a standard analysis procedure illustrated in flow charts.The chip tracking shows where the particular chip is and what analysis it is undergoing, which is useful for the situation where many chips are simultaneously analyzed. Thus, this system has good enough functions of analysis procedure management and performance of quick data access to make failure analysis easier and more successful.
- Publication
- IEICE TRANSACTIONS on Electronics Vol.E79-C No.3 pp.272-276
- Publication Date
- 1996/03/25
- Publicized
- Online ISSN
- DOI
- Type of Manuscript
- Special Section PAPER (Special Issue on Scientific ULSI Manufacturing Technology)
- Category
- CIM/CAM
Authors
Keyword
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Takahiro ITO, Tadao TAKEDA, Shigeru NAKAJIMA, "Database with LSI Failure Analysis Navigator" in IEICE TRANSACTIONS on Electronics,
vol. E79-C, no. 3, pp. 272-276, March 1996, doi: .
Abstract: A detabase system that provides step-by-step guidance for LSI failure analysts has been developed. This system has three main functions: database, navigator, and chip tracking. The datebase stores failure analysis information such as analysis method and failure mechanisms including image data. It also stores conditions and results of each analysis step and decisions to proceeds to the next analysis step. With 2000 failure analysis cases, data retrieval takes 6.6 seconds, a table containing 20 photos is presented in 6.5 seconds, and a different set of data can be displayed in 0.6 seconds. The navigator displays a standard analysis procedure illustrated in flow charts.The chip tracking shows where the particular chip is and what analysis it is undergoing, which is useful for the situation where many chips are simultaneously analyzed. Thus, this system has good enough functions of analysis procedure management and performance of quick data access to make failure analysis easier and more successful.
URL: https://global.ieice.org/en_transactions/electronics/10.1587/e79-c_3_272/_p
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@ARTICLE{e79-c_3_272,
author={Takahiro ITO, Tadao TAKEDA, Shigeru NAKAJIMA, },
journal={IEICE TRANSACTIONS on Electronics},
title={Database with LSI Failure Analysis Navigator},
year={1996},
volume={E79-C},
number={3},
pages={272-276},
abstract={A detabase system that provides step-by-step guidance for LSI failure analysts has been developed. This system has three main functions: database, navigator, and chip tracking. The datebase stores failure analysis information such as analysis method and failure mechanisms including image data. It also stores conditions and results of each analysis step and decisions to proceeds to the next analysis step. With 2000 failure analysis cases, data retrieval takes 6.6 seconds, a table containing 20 photos is presented in 6.5 seconds, and a different set of data can be displayed in 0.6 seconds. The navigator displays a standard analysis procedure illustrated in flow charts.The chip tracking shows where the particular chip is and what analysis it is undergoing, which is useful for the situation where many chips are simultaneously analyzed. Thus, this system has good enough functions of analysis procedure management and performance of quick data access to make failure analysis easier and more successful.},
keywords={},
doi={},
ISSN={},
month={March},}
Copy
TY - JOUR
TI - Database with LSI Failure Analysis Navigator
T2 - IEICE TRANSACTIONS on Electronics
SP - 272
EP - 276
AU - Takahiro ITO
AU - Tadao TAKEDA
AU - Shigeru NAKAJIMA
PY - 1996
DO -
JO - IEICE TRANSACTIONS on Electronics
SN -
VL - E79-C
IS - 3
JA - IEICE TRANSACTIONS on Electronics
Y1 - March 1996
AB - A detabase system that provides step-by-step guidance for LSI failure analysts has been developed. This system has three main functions: database, navigator, and chip tracking. The datebase stores failure analysis information such as analysis method and failure mechanisms including image data. It also stores conditions and results of each analysis step and decisions to proceeds to the next analysis step. With 2000 failure analysis cases, data retrieval takes 6.6 seconds, a table containing 20 photos is presented in 6.5 seconds, and a different set of data can be displayed in 0.6 seconds. The navigator displays a standard analysis procedure illustrated in flow charts.The chip tracking shows where the particular chip is and what analysis it is undergoing, which is useful for the situation where many chips are simultaneously analyzed. Thus, this system has good enough functions of analysis procedure management and performance of quick data access to make failure analysis easier and more successful.
ER -
English
