IEICE TRANSACTIONS on Electronics
An Optical Fiber Sensor for the Measurement of Elevated Temperatures
Summary :
A novel optical technique for the measurement of temperature is proposed. This is accomplished by depositing alternating 1/4 wave layers of silicon nitride and silicon-rich silicon nitride at the end of an optical fiber. These layers of alternating refractive index form the equivalent of a Bragg grating of a high temperature material. When the fiber and the Bragg grating are heated, the Bragg stack expands, and there is a change in the reflective peak wavelength of this wave stack. Thus, the wavelength of peak reflectivity is a function of temperature. Currently, the 15 nm spectral width of the Bragg stacks is achieved in our laboratory, which is conveniently monitored with a CCD solid state spectrometer and the temperature sensor probes can be also multiplexed at separated specific reflection wavelength. In the experiment, the temperatures in excess of 1,100 centigrade have been measured with a resolution of less than 3 centigrade degree.
- Publication
- IEICE TRANSACTIONS on Electronics Vol.E83-C No.3 pp.298-302
- Publication Date
- 2000/03/25
- Publicized
- Online ISSN
- DOI
- Type of Manuscript
- Special Section PAPER (Special Issue on Optical Fiber Sensors)
- Category
- Physical and Mechanical Sensors
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Theodore F. MORSE, Yifei HE, Fei LUO, "An Optical Fiber Sensor for the Measurement of Elevated Temperatures" in IEICE TRANSACTIONS on Electronics,
vol. E83-C, no. 3, pp. 298-302, March 2000, doi: .
Abstract: A novel optical technique for the measurement of temperature is proposed. This is accomplished by depositing alternating 1/4 wave layers of silicon nitride and silicon-rich silicon nitride at the end of an optical fiber. These layers of alternating refractive index form the equivalent of a Bragg grating of a high temperature material. When the fiber and the Bragg grating are heated, the Bragg stack expands, and there is a change in the reflective peak wavelength of this wave stack. Thus, the wavelength of peak reflectivity is a function of temperature. Currently, the 15 nm spectral width of the Bragg stacks is achieved in our laboratory, which is conveniently monitored with a CCD solid state spectrometer and the temperature sensor probes can be also multiplexed at separated specific reflection wavelength. In the experiment, the temperatures in excess of 1,100 centigrade have been measured with a resolution of less than 3 centigrade degree.
URL: https://global.ieice.org/en_transactions/electronics/10.1587/e83-c_3_298/_p
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@ARTICLE{e83-c_3_298,
author={Theodore F. MORSE, Yifei HE, Fei LUO, },
journal={IEICE TRANSACTIONS on Electronics},
title={An Optical Fiber Sensor for the Measurement of Elevated Temperatures},
year={2000},
volume={E83-C},
number={3},
pages={298-302},
abstract={A novel optical technique for the measurement of temperature is proposed. This is accomplished by depositing alternating 1/4 wave layers of silicon nitride and silicon-rich silicon nitride at the end of an optical fiber. These layers of alternating refractive index form the equivalent of a Bragg grating of a high temperature material. When the fiber and the Bragg grating are heated, the Bragg stack expands, and there is a change in the reflective peak wavelength of this wave stack. Thus, the wavelength of peak reflectivity is a function of temperature. Currently, the 15 nm spectral width of the Bragg stacks is achieved in our laboratory, which is conveniently monitored with a CCD solid state spectrometer and the temperature sensor probes can be also multiplexed at separated specific reflection wavelength. In the experiment, the temperatures in excess of 1,100 centigrade have been measured with a resolution of less than 3 centigrade degree.},
keywords={},
doi={},
ISSN={},
month={March},}
Copy
TY - JOUR
TI - An Optical Fiber Sensor for the Measurement of Elevated Temperatures
T2 - IEICE TRANSACTIONS on Electronics
SP - 298
EP - 302
AU - Theodore F. MORSE
AU - Yifei HE
AU - Fei LUO
PY - 2000
DO -
JO - IEICE TRANSACTIONS on Electronics
SN -
VL - E83-C
IS - 3
JA - IEICE TRANSACTIONS on Electronics
Y1 - March 2000
AB - A novel optical technique for the measurement of temperature is proposed. This is accomplished by depositing alternating 1/4 wave layers of silicon nitride and silicon-rich silicon nitride at the end of an optical fiber. These layers of alternating refractive index form the equivalent of a Bragg grating of a high temperature material. When the fiber and the Bragg grating are heated, the Bragg stack expands, and there is a change in the reflective peak wavelength of this wave stack. Thus, the wavelength of peak reflectivity is a function of temperature. Currently, the 15 nm spectral width of the Bragg stacks is achieved in our laboratory, which is conveniently monitored with a CCD solid state spectrometer and the temperature sensor probes can be also multiplexed at separated specific reflection wavelength. In the experiment, the temperatures in excess of 1,100 centigrade have been measured with a resolution of less than 3 centigrade degree.
ER -
English
