IEICE TRANSACTIONS on Electronics
Bit Error Rate Measurement of a Measuring System Designed for Superconducting Digital Circuits
Summary :
We have developed a measuring system for high-Tc superconducting single-flux quantum circuits and evaluated its performance in terms of bit error rate (BER) measurement for given signal voltage levels. The system includes magnetic shields and a high-frequency test fixture mounted on a closed-cycle cooler. The test fixture is made of non-magnetic material. The transmission characteristics of the measuring system were evaluated by using a vector network analyzer at frequencies ranging from 40 MHz to 20 GHz. The operating temperature of the measuring system ranges from 20 K to room temperature. We connected a 12-GHz wideband pulse amplifier to the system and evaluated its high-speed transmission characteristics. We used a standard 50-Ω microstrip line as an impedance-matched sample. The signal used in the experiment was a 215-1 pseudo random bit signal (PRBS) at 3 Gbps. As a result, the output voltage required for an output driver under the experimental condition was 18.8 mV in order to obtain a resolution of BER measurement of 10-12.
- Publication
- IEICE TRANSACTIONS on Electronics Vol.E84-C No.1 pp.29-34
- Publication Date
- 2001/01/01
- Publicized
- Online ISSN
- DOI
- Type of Manuscript
- Special Section PAPER (Special Issue on Superconductive Electronics)
- Category
- Digital Applications
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Kazuhiro SHIMAOKA, Seiichi TOKUNAGA, Masaaki NEMOTO, Isao YOSHIDA, Akira FUJIMAKI, Hisao HAYAKAWA, "Bit Error Rate Measurement of a Measuring System Designed for Superconducting Digital Circuits" in IEICE TRANSACTIONS on Electronics,
vol. E84-C, no. 1, pp. 29-34, January 2001, doi: .
Abstract: We have developed a measuring system for high-Tc superconducting single-flux quantum circuits and evaluated its performance in terms of bit error rate (BER) measurement for given signal voltage levels. The system includes magnetic shields and a high-frequency test fixture mounted on a closed-cycle cooler. The test fixture is made of non-magnetic material. The transmission characteristics of the measuring system were evaluated by using a vector network analyzer at frequencies ranging from 40 MHz to 20 GHz. The operating temperature of the measuring system ranges from 20 K to room temperature. We connected a 12-GHz wideband pulse amplifier to the system and evaluated its high-speed transmission characteristics. We used a standard 50-Ω microstrip line as an impedance-matched sample. The signal used in the experiment was a 215-1 pseudo random bit signal (PRBS) at 3 Gbps. As a result, the output voltage required for an output driver under the experimental condition was 18.8 mV in order to obtain a resolution of BER measurement of 10-12.
URL: https://global.ieice.org/en_transactions/electronics/10.1587/e84-c_1_29/_p
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@ARTICLE{e84-c_1_29,
author={Kazuhiro SHIMAOKA, Seiichi TOKUNAGA, Masaaki NEMOTO, Isao YOSHIDA, Akira FUJIMAKI, Hisao HAYAKAWA, },
journal={IEICE TRANSACTIONS on Electronics},
title={Bit Error Rate Measurement of a Measuring System Designed for Superconducting Digital Circuits},
year={2001},
volume={E84-C},
number={1},
pages={29-34},
abstract={We have developed a measuring system for high-Tc superconducting single-flux quantum circuits and evaluated its performance in terms of bit error rate (BER) measurement for given signal voltage levels. The system includes magnetic shields and a high-frequency test fixture mounted on a closed-cycle cooler. The test fixture is made of non-magnetic material. The transmission characteristics of the measuring system were evaluated by using a vector network analyzer at frequencies ranging from 40 MHz to 20 GHz. The operating temperature of the measuring system ranges from 20 K to room temperature. We connected a 12-GHz wideband pulse amplifier to the system and evaluated its high-speed transmission characteristics. We used a standard 50-Ω microstrip line as an impedance-matched sample. The signal used in the experiment was a 215-1 pseudo random bit signal (PRBS) at 3 Gbps. As a result, the output voltage required for an output driver under the experimental condition was 18.8 mV in order to obtain a resolution of BER measurement of 10-12.},
keywords={},
doi={},
ISSN={},
month={January},}
Copy
TY - JOUR
TI - Bit Error Rate Measurement of a Measuring System Designed for Superconducting Digital Circuits
T2 - IEICE TRANSACTIONS on Electronics
SP - 29
EP - 34
AU - Kazuhiro SHIMAOKA
AU - Seiichi TOKUNAGA
AU - Masaaki NEMOTO
AU - Isao YOSHIDA
AU - Akira FUJIMAKI
AU - Hisao HAYAKAWA
PY - 2001
DO -
JO - IEICE TRANSACTIONS on Electronics
SN -
VL - E84-C
IS - 1
JA - IEICE TRANSACTIONS on Electronics
Y1 - January 2001
AB - We have developed a measuring system for high-Tc superconducting single-flux quantum circuits and evaluated its performance in terms of bit error rate (BER) measurement for given signal voltage levels. The system includes magnetic shields and a high-frequency test fixture mounted on a closed-cycle cooler. The test fixture is made of non-magnetic material. The transmission characteristics of the measuring system were evaluated by using a vector network analyzer at frequencies ranging from 40 MHz to 20 GHz. The operating temperature of the measuring system ranges from 20 K to room temperature. We connected a 12-GHz wideband pulse amplifier to the system and evaluated its high-speed transmission characteristics. We used a standard 50-Ω microstrip line as an impedance-matched sample. The signal used in the experiment was a 215-1 pseudo random bit signal (PRBS) at 3 Gbps. As a result, the output voltage required for an output driver under the experimental condition was 18.8 mV in order to obtain a resolution of BER measurement of 10-12.
ER -
English
