Standardization of Measurement Methods of Low-Loss Dielectrics and High-Temperature Superconducting Films
Summary :
The present state of IEC and JIS standards is reviewed on measurement methods of low-loss dielectric and high-tempera-ture superconductor (HTS) materials in the microwave and millimeter wave range. Four resonance methods are discussed actually, that is, a two-dielectric resonator method for dielectric rod measurements, a two-sapphire resonator method for HTS film measurements, a cavity resonator method for microwave measurements of dielectric plates and a cutoff circular waveguide method for millimeter wave measurements of dielectric plates. These methods realize the high accuracy sufficient for measurements of temperature dependence of material properties.
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- IEICE TRANSACTIONS on Electronics Vol.E87-C No.5 pp.652-656
- Publication Date
- 2004/05/01
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- Special Section INVITED PAPER (Special Section on Advances in Characterization and Measurement Technologies for Microwave and Millimeter-Wave Materials, Devices and Circuits)
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Yoshio KOBAYASHI, "Standardization of Measurement Methods of Low-Loss Dielectrics and High-Temperature Superconducting Films" in IEICE TRANSACTIONS on Electronics,
vol. E87-C, no. 5, pp. 652-656, May 2004, doi: .
Abstract: The present state of IEC and JIS standards is reviewed on measurement methods of low-loss dielectric and high-tempera-ture superconductor (HTS) materials in the microwave and millimeter wave range. Four resonance methods are discussed actually, that is, a two-dielectric resonator method for dielectric rod measurements, a two-sapphire resonator method for HTS film measurements, a cavity resonator method for microwave measurements of dielectric plates and a cutoff circular waveguide method for millimeter wave measurements of dielectric plates. These methods realize the high accuracy sufficient for measurements of temperature dependence of material properties.
URL: https://global.ieice.org/en_transactions/electronics/10.1587/e87-c_5_652/_p
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@ARTICLE{e87-c_5_652,
author={Yoshio KOBAYASHI, },
journal={IEICE TRANSACTIONS on Electronics},
title={Standardization of Measurement Methods of Low-Loss Dielectrics and High-Temperature Superconducting Films},
year={2004},
volume={E87-C},
number={5},
pages={652-656},
abstract={The present state of IEC and JIS standards is reviewed on measurement methods of low-loss dielectric and high-tempera-ture superconductor (HTS) materials in the microwave and millimeter wave range. Four resonance methods are discussed actually, that is, a two-dielectric resonator method for dielectric rod measurements, a two-sapphire resonator method for HTS film measurements, a cavity resonator method for microwave measurements of dielectric plates and a cutoff circular waveguide method for millimeter wave measurements of dielectric plates. These methods realize the high accuracy sufficient for measurements of temperature dependence of material properties.},
keywords={},
doi={},
ISSN={},
month={May},}
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TY - JOUR
TI - Standardization of Measurement Methods of Low-Loss Dielectrics and High-Temperature Superconducting Films
T2 - IEICE TRANSACTIONS on Electronics
SP - 652
EP - 656
AU - Yoshio KOBAYASHI
PY - 2004
DO -
JO - IEICE TRANSACTIONS on Electronics
SN -
VL - E87-C
IS - 5
JA - IEICE TRANSACTIONS on Electronics
Y1 - May 2004
AB - The present state of IEC and JIS standards is reviewed on measurement methods of low-loss dielectric and high-tempera-ture superconductor (HTS) materials in the microwave and millimeter wave range. Four resonance methods are discussed actually, that is, a two-dielectric resonator method for dielectric rod measurements, a two-sapphire resonator method for HTS film measurements, a cavity resonator method for microwave measurements of dielectric plates and a cutoff circular waveguide method for millimeter wave measurements of dielectric plates. These methods realize the high accuracy sufficient for measurements of temperature dependence of material properties.
ER -
English
