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Time-of-flight (TOF) range imaging is a promising technology for various applications such as touchless control, augmented reality interface, and automotive. The TOF range imagers are classified into two methods: direct TOF with single photo avalanche diodes and indirect TOF with lock-in pixels. The indirect TOF range imagers have advantages in terms of a high spatial resolution and high depth precision because their pixels are simple and can handle many photons at one time. This paper reviews and discusses principal lock-in pixels reported both in the past and present, including circuit-based and charge-modulator-based lock-in pixels. In addition, key technologies that include enhancing sensitivity and background suppression techniques are also discussed.
Keita YASUTOMI
Shizuoka University
Shoji KAWAHITO
Shizuoka University
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Keita YASUTOMI, Shoji KAWAHITO, "Lock-in Pixel Based Time-of-Flight Range Imagers: An Overview" in IEICE TRANSACTIONS on Electronics,
vol. E105-C, no. 7, pp. 301-315, July 2022, doi: 10.1587/transele.2021CDP0004.
Abstract: Time-of-flight (TOF) range imaging is a promising technology for various applications such as touchless control, augmented reality interface, and automotive. The TOF range imagers are classified into two methods: direct TOF with single photo avalanche diodes and indirect TOF with lock-in pixels. The indirect TOF range imagers have advantages in terms of a high spatial resolution and high depth precision because their pixels are simple and can handle many photons at one time. This paper reviews and discusses principal lock-in pixels reported both in the past and present, including circuit-based and charge-modulator-based lock-in pixels. In addition, key technologies that include enhancing sensitivity and background suppression techniques are also discussed.
URL: https://global.ieice.org/en_transactions/electronics/10.1587/transele.2021CDP0004/_p
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@ARTICLE{e105-c_7_301,
author={Keita YASUTOMI, Shoji KAWAHITO, },
journal={IEICE TRANSACTIONS on Electronics},
title={Lock-in Pixel Based Time-of-Flight Range Imagers: An Overview},
year={2022},
volume={E105-C},
number={7},
pages={301-315},
abstract={Time-of-flight (TOF) range imaging is a promising technology for various applications such as touchless control, augmented reality interface, and automotive. The TOF range imagers are classified into two methods: direct TOF with single photo avalanche diodes and indirect TOF with lock-in pixels. The indirect TOF range imagers have advantages in terms of a high spatial resolution and high depth precision because their pixels are simple and can handle many photons at one time. This paper reviews and discusses principal lock-in pixels reported both in the past and present, including circuit-based and charge-modulator-based lock-in pixels. In addition, key technologies that include enhancing sensitivity and background suppression techniques are also discussed.},
keywords={},
doi={10.1587/transele.2021CDP0004},
ISSN={1745-1353},
month={July},}
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TY - JOUR
TI - Lock-in Pixel Based Time-of-Flight Range Imagers: An Overview
T2 - IEICE TRANSACTIONS on Electronics
SP - 301
EP - 315
AU - Keita YASUTOMI
AU - Shoji KAWAHITO
PY - 2022
DO - 10.1587/transele.2021CDP0004
JO - IEICE TRANSACTIONS on Electronics
SN - 1745-1353
VL - E105-C
IS - 7
JA - IEICE TRANSACTIONS on Electronics
Y1 - July 2022
AB - Time-of-flight (TOF) range imaging is a promising technology for various applications such as touchless control, augmented reality interface, and automotive. The TOF range imagers are classified into two methods: direct TOF with single photo avalanche diodes and indirect TOF with lock-in pixels. The indirect TOF range imagers have advantages in terms of a high spatial resolution and high depth precision because their pixels are simple and can handle many photons at one time. This paper reviews and discusses principal lock-in pixels reported both in the past and present, including circuit-based and charge-modulator-based lock-in pixels. In addition, key technologies that include enhancing sensitivity and background suppression techniques are also discussed.
ER -