A TM010 cavity power combiner is presented, which achieves direct interface to microstrip lines via magnetic field coupling. A prototype is fabricated and its S-matrix measured. From the S-parameters we calculate that it shows less than 0.85 dB insertion loss over 250 MHz bandwidth at X-band. The return power to the input ports is less than -15 dB over this bandwidth. We verify the insertion loss estimation using S-matrix, by measuring transmission S-parameter of a concatenated 2-port divider-combiner network. Similarly analyzed is the case of performance of power combiner when one of the input fails. We find that we can achieve graceful degradation provided we ensure some particular reflection phase at the degraded port.
Vinay RAVINDRA
University of Tokyo
Hirobumi SAITO
Institute of Space and Astronautical Science of JAXA
Jiro HIROKAWA
Tokyo Institute of Technology
Miao ZHANG
Tokyo Institute of Technology
Atsushi TOMIKI
Institute of Space and Astronautical Science of JAXA
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Vinay RAVINDRA, Hirobumi SAITO, Jiro HIROKAWA, Miao ZHANG, Atsushi TOMIKI, "A TM010 Cavity Power-Combiner with Microstrip Line Inputs" in IEICE TRANSACTIONS on Electronics,
vol. E100-C, no. 12, pp. 1087-1096, December 2017, doi: 10.1587/transele.E100.C.1087.
Abstract: A TM010 cavity power combiner is presented, which achieves direct interface to microstrip lines via magnetic field coupling. A prototype is fabricated and its S-matrix measured. From the S-parameters we calculate that it shows less than 0.85 dB insertion loss over 250 MHz bandwidth at X-band. The return power to the input ports is less than -15 dB over this bandwidth. We verify the insertion loss estimation using S-matrix, by measuring transmission S-parameter of a concatenated 2-port divider-combiner network. Similarly analyzed is the case of performance of power combiner when one of the input fails. We find that we can achieve graceful degradation provided we ensure some particular reflection phase at the degraded port.
URL: https://global.ieice.org/en_transactions/electronics/10.1587/transele.E100.C.1087/_p
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@ARTICLE{e100-c_12_1087,
author={Vinay RAVINDRA, Hirobumi SAITO, Jiro HIROKAWA, Miao ZHANG, Atsushi TOMIKI, },
journal={IEICE TRANSACTIONS on Electronics},
title={A TM010 Cavity Power-Combiner with Microstrip Line Inputs},
year={2017},
volume={E100-C},
number={12},
pages={1087-1096},
abstract={A TM010 cavity power combiner is presented, which achieves direct interface to microstrip lines via magnetic field coupling. A prototype is fabricated and its S-matrix measured. From the S-parameters we calculate that it shows less than 0.85 dB insertion loss over 250 MHz bandwidth at X-band. The return power to the input ports is less than -15 dB over this bandwidth. We verify the insertion loss estimation using S-matrix, by measuring transmission S-parameter of a concatenated 2-port divider-combiner network. Similarly analyzed is the case of performance of power combiner when one of the input fails. We find that we can achieve graceful degradation provided we ensure some particular reflection phase at the degraded port.},
keywords={},
doi={10.1587/transele.E100.C.1087},
ISSN={1745-1353},
month={December},}
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TY - JOUR
TI - A TM010 Cavity Power-Combiner with Microstrip Line Inputs
T2 - IEICE TRANSACTIONS on Electronics
SP - 1087
EP - 1096
AU - Vinay RAVINDRA
AU - Hirobumi SAITO
AU - Jiro HIROKAWA
AU - Miao ZHANG
AU - Atsushi TOMIKI
PY - 2017
DO - 10.1587/transele.E100.C.1087
JO - IEICE TRANSACTIONS on Electronics
SN - 1745-1353
VL - E100-C
IS - 12
JA - IEICE TRANSACTIONS on Electronics
Y1 - December 2017
AB - A TM010 cavity power combiner is presented, which achieves direct interface to microstrip lines via magnetic field coupling. A prototype is fabricated and its S-matrix measured. From the S-parameters we calculate that it shows less than 0.85 dB insertion loss over 250 MHz bandwidth at X-band. The return power to the input ports is less than -15 dB over this bandwidth. We verify the insertion loss estimation using S-matrix, by measuring transmission S-parameter of a concatenated 2-port divider-combiner network. Similarly analyzed is the case of performance of power combiner when one of the input fails. We find that we can achieve graceful degradation provided we ensure some particular reflection phase at the degraded port.
ER -