IEICE TRANSACTIONS on Electronics
A Time-Slicing Ring Oscillator for Capturing Time-Dependent Delay Degradation and Power Supply Voltage Fluctuation
Summary :
A time-slicing ring oscillator (TSRO) which captures time-dependent delay degradation due to periodic transient voltage drop on a power supply network is proposed. An impact of the supply voltage fluctuations, including voltage drop and overshoot, on logic circuit delay is evaluated as a change of oscillation frequency. The TSRO is designed using standard logic cells so that it can be placed almost anywhere in a digital circuit wherein supply voltage fluctuation is concerned. We also propose a new procedure for reconstructing supply voltage waveform. The procedure enables us to accurately monitor time-dependent, effective supply voltages. The -1 dB bandwidth of the TSRO is simulated to be 15.7 GHz, and measured time resolution is 131 ps. Measurement results of a test chip using 90-nm standard CMOS process successfully proved the feasibility of both delay degradation and effective supply voltage fluctuation measurements. Measurement of spatial voltage drop fluctuation is achieved.
- Publication
- IEICE TRANSACTIONS on Electronics Vol.E93-C No.3 pp.324-331
- Publication Date
- 2010/03/01
- Publicized
- Online ISSN
- 1745-1353
- DOI
- 10.1587/transele.E93.C.324
- Type of Manuscript
- Special Section PAPER (Special Section on Circuits and Design Techniques for Advanced Large Scale Integration)
- Category
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Takumi UEZONO, Kazuya MASU, Takashi SATO, "A Time-Slicing Ring Oscillator for Capturing Time-Dependent Delay Degradation and Power Supply Voltage Fluctuation" in IEICE TRANSACTIONS on Electronics,
vol. E93-C, no. 3, pp. 324-331, March 2010, doi: 10.1587/transele.E93.C.324.
Abstract: A time-slicing ring oscillator (TSRO) which captures time-dependent delay degradation due to periodic transient voltage drop on a power supply network is proposed. An impact of the supply voltage fluctuations, including voltage drop and overshoot, on logic circuit delay is evaluated as a change of oscillation frequency. The TSRO is designed using standard logic cells so that it can be placed almost anywhere in a digital circuit wherein supply voltage fluctuation is concerned. We also propose a new procedure for reconstructing supply voltage waveform. The procedure enables us to accurately monitor time-dependent, effective supply voltages. The -1 dB bandwidth of the TSRO is simulated to be 15.7 GHz, and measured time resolution is 131 ps. Measurement results of a test chip using 90-nm standard CMOS process successfully proved the feasibility of both delay degradation and effective supply voltage fluctuation measurements. Measurement of spatial voltage drop fluctuation is achieved.
URL: https://global.ieice.org/en_transactions/electronics/10.1587/transele.E93.C.324/_p
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@ARTICLE{e93-c_3_324,
author={Takumi UEZONO, Kazuya MASU, Takashi SATO, },
journal={IEICE TRANSACTIONS on Electronics},
title={A Time-Slicing Ring Oscillator for Capturing Time-Dependent Delay Degradation and Power Supply Voltage Fluctuation},
year={2010},
volume={E93-C},
number={3},
pages={324-331},
abstract={A time-slicing ring oscillator (TSRO) which captures time-dependent delay degradation due to periodic transient voltage drop on a power supply network is proposed. An impact of the supply voltage fluctuations, including voltage drop and overshoot, on logic circuit delay is evaluated as a change of oscillation frequency. The TSRO is designed using standard logic cells so that it can be placed almost anywhere in a digital circuit wherein supply voltage fluctuation is concerned. We also propose a new procedure for reconstructing supply voltage waveform. The procedure enables us to accurately monitor time-dependent, effective supply voltages. The -1 dB bandwidth of the TSRO is simulated to be 15.7 GHz, and measured time resolution is 131 ps. Measurement results of a test chip using 90-nm standard CMOS process successfully proved the feasibility of both delay degradation and effective supply voltage fluctuation measurements. Measurement of spatial voltage drop fluctuation is achieved.},
keywords={},
doi={10.1587/transele.E93.C.324},
ISSN={1745-1353},
month={March},}
Copy
TY - JOUR
TI - A Time-Slicing Ring Oscillator for Capturing Time-Dependent Delay Degradation and Power Supply Voltage Fluctuation
T2 - IEICE TRANSACTIONS on Electronics
SP - 324
EP - 331
AU - Takumi UEZONO
AU - Kazuya MASU
AU - Takashi SATO
PY - 2010
DO - 10.1587/transele.E93.C.324
JO - IEICE TRANSACTIONS on Electronics
SN - 1745-1353
VL - E93-C
IS - 3
JA - IEICE TRANSACTIONS on Electronics
Y1 - March 2010
AB - A time-slicing ring oscillator (TSRO) which captures time-dependent delay degradation due to periodic transient voltage drop on a power supply network is proposed. An impact of the supply voltage fluctuations, including voltage drop and overshoot, on logic circuit delay is evaluated as a change of oscillation frequency. The TSRO is designed using standard logic cells so that it can be placed almost anywhere in a digital circuit wherein supply voltage fluctuation is concerned. We also propose a new procedure for reconstructing supply voltage waveform. The procedure enables us to accurately monitor time-dependent, effective supply voltages. The -1 dB bandwidth of the TSRO is simulated to be 15.7 GHz, and measured time resolution is 131 ps. Measurement results of a test chip using 90-nm standard CMOS process successfully proved the feasibility of both delay degradation and effective supply voltage fluctuation measurements. Measurement of spatial voltage drop fluctuation is achieved.
ER -
English
