UWB Active Balun Design with Small Group Delay Variation and Improved Return Loss

Kyoung-Pyo AHN; Ryo ISHIKAWA; Kazuhiko HONJO

doi:10.1587/transele.E94.C.905

UWB Active Balun Design with Small Group Delay Variation and Improved Return Loss

Kyoung-Pyo AHN, Ryo ISHIKAWA, Kazuhiko HONJO

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Different from distributed baluns, active baluns have group delay variations in the lower bands related to inherent internal capacitances and resistance in transistors. A negative group delay (NGD) circuit is employed as a compensator of group delay variation for an ultra-wideband (UWB) active balun. First, three-cell NGD circuit is inserted into a simple active balun circuit for realizing both group delay compensation and return loss improvement. The simulated results show a group delay variation of 4.8 ps and an input return loss of above 11.5 dB in the UWB band (3.1-10.6 GHz). Then, a pair of one-cell NGD circuits is added to reduce the remaining group delay variation (3.4 ps in simulation). The circuit with the NGD circuits was fabricated on an InGaP/GaAs HBT MMIC substrate. The measured results achieved a group delay variation of 7.7 ps, a gain variation of 0.5 dB, an input return loss of greater than 10 dB, and an output return loss of larger than 8.1 dB in the UWB band.

Publication: IEICE TRANSACTIONS on Electronics Vol.E94-C No.5 pp.905-908

Publication Date: 2011/05/01

Publicized

Online ISSN: 1745-1353

DOI: 10.1587/transele.E94.C.905

Type of Manuscript: BRIEF PAPER

Category: Microwaves, Millimeter-Waves

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Kyoung-Pyo AHN, Ryo ISHIKAWA, Kazuhiko HONJO, "UWB Active Balun Design with Small Group Delay Variation and Improved Return Loss" in IEICE TRANSACTIONS on Electronics, vol. E94-C, no. 5, pp. 905-908, May 2011, doi: 10.1587/transele.E94.C.905.
Abstract: Different from distributed baluns, active baluns have group delay variations in the lower bands related to inherent internal capacitances and resistance in transistors. A negative group delay (NGD) circuit is employed as a compensator of group delay variation for an ultra-wideband (UWB) active balun. First, three-cell NGD circuit is inserted into a simple active balun circuit for realizing both group delay compensation and return loss improvement. The simulated results show a group delay variation of 4.8 ps and an input return loss of above 11.5 dB in the UWB band (3.1-10.6 GHz). Then, a pair of one-cell NGD circuits is added to reduce the remaining group delay variation (3.4 ps in simulation). The circuit with the NGD circuits was fabricated on an InGaP/GaAs HBT MMIC substrate. The measured results achieved a group delay variation of 7.7 ps, a gain variation of 0.5 dB, an input return loss of greater than 10 dB, and an output return loss of larger than 8.1 dB in the UWB band.
URL: https://global.ieice.org/en_transactions/electronics/10.1587/transele.E94.C.905/_p

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@ARTICLE{e94-c_5_905,
author={Kyoung-Pyo AHN, Ryo ISHIKAWA, Kazuhiko HONJO, },
journal={IEICE TRANSACTIONS on Electronics},
title={UWB Active Balun Design with Small Group Delay Variation and Improved Return Loss},
year={2011},
volume={E94-C},
number={5},
pages={905-908},
abstract={Different from distributed baluns, active baluns have group delay variations in the lower bands related to inherent internal capacitances and resistance in transistors. A negative group delay (NGD) circuit is employed as a compensator of group delay variation for an ultra-wideband (UWB) active balun. First, three-cell NGD circuit is inserted into a simple active balun circuit for realizing both group delay compensation and return loss improvement. The simulated results show a group delay variation of 4.8 ps and an input return loss of above 11.5 dB in the UWB band (3.1-10.6 GHz). Then, a pair of one-cell NGD circuits is added to reduce the remaining group delay variation (3.4 ps in simulation). The circuit with the NGD circuits was fabricated on an InGaP/GaAs HBT MMIC substrate. The measured results achieved a group delay variation of 7.7 ps, a gain variation of 0.5 dB, an input return loss of greater than 10 dB, and an output return loss of larger than 8.1 dB in the UWB band.},
keywords={},
doi={10.1587/transele.E94.C.905},
ISSN={1745-1353},
month={May},}

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TY - JOUR
TI - UWB Active Balun Design with Small Group Delay Variation and Improved Return Loss
T2 - IEICE TRANSACTIONS on Electronics
SP - 905
EP - 908
AU - Kyoung-Pyo AHN
AU - Ryo ISHIKAWA
AU - Kazuhiko HONJO
PY - 2011
DO - 10.1587/transele.E94.C.905
JO - IEICE TRANSACTIONS on Electronics
SN - 1745-1353
VL - E94-C
IS - 5
JA - IEICE TRANSACTIONS on Electronics
Y1 - May 2011
AB - Different from distributed baluns, active baluns have group delay variations in the lower bands related to inherent internal capacitances and resistance in transistors. A negative group delay (NGD) circuit is employed as a compensator of group delay variation for an ultra-wideband (UWB) active balun. First, three-cell NGD circuit is inserted into a simple active balun circuit for realizing both group delay compensation and return loss improvement. The simulated results show a group delay variation of 4.8 ps and an input return loss of above 11.5 dB in the UWB band (3.1-10.6 GHz). Then, a pair of one-cell NGD circuits is added to reduce the remaining group delay variation (3.4 ps in simulation). The circuit with the NGD circuits was fabricated on an InGaP/GaAs HBT MMIC substrate. The measured results achieved a group delay variation of 7.7 ps, a gain variation of 0.5 dB, an input return loss of greater than 10 dB, and an output return loss of larger than 8.1 dB in the UWB band.
ER -