IEICE TRANSACTIONS on Electronics
Two-Tone Signal Generation for ADC Testing
Summary :
This paper describes algorithms for generating low intermodulation-distortion (IMD) two-tone sinewaves, for such as communication application ADC testing, using an arbitrary waveform generator (AWG) or a multi-bit ΣΔ DAC inside an SoC. The nonlinearity of the DAC generates distortion components, and we propose here eight methods to precompensate for the IMD using DSP algorithms and produce low-IMD two-tone signals. Theoretical analysis, simulation, and experimental results all demonstrate the effectiveness of our approach.
- Publication
- IEICE TRANSACTIONS on Electronics Vol.E96-C No.6 pp.850-858
- Publication Date
- 2013/06/01
- Publicized
- Online ISSN
- 1745-1353
- DOI
- 10.1587/transele.E96.C.850
- Type of Manuscript
- Special Section PAPER (Special Section on Analog Circuits and Related SoC Integration Technologies)
- Category
Authors
Keisuke KATO
Gunma University
Fumitaka ABE
Gunma University
Kazuyuki WAKABAYASHI
Gunma University
Chuan GAO
Gunma University
Takafumi YAMADA
Gunma University
Haruo KOBAYASHI
Gunma University
Osamu KOBAYASHI
Semiconductor Technology Academic Research Center(STARC)
Kiichi NIITSU
Nagoya University
Keyword
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Keisuke KATO, Fumitaka ABE, Kazuyuki WAKABAYASHI, Chuan GAO, Takafumi YAMADA, Haruo KOBAYASHI, Osamu KOBAYASHI, Kiichi NIITSU, "Two-Tone Signal Generation for ADC Testing" in IEICE TRANSACTIONS on Electronics,
vol. E96-C, no. 6, pp. 850-858, June 2013, doi: 10.1587/transele.E96.C.850.
Abstract: This paper describes algorithms for generating low intermodulation-distortion (IMD) two-tone sinewaves, for such as communication application ADC testing, using an arbitrary waveform generator (AWG) or a multi-bit ΣΔ DAC inside an SoC. The nonlinearity of the DAC generates distortion components, and we propose here eight methods to precompensate for the IMD using DSP algorithms and produce low-IMD two-tone signals. Theoretical analysis, simulation, and experimental results all demonstrate the effectiveness of our approach.
URL: https://global.ieice.org/en_transactions/electronics/10.1587/transele.E96.C.850/_p
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@ARTICLE{e96-c_6_850,
author={Keisuke KATO, Fumitaka ABE, Kazuyuki WAKABAYASHI, Chuan GAO, Takafumi YAMADA, Haruo KOBAYASHI, Osamu KOBAYASHI, Kiichi NIITSU, },
journal={IEICE TRANSACTIONS on Electronics},
title={Two-Tone Signal Generation for ADC Testing},
year={2013},
volume={E96-C},
number={6},
pages={850-858},
abstract={This paper describes algorithms for generating low intermodulation-distortion (IMD) two-tone sinewaves, for such as communication application ADC testing, using an arbitrary waveform generator (AWG) or a multi-bit ΣΔ DAC inside an SoC. The nonlinearity of the DAC generates distortion components, and we propose here eight methods to precompensate for the IMD using DSP algorithms and produce low-IMD two-tone signals. Theoretical analysis, simulation, and experimental results all demonstrate the effectiveness of our approach.},
keywords={},
doi={10.1587/transele.E96.C.850},
ISSN={1745-1353},
month={June},}
Copy
TY - JOUR
TI - Two-Tone Signal Generation for ADC Testing
T2 - IEICE TRANSACTIONS on Electronics
SP - 850
EP - 858
AU - Keisuke KATO
AU - Fumitaka ABE
AU - Kazuyuki WAKABAYASHI
AU - Chuan GAO
AU - Takafumi YAMADA
AU - Haruo KOBAYASHI
AU - Osamu KOBAYASHI
AU - Kiichi NIITSU
PY - 2013
DO - 10.1587/transele.E96.C.850
JO - IEICE TRANSACTIONS on Electronics
SN - 1745-1353
VL - E96-C
IS - 6
JA - IEICE TRANSACTIONS on Electronics
Y1 - June 2013
AB - This paper describes algorithms for generating low intermodulation-distortion (IMD) two-tone sinewaves, for such as communication application ADC testing, using an arbitrary waveform generator (AWG) or a multi-bit ΣΔ DAC inside an SoC. The nonlinearity of the DAC generates distortion components, and we propose here eight methods to precompensate for the IMD using DSP algorithms and produce low-IMD two-tone signals. Theoretical analysis, simulation, and experimental results all demonstrate the effectiveness of our approach.
ER -
English
