Design and Demonstration of a Single-Flux-Quantum Multi-Stop Time-to-Digital Converter for Time-of-Flight Mass Spectrometry
Summary :
We have been developing a superconducting time-of-flight mass spectrometry (TOF-MS) system, which utilizes a superconductive strip ion detector (SSID) and a single-flux-quantum (SFQ) multi-stop time-to-digital converter (TDC). The SFQ multi-stop TDC can measure the time intervals between multiple input signals and directly convert them into binary data. In this study, we designed and implemented 24-bit SFQ multi-stop TDCs with a 3×24-bit FIFO buffer using the AIST Nb standard process (STP2), whose time resolution and dynamic range are 100ps and 1.6ms, respectively. The timing jitter of the TDC was investigated by comparing two types of TDCs: one uses an on-chip SFQ clock generator (CG) and the other uses a microwave oscillator at room temperature. We confirmed the correct operation of both TDCs and evaluated their timing jitter. The experimentally-obtained timing jitter is about 40ns and 700ps for the TDCs with and without the on-chip SFQ CG, respectively, for the measured time interval of 50µs, which linearly increases with increase of the measured time interval.
- Publication
- IEICE TRANSACTIONS on Electronics Vol.E97-C No.3 pp.182-187
- Publication Date
- 2014/03/01
- Publicized
- Online ISSN
- 1745-1353
- DOI
- 10.1587/transele.E97.C.182
- Type of Manuscript
- Special Section PAPER (Special Section on Leading-Edge Technology of Superconductor Large-Scale Integrated Circuits)
- Category
Authors
Kyosuke SANO
Yokohama National University
Yuki YAMANASHI
Yokohama National University
Nobuyuki YOSHIKAWA
Yokohama National University
Keyword
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Kyosuke SANO, Yuki YAMANASHI, Nobuyuki YOSHIKAWA, "Design and Demonstration of a Single-Flux-Quantum Multi-Stop Time-to-Digital Converter for Time-of-Flight Mass Spectrometry" in IEICE TRANSACTIONS on Electronics,
vol. E97-C, no. 3, pp. 182-187, March 2014, doi: 10.1587/transele.E97.C.182.
Abstract: We have been developing a superconducting time-of-flight mass spectrometry (TOF-MS) system, which utilizes a superconductive strip ion detector (SSID) and a single-flux-quantum (SFQ) multi-stop time-to-digital converter (TDC). The SFQ multi-stop TDC can measure the time intervals between multiple input signals and directly convert them into binary data. In this study, we designed and implemented 24-bit SFQ multi-stop TDCs with a 3×24-bit FIFO buffer using the AIST Nb standard process (STP2), whose time resolution and dynamic range are 100ps and 1.6ms, respectively. The timing jitter of the TDC was investigated by comparing two types of TDCs: one uses an on-chip SFQ clock generator (CG) and the other uses a microwave oscillator at room temperature. We confirmed the correct operation of both TDCs and evaluated their timing jitter. The experimentally-obtained timing jitter is about 40ns and 700ps for the TDCs with and without the on-chip SFQ CG, respectively, for the measured time interval of 50µs, which linearly increases with increase of the measured time interval.
URL: https://global.ieice.org/en_transactions/electronics/10.1587/transele.E97.C.182/_p
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@ARTICLE{e97-c_3_182,
author={Kyosuke SANO, Yuki YAMANASHI, Nobuyuki YOSHIKAWA, },
journal={IEICE TRANSACTIONS on Electronics},
title={Design and Demonstration of a Single-Flux-Quantum Multi-Stop Time-to-Digital Converter for Time-of-Flight Mass Spectrometry},
year={2014},
volume={E97-C},
number={3},
pages={182-187},
abstract={We have been developing a superconducting time-of-flight mass spectrometry (TOF-MS) system, which utilizes a superconductive strip ion detector (SSID) and a single-flux-quantum (SFQ) multi-stop time-to-digital converter (TDC). The SFQ multi-stop TDC can measure the time intervals between multiple input signals and directly convert them into binary data. In this study, we designed and implemented 24-bit SFQ multi-stop TDCs with a 3×24-bit FIFO buffer using the AIST Nb standard process (STP2), whose time resolution and dynamic range are 100ps and 1.6ms, respectively. The timing jitter of the TDC was investigated by comparing two types of TDCs: one uses an on-chip SFQ clock generator (CG) and the other uses a microwave oscillator at room temperature. We confirmed the correct operation of both TDCs and evaluated their timing jitter. The experimentally-obtained timing jitter is about 40ns and 700ps for the TDCs with and without the on-chip SFQ CG, respectively, for the measured time interval of 50µs, which linearly increases with increase of the measured time interval.},
keywords={},
doi={10.1587/transele.E97.C.182},
ISSN={1745-1353},
month={March},}
Copy
TY - JOUR
TI - Design and Demonstration of a Single-Flux-Quantum Multi-Stop Time-to-Digital Converter for Time-of-Flight Mass Spectrometry
T2 - IEICE TRANSACTIONS on Electronics
SP - 182
EP - 187
AU - Kyosuke SANO
AU - Yuki YAMANASHI
AU - Nobuyuki YOSHIKAWA
PY - 2014
DO - 10.1587/transele.E97.C.182
JO - IEICE TRANSACTIONS on Electronics
SN - 1745-1353
VL - E97-C
IS - 3
JA - IEICE TRANSACTIONS on Electronics
Y1 - March 2014
AB - We have been developing a superconducting time-of-flight mass spectrometry (TOF-MS) system, which utilizes a superconductive strip ion detector (SSID) and a single-flux-quantum (SFQ) multi-stop time-to-digital converter (TDC). The SFQ multi-stop TDC can measure the time intervals between multiple input signals and directly convert them into binary data. In this study, we designed and implemented 24-bit SFQ multi-stop TDCs with a 3×24-bit FIFO buffer using the AIST Nb standard process (STP2), whose time resolution and dynamic range are 100ps and 1.6ms, respectively. The timing jitter of the TDC was investigated by comparing two types of TDCs: one uses an on-chip SFQ clock generator (CG) and the other uses a microwave oscillator at room temperature. We confirmed the correct operation of both TDCs and evaluated their timing jitter. The experimentally-obtained timing jitter is about 40ns and 700ps for the TDCs with and without the on-chip SFQ CG, respectively, for the measured time interval of 50µs, which linearly increases with increase of the measured time interval.
ER -
English
