Characterization of Crossing Transmission Line Using Two-Port Measurements for Millimeter-Wave CMOS Circuit Design
Summary :
A multi-port device is characterized using measurement results of a two-port Vector Network Analyzer (VNA) with four different structures. The loads used as terminations are open-, or short-circuited transmission lines (TLs), which are characterized along with Ground-Signal-Ground pads based on L-2L de-embedding method. A new characterization method for a four-port device is introduced along with its theory. The method is validated using simulation and measurement results. The characterized four-port device is a Crossing Transmission Line (CTL), mainly used for over-pass or under-pass of RF signals. Four measurement results are used to characterize the CTL. The S-parameter response of the CTL is found. To compare the results, reconstructed responses compared with the measurements. Results show good agreement between the measured and modeled results from 1 GHz to 110 GHz.
- Publication
- IEICE TRANSACTIONS on Electronics Vol.E98-C No.1 pp.35-44
- Publication Date
- 2015/01/01
- Publicized
- Online ISSN
- 1745-1353
- DOI
- 10.1587/transele.E98.C.35
- Type of Manuscript
- PAPER
- Category
- Microwaves, Millimeter-Waves
Authors
Korkut Kaan TOKGOZ
Tokyo Institute of Technology
Kimsrun LIM
Tokyo Institute of Technology
Seitarou KAWAI
Tokyo Institute of Technology
Nurul FAJRI
Tokyo Institute of Technology
Kenichi OKADA
Tokyo Institute of Technology
Akira MATSUZAWA
Tokyo Institute of Technology
Keyword
Latest Issue
Copyrights notice of machine-translated contents
The copyright of the original papers published on this site belongs to IEICE. Unauthorized use of the original or translated papers is prohibited. See IEICE Provisions on Copyright for details.
Cite this
Copy
Korkut Kaan TOKGOZ, Kimsrun LIM, Seitarou KAWAI, Nurul FAJRI, Kenichi OKADA, Akira MATSUZAWA, "Characterization of Crossing Transmission Line Using Two-Port Measurements for Millimeter-Wave CMOS Circuit Design" in IEICE TRANSACTIONS on Electronics,
vol. E98-C, no. 1, pp. 35-44, January 2015, doi: 10.1587/transele.E98.C.35.
Abstract: A multi-port device is characterized using measurement results of a two-port Vector Network Analyzer (VNA) with four different structures. The loads used as terminations are open-, or short-circuited transmission lines (TLs), which are characterized along with Ground-Signal-Ground pads based on L-2L de-embedding method. A new characterization method for a four-port device is introduced along with its theory. The method is validated using simulation and measurement results. The characterized four-port device is a Crossing Transmission Line (CTL), mainly used for over-pass or under-pass of RF signals. Four measurement results are used to characterize the CTL. The S-parameter response of the CTL is found. To compare the results, reconstructed responses compared with the measurements. Results show good agreement between the measured and modeled results from 1 GHz to 110 GHz.
URL: https://global.ieice.org/en_transactions/electronics/10.1587/transele.E98.C.35/_p
Copy
@ARTICLE{e98-c_1_35,
author={Korkut Kaan TOKGOZ, Kimsrun LIM, Seitarou KAWAI, Nurul FAJRI, Kenichi OKADA, Akira MATSUZAWA, },
journal={IEICE TRANSACTIONS on Electronics},
title={Characterization of Crossing Transmission Line Using Two-Port Measurements for Millimeter-Wave CMOS Circuit Design},
year={2015},
volume={E98-C},
number={1},
pages={35-44},
abstract={A multi-port device is characterized using measurement results of a two-port Vector Network Analyzer (VNA) with four different structures. The loads used as terminations are open-, or short-circuited transmission lines (TLs), which are characterized along with Ground-Signal-Ground pads based on L-2L de-embedding method. A new characterization method for a four-port device is introduced along with its theory. The method is validated using simulation and measurement results. The characterized four-port device is a Crossing Transmission Line (CTL), mainly used for over-pass or under-pass of RF signals. Four measurement results are used to characterize the CTL. The S-parameter response of the CTL is found. To compare the results, reconstructed responses compared with the measurements. Results show good agreement between the measured and modeled results from 1 GHz to 110 GHz.},
keywords={},
doi={10.1587/transele.E98.C.35},
ISSN={1745-1353},
month={January},}
Copy
TY - JOUR
TI - Characterization of Crossing Transmission Line Using Two-Port Measurements for Millimeter-Wave CMOS Circuit Design
T2 - IEICE TRANSACTIONS on Electronics
SP - 35
EP - 44
AU - Korkut Kaan TOKGOZ
AU - Kimsrun LIM
AU - Seitarou KAWAI
AU - Nurul FAJRI
AU - Kenichi OKADA
AU - Akira MATSUZAWA
PY - 2015
DO - 10.1587/transele.E98.C.35
JO - IEICE TRANSACTIONS on Electronics
SN - 1745-1353
VL - E98-C
IS - 1
JA - IEICE TRANSACTIONS on Electronics
Y1 - January 2015
AB - A multi-port device is characterized using measurement results of a two-port Vector Network Analyzer (VNA) with four different structures. The loads used as terminations are open-, or short-circuited transmission lines (TLs), which are characterized along with Ground-Signal-Ground pads based on L-2L de-embedding method. A new characterization method for a four-port device is introduced along with its theory. The method is validated using simulation and measurement results. The characterized four-port device is a Crossing Transmission Line (CTL), mainly used for over-pass or under-pass of RF signals. Four measurement results are used to characterize the CTL. The S-parameter response of the CTL is found. To compare the results, reconstructed responses compared with the measurements. Results show good agreement between the measured and modeled results from 1 GHz to 110 GHz.
ER -
English
