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IEICE TRANSACTIONS on Electronics

Characterization of Crossing Transmission Line Using Two-Port Measurements for Millimeter-Wave CMOS Circuit Design

Korkut Kaan TOKGOZ, Kimsrun LIM, Seitarou KAWAI, Nurul FAJRI, Kenichi OKADA, Akira MATSUZAWA

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Summary :

A multi-port device is characterized using measurement results of a two-port Vector Network Analyzer (VNA) with four different structures. The loads used as terminations are open-, or short-circuited transmission lines (TLs), which are characterized along with Ground-Signal-Ground pads based on L-2L de-embedding method. A new characterization method for a four-port device is introduced along with its theory. The method is validated using simulation and measurement results. The characterized four-port device is a Crossing Transmission Line (CTL), mainly used for over-pass or under-pass of RF signals. Four measurement results are used to characterize the CTL. The S-parameter response of the CTL is found. To compare the results, reconstructed responses compared with the measurements. Results show good agreement between the measured and modeled results from 1 GHz to 110 GHz.

Publication
IEICE TRANSACTIONS on Electronics Vol.E98-C No.1 pp.35-44
Publication Date
2015/01/01
Publicized
Online ISSN
1745-1353
DOI
10.1587/transele.E98.C.35
Type of Manuscript
PAPER
Category
Microwaves, Millimeter-Waves

Authors

Korkut Kaan TOKGOZ
  Tokyo Institute of Technology
Kimsrun LIM
  Tokyo Institute of Technology
Seitarou KAWAI
  Tokyo Institute of Technology
Nurul FAJRI
  Tokyo Institute of Technology
Kenichi OKADA
  Tokyo Institute of Technology
Akira MATSUZAWA
  Tokyo Institute of Technology

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