IEICE TRANSACTIONS on Electronics
Analysis and Evaluation of Electromagnetic Interference between ThruChip Interface and LC-VCO
Summary :
This paper presents analysis and simple design guideline for ThruChip Interface (TCI) as located by LC-VCO which is used in high-speed SoC. The electromagnetic interference (EMI) from TCI channels to LC-VCO is analyzed and evaluated. The accuracy of the analysis and design guidelines is verified through the test-chip verification.
- Publication
- IEICE TRANSACTIONS on Electronics Vol.E99-C No.6 pp.659-662
- Publication Date
- 2016/06/01
- Publicized
- Online ISSN
- 1745-1353
- DOI
- 10.1587/transele.E99.C.659
- Type of Manuscript
- BRIEF PAPER
- Category
Authors
Junichiro KADOMOTO
Keio University
So HASEGAWA
Keio University
Yusuke KIUCHI
Keio University
Atsutake KOSUGE
Keio University
Tadahiro KURODA
Keio University
Keyword
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Junichiro KADOMOTO, So HASEGAWA, Yusuke KIUCHI, Atsutake KOSUGE, Tadahiro KURODA, "Analysis and Evaluation of Electromagnetic Interference between ThruChip Interface and LC-VCO" in IEICE TRANSACTIONS on Electronics,
vol. E99-C, no. 6, pp. 659-662, June 2016, doi: 10.1587/transele.E99.C.659.
Abstract: This paper presents analysis and simple design guideline for ThruChip Interface (TCI) as located by LC-VCO which is used in high-speed SoC. The electromagnetic interference (EMI) from TCI channels to LC-VCO is analyzed and evaluated. The accuracy of the analysis and design guidelines is verified through the test-chip verification.
URL: https://global.ieice.org/en_transactions/electronics/10.1587/transele.E99.C.659/_p
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@ARTICLE{e99-c_6_659,
author={Junichiro KADOMOTO, So HASEGAWA, Yusuke KIUCHI, Atsutake KOSUGE, Tadahiro KURODA, },
journal={IEICE TRANSACTIONS on Electronics},
title={Analysis and Evaluation of Electromagnetic Interference between ThruChip Interface and LC-VCO},
year={2016},
volume={E99-C},
number={6},
pages={659-662},
abstract={This paper presents analysis and simple design guideline for ThruChip Interface (TCI) as located by LC-VCO which is used in high-speed SoC. The electromagnetic interference (EMI) from TCI channels to LC-VCO is analyzed and evaluated. The accuracy of the analysis and design guidelines is verified through the test-chip verification.},
keywords={},
doi={10.1587/transele.E99.C.659},
ISSN={1745-1353},
month={June},}
Copy
TY - JOUR
TI - Analysis and Evaluation of Electromagnetic Interference between ThruChip Interface and LC-VCO
T2 - IEICE TRANSACTIONS on Electronics
SP - 659
EP - 662
AU - Junichiro KADOMOTO
AU - So HASEGAWA
AU - Yusuke KIUCHI
AU - Atsutake KOSUGE
AU - Tadahiro KURODA
PY - 2016
DO - 10.1587/transele.E99.C.659
JO - IEICE TRANSACTIONS on Electronics
SN - 1745-1353
VL - E99-C
IS - 6
JA - IEICE TRANSACTIONS on Electronics
Y1 - June 2016
AB - This paper presents analysis and simple design guideline for ThruChip Interface (TCI) as located by LC-VCO which is used in high-speed SoC. The electromagnetic interference (EMI) from TCI channels to LC-VCO is analyzed and evaluated. The accuracy of the analysis and design guidelines is verified through the test-chip verification.
ER -
English
