Design automation of LCD driver circuits is not sophisticatedly established. Display fineness of an LCD panel depends on a performance metric, ratio of pixel voltage to video voltage (RPV). However, there are several other important metrics, such as area, and the best circuit cannot be decided uniquely. This paper proposes a design automation technique for a LCD column driver to provide several circuit design results with different performance so that designers can select an appropriate design among them. The proposed technique is evaluated with an actual design data, and experimental results show that the proposed method successfully performs technology migration by transistor sizing. Also, the proposed technique is experimentally verified from points of solution quality and computational time.
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Masanori HASHIMOTO, Takahito IJICHI, Shingo TAKAHASHI, Shuji TSUKIYAMA, Isao SHIRAKAWA, "Transistor Sizing of LCD Driver Circuit for Technology Migration" in IEICE TRANSACTIONS on Fundamentals,
vol. E90-A, no. 12, pp. 2712-2717, December 2007, doi: 10.1093/ietfec/e90-a.12.2712.
Abstract: Design automation of LCD driver circuits is not sophisticatedly established. Display fineness of an LCD panel depends on a performance metric, ratio of pixel voltage to video voltage (RPV). However, there are several other important metrics, such as area, and the best circuit cannot be decided uniquely. This paper proposes a design automation technique for a LCD column driver to provide several circuit design results with different performance so that designers can select an appropriate design among them. The proposed technique is evaluated with an actual design data, and experimental results show that the proposed method successfully performs technology migration by transistor sizing. Also, the proposed technique is experimentally verified from points of solution quality and computational time.
URL: https://global.ieice.org/en_transactions/fundamentals/10.1093/ietfec/e90-a.12.2712/_p
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@ARTICLE{e90-a_12_2712,
author={Masanori HASHIMOTO, Takahito IJICHI, Shingo TAKAHASHI, Shuji TSUKIYAMA, Isao SHIRAKAWA, },
journal={IEICE TRANSACTIONS on Fundamentals},
title={Transistor Sizing of LCD Driver Circuit for Technology Migration},
year={2007},
volume={E90-A},
number={12},
pages={2712-2717},
abstract={Design automation of LCD driver circuits is not sophisticatedly established. Display fineness of an LCD panel depends on a performance metric, ratio of pixel voltage to video voltage (RPV). However, there are several other important metrics, such as area, and the best circuit cannot be decided uniquely. This paper proposes a design automation technique for a LCD column driver to provide several circuit design results with different performance so that designers can select an appropriate design among them. The proposed technique is evaluated with an actual design data, and experimental results show that the proposed method successfully performs technology migration by transistor sizing. Also, the proposed technique is experimentally verified from points of solution quality and computational time.},
keywords={},
doi={10.1093/ietfec/e90-a.12.2712},
ISSN={1745-1337},
month={December},}
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TY - JOUR
TI - Transistor Sizing of LCD Driver Circuit for Technology Migration
T2 - IEICE TRANSACTIONS on Fundamentals
SP - 2712
EP - 2717
AU - Masanori HASHIMOTO
AU - Takahito IJICHI
AU - Shingo TAKAHASHI
AU - Shuji TSUKIYAMA
AU - Isao SHIRAKAWA
PY - 2007
DO - 10.1093/ietfec/e90-a.12.2712
JO - IEICE TRANSACTIONS on Fundamentals
SN - 1745-1337
VL - E90-A
IS - 12
JA - IEICE TRANSACTIONS on Fundamentals
Y1 - December 2007
AB - Design automation of LCD driver circuits is not sophisticatedly established. Display fineness of an LCD panel depends on a performance metric, ratio of pixel voltage to video voltage (RPV). However, there are several other important metrics, such as area, and the best circuit cannot be decided uniquely. This paper proposes a design automation technique for a LCD column driver to provide several circuit design results with different performance so that designers can select an appropriate design among them. The proposed technique is evaluated with an actual design data, and experimental results show that the proposed method successfully performs technology migration by transistor sizing. Also, the proposed technique is experimentally verified from points of solution quality and computational time.
ER -