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Katsutoshi SAEKI, Heisuke NAKASHIMA, Yoshifumi SEKINE, "CMOS Implementation of a Multiple-Valued Memory Cell Using -Shaped Negative-Resistance Devices" in IEICE TRANSACTIONS on Fundamentals,
vol. E87-A, no. 4, pp. 801-806, April 2004, doi: .
Abstract: In this paper, we propose the CMOS implementation of a multiple-valued memory cell using -shaped negative-resistance devices. We first propose the construction of a multiple-stable circuit that consists of -shaped negative-resistance devices from four enhancement-mode MOSFETs without a floating voltage source, and connect this in parallel with a unit circuit. It is shown that the movement of -shaped negative-resistance characteristics in the direction of the voltage axis is due to voltage sources. Furthermore, we propose the construction of a multiple-valued memory cell using a multiple-stable circuit. It is shown that it is possible to write and hold data. If the power supply is switched on, it has a feature which enables operation without any electric charge leakage. It is possible, by connecting -shaped negative-resistance devices in parallel, to easily increase the number of multiple values.
URL: https://global.ieice.org/en_transactions/fundamentals/10.1587/e87-a_4_801/_p
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@ARTICLE{e87-a_4_801,
author={Katsutoshi SAEKI, Heisuke NAKASHIMA, Yoshifumi SEKINE, },
journal={IEICE TRANSACTIONS on Fundamentals},
title={CMOS Implementation of a Multiple-Valued Memory Cell Using -Shaped Negative-Resistance Devices},
year={2004},
volume={E87-A},
number={4},
pages={801-806},
abstract={In this paper, we propose the CMOS implementation of a multiple-valued memory cell using -shaped negative-resistance devices. We first propose the construction of a multiple-stable circuit that consists of -shaped negative-resistance devices from four enhancement-mode MOSFETs without a floating voltage source, and connect this in parallel with a unit circuit. It is shown that the movement of -shaped negative-resistance characteristics in the direction of the voltage axis is due to voltage sources. Furthermore, we propose the construction of a multiple-valued memory cell using a multiple-stable circuit. It is shown that it is possible to write and hold data. If the power supply is switched on, it has a feature which enables operation without any electric charge leakage. It is possible, by connecting -shaped negative-resistance devices in parallel, to easily increase the number of multiple values.},
keywords={},
doi={},
ISSN={},
month={April},}
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TY - JOUR
TI - CMOS Implementation of a Multiple-Valued Memory Cell Using -Shaped Negative-Resistance Devices
T2 - IEICE TRANSACTIONS on Fundamentals
SP - 801
EP - 806
AU - Katsutoshi SAEKI
AU - Heisuke NAKASHIMA
AU - Yoshifumi SEKINE
PY - 2004
DO -
JO - IEICE TRANSACTIONS on Fundamentals
SN -
VL - E87-A
IS - 4
JA - IEICE TRANSACTIONS on Fundamentals
Y1 - April 2004
AB - In this paper, we propose the CMOS implementation of a multiple-valued memory cell using -shaped negative-resistance devices. We first propose the construction of a multiple-stable circuit that consists of -shaped negative-resistance devices from four enhancement-mode MOSFETs without a floating voltage source, and connect this in parallel with a unit circuit. It is shown that the movement of -shaped negative-resistance characteristics in the direction of the voltage axis is due to voltage sources. Furthermore, we propose the construction of a multiple-valued memory cell using a multiple-stable circuit. It is shown that it is possible to write and hold data. If the power supply is switched on, it has a feature which enables operation without any electric charge leakage. It is possible, by connecting -shaped negative-resistance devices in parallel, to easily increase the number of multiple values.
ER -