FPGA that exploits via-switches, which are a kind of non-volatile resistive RAMs, for crossbar implementation is attracting attention due to its high integration density and energy efficiency. Via-switch crossbar is responsible for the signal routing in the interconnections by changing on/off-states of via-switches. To verify the via-switch crossbar functionality after manufacturing, fault testing that checks whether we can turn on/off via-switches normally is essential. This paper confirms that a general differential pair comparator successfully discriminates on/off-states of via-switches, and clarifies fault modes of a via-switch by transistor-level SPICE simulation that injects stuck-on/off faults to atom switch and varistor, where a via-switch consists of two atom switches and two varistors. We then propose a fault diagnosis methodology for via-switches in the crossbar that diagnoses the fault modes according to the comparator response difference between the normal and faulty via-switches. The proposed method achieves 100% fault detection by checking the comparator responses after turning on/off the via-switch. In case that the number of faulty components in a via-switch is one, the ratio of the fault diagnosis, which exactly identifies the faulty varistor and atom switch inside the faulty via-switch, is 100%, and in case of up to two faults, the fault diagnosis ratio is 79%.
Ryutaro DOI
Osaka University
Xu BAI
NEC Corporation
Toshitsugu SAKAMOTO
NEC Corporation
Masanori HASHIMOTO
Osaka University
The copyright of the original papers published on this site belongs to IEICE. Unauthorized use of the original or translated papers is prohibited. See IEICE Provisions on Copyright for details.
Copy
Ryutaro DOI, Xu BAI, Toshitsugu SAKAMOTO, Masanori HASHIMOTO, "A Fault Detection and Diagnosis Method for Via-Switch Crossbar in Non-Volatile FPGA" in IEICE TRANSACTIONS on Fundamentals,
vol. E103-A, no. 12, pp. 1447-1455, December 2020, doi: 10.1587/transfun.2020VLP0005.
Abstract: FPGA that exploits via-switches, which are a kind of non-volatile resistive RAMs, for crossbar implementation is attracting attention due to its high integration density and energy efficiency. Via-switch crossbar is responsible for the signal routing in the interconnections by changing on/off-states of via-switches. To verify the via-switch crossbar functionality after manufacturing, fault testing that checks whether we can turn on/off via-switches normally is essential. This paper confirms that a general differential pair comparator successfully discriminates on/off-states of via-switches, and clarifies fault modes of a via-switch by transistor-level SPICE simulation that injects stuck-on/off faults to atom switch and varistor, where a via-switch consists of two atom switches and two varistors. We then propose a fault diagnosis methodology for via-switches in the crossbar that diagnoses the fault modes according to the comparator response difference between the normal and faulty via-switches. The proposed method achieves 100% fault detection by checking the comparator responses after turning on/off the via-switch. In case that the number of faulty components in a via-switch is one, the ratio of the fault diagnosis, which exactly identifies the faulty varistor and atom switch inside the faulty via-switch, is 100%, and in case of up to two faults, the fault diagnosis ratio is 79%.
URL: https://global.ieice.org/en_transactions/fundamentals/10.1587/transfun.2020VLP0005/_p
Copy
@ARTICLE{e103-a_12_1447,
author={Ryutaro DOI, Xu BAI, Toshitsugu SAKAMOTO, Masanori HASHIMOTO, },
journal={IEICE TRANSACTIONS on Fundamentals},
title={A Fault Detection and Diagnosis Method for Via-Switch Crossbar in Non-Volatile FPGA},
year={2020},
volume={E103-A},
number={12},
pages={1447-1455},
abstract={FPGA that exploits via-switches, which are a kind of non-volatile resistive RAMs, for crossbar implementation is attracting attention due to its high integration density and energy efficiency. Via-switch crossbar is responsible for the signal routing in the interconnections by changing on/off-states of via-switches. To verify the via-switch crossbar functionality after manufacturing, fault testing that checks whether we can turn on/off via-switches normally is essential. This paper confirms that a general differential pair comparator successfully discriminates on/off-states of via-switches, and clarifies fault modes of a via-switch by transistor-level SPICE simulation that injects stuck-on/off faults to atom switch and varistor, where a via-switch consists of two atom switches and two varistors. We then propose a fault diagnosis methodology for via-switches in the crossbar that diagnoses the fault modes according to the comparator response difference between the normal and faulty via-switches. The proposed method achieves 100% fault detection by checking the comparator responses after turning on/off the via-switch. In case that the number of faulty components in a via-switch is one, the ratio of the fault diagnosis, which exactly identifies the faulty varistor and atom switch inside the faulty via-switch, is 100%, and in case of up to two faults, the fault diagnosis ratio is 79%.},
keywords={},
doi={10.1587/transfun.2020VLP0005},
ISSN={1745-1337},
month={December},}
Copy
TY - JOUR
TI - A Fault Detection and Diagnosis Method for Via-Switch Crossbar in Non-Volatile FPGA
T2 - IEICE TRANSACTIONS on Fundamentals
SP - 1447
EP - 1455
AU - Ryutaro DOI
AU - Xu BAI
AU - Toshitsugu SAKAMOTO
AU - Masanori HASHIMOTO
PY - 2020
DO - 10.1587/transfun.2020VLP0005
JO - IEICE TRANSACTIONS on Fundamentals
SN - 1745-1337
VL - E103-A
IS - 12
JA - IEICE TRANSACTIONS on Fundamentals
Y1 - December 2020
AB - FPGA that exploits via-switches, which are a kind of non-volatile resistive RAMs, for crossbar implementation is attracting attention due to its high integration density and energy efficiency. Via-switch crossbar is responsible for the signal routing in the interconnections by changing on/off-states of via-switches. To verify the via-switch crossbar functionality after manufacturing, fault testing that checks whether we can turn on/off via-switches normally is essential. This paper confirms that a general differential pair comparator successfully discriminates on/off-states of via-switches, and clarifies fault modes of a via-switch by transistor-level SPICE simulation that injects stuck-on/off faults to atom switch and varistor, where a via-switch consists of two atom switches and two varistors. We then propose a fault diagnosis methodology for via-switches in the crossbar that diagnoses the fault modes according to the comparator response difference between the normal and faulty via-switches. The proposed method achieves 100% fault detection by checking the comparator responses after turning on/off the via-switch. In case that the number of faulty components in a via-switch is one, the ratio of the fault diagnosis, which exactly identifies the faulty varistor and atom switch inside the faulty via-switch, is 100%, and in case of up to two faults, the fault diagnosis ratio is 79%.
ER -