The search functionality is under construction.

IEICE TRANSACTIONS on Fundamentals

A Fault Detection and Diagnosis Method for Via-Switch Crossbar in Non-Volatile FPGA

Ryutaro DOI, Xu BAI, Toshitsugu SAKAMOTO, Masanori HASHIMOTO

  • Full Text Views

    0

  • Cite this

Summary :

FPGA that exploits via-switches, which are a kind of non-volatile resistive RAMs, for crossbar implementation is attracting attention due to its high integration density and energy efficiency. Via-switch crossbar is responsible for the signal routing in the interconnections by changing on/off-states of via-switches. To verify the via-switch crossbar functionality after manufacturing, fault testing that checks whether we can turn on/off via-switches normally is essential. This paper confirms that a general differential pair comparator successfully discriminates on/off-states of via-switches, and clarifies fault modes of a via-switch by transistor-level SPICE simulation that injects stuck-on/off faults to atom switch and varistor, where a via-switch consists of two atom switches and two varistors. We then propose a fault diagnosis methodology for via-switches in the crossbar that diagnoses the fault modes according to the comparator response difference between the normal and faulty via-switches. The proposed method achieves 100% fault detection by checking the comparator responses after turning on/off the via-switch. In case that the number of faulty components in a via-switch is one, the ratio of the fault diagnosis, which exactly identifies the faulty varistor and atom switch inside the faulty via-switch, is 100%, and in case of up to two faults, the fault diagnosis ratio is 79%.

Publication
IEICE TRANSACTIONS on Fundamentals Vol.E103-A No.12 pp.1447-1455
Publication Date
2020/12/01
Publicized
Online ISSN
1745-1337
DOI
10.1587/transfun.2020VLP0005
Type of Manuscript
Special Section PAPER (Special Section on VLSI Design and CAD Algorithms)
Category

Authors

Ryutaro DOI
  Osaka University
Xu BAI
  NEC Corporation
Toshitsugu SAKAMOTO
  NEC Corporation
Masanori HASHIMOTO
  Osaka University

Keyword