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[Author] Xu BAI(6hit)

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  • Implementation of Voltage-Mode/Current-Mode Hybrid Circuits for a Low-Power Fine-Grain Reconfigurable VLSI

    Xu BAI  Michitaka KAMEYAMA  

     
    PAPER-Integrated Electronics

      Vol:
    E97-C No:10
      Page(s):
    1028-1035

    This paper proposes low-power voltage-mode/current-mode hybrid circuits to realize an arbitrary two-variable logic function and a full-adder function. The voltage and current mode can be selected for low-power operations at low and high frequency, respectively, according to speed requirement. An nMOS pass transistor network is shared to realize voltage switching and current steering for the voltage- and current-mode operations, respectively, which leads to high utilization of the hardware resources. As a result, when the operating frequency is more than 1.15,GHz, the current mode of the hybrid logic circuit is more power-efficient than the voltage mode. Otherwise, the voltage mode is more power-efficient. The power consumption of the hybrid two-variable logic circuit is lower than that of the conventional two-input look-up table (LUT) using CMOS transmission gates, when the operating frequency is more than 800,MHz. The delay and area of the hybrid two-variable logic circuit are increased by only 7% and 13%, respectively

  • 28nm Atom-Switch FPGA: Static Timing Analysis and Evaluation

    Xu BAI  Ryusuke NEBASHI  Makoto MIYAMURA  Kazunori FUNAHASHI  Naoki BANNO  Koichiro OKAMOTO  Hideaki NUMATA  Noriyuki IGUCHI  Tadahiko SUGIBAYASHI  Toshitsugu SAKAMOTO  Munehiro TADA  

     
    BRIEF PAPER

      Pubricized:
    2022/06/27
      Vol:
    E105-C No:10
      Page(s):
    627-630

    A static timing analysis (STA) tool for a 28nm atom-switch FPGA (AS-FPGA) is introduced to validate the signal delay of an application circuit before implementation. High accuracy of the STA tool is confirmed by implementing a practical application circuit on the 28nm AS-FPGA. Moreover, dramatic improvement of delay and power is demonstrated in comparison with a previous 40nm AS-FPGA.

  • A Bit-Serial Reconfigurable VLSI Based on a Multiple-Valued X-Net Data Transfer Scheme

    Xu BAI  Michitaka KAMEYAMA  

     
    PAPER-Computer System

      Vol:
    E96-D No:7
      Page(s):
    1449-1456

    A multiple-valued data transfer scheme using X-net is proposed to realize a compact bit-serial reconfigurable VLSI (BS-RVLSI). In the multiple-valued data transfer scheme using X-net, two binary data can be transferred from two adjacent cells to one common adjacent cell simultaneously at each “X” intersection. One cell composed of a logic block and a switch block is connected to four adjacent cross points by four one-bit switches so that the complexity of the switch block is reduced to 50% in comparison with the cell of a BS-RVLSI using an eight nearest-neighbor mesh network (8-NNM). In the logic block, threshold logic circuits are used to perform threshold operations, and then their binary dual-rail voltage outputs enter a binary logic module which can be programmed to realize an arbitrary two-variable binary function or a bit-serial adder. As a result, the configuration memory count and transistor count of the proposed multiple-valued cell are reduced to 34% and 58%, respectively, in comparison with those of an equivalent CMOS cell. Moreover, its power consumption for an arbitrary 2-variable binary function becomes 67% at 800 MHz under the condition of the same delay time.

  • A Fault Detection and Diagnosis Method for Via-Switch Crossbar in Non-Volatile FPGA

    Ryutaro DOI  Xu BAI  Toshitsugu SAKAMOTO  Masanori HASHIMOTO  

     
    PAPER

      Vol:
    E103-A No:12
      Page(s):
    1447-1455

    FPGA that exploits via-switches, which are a kind of non-volatile resistive RAMs, for crossbar implementation is attracting attention due to its high integration density and energy efficiency. Via-switch crossbar is responsible for the signal routing in the interconnections by changing on/off-states of via-switches. To verify the via-switch crossbar functionality after manufacturing, fault testing that checks whether we can turn on/off via-switches normally is essential. This paper confirms that a general differential pair comparator successfully discriminates on/off-states of via-switches, and clarifies fault modes of a via-switch by transistor-level SPICE simulation that injects stuck-on/off faults to atom switch and varistor, where a via-switch consists of two atom switches and two varistors. We then propose a fault diagnosis methodology for via-switches in the crossbar that diagnoses the fault modes according to the comparator response difference between the normal and faulty via-switches. The proposed method achieves 100% fault detection by checking the comparator responses after turning on/off the via-switch. In case that the number of faulty components in a via-switch is one, the ratio of the fault diagnosis, which exactly identifies the faulty varistor and atom switch inside the faulty via-switch, is 100%, and in case of up to two faults, the fault diagnosis ratio is 79%.

  • A Multiple-Valued Reconfigurable VLSI Architecture Using Binary-Controlled Differential-Pair Circuits

    Xu BAI  Michitaka KAMEYAMA  

     
    PAPER-Integrated Electronics

      Vol:
    E96-C No:8
      Page(s):
    1083-1093

    This paper presents a fine-grain bit-serial reconfigurable VLSI architecture using multiple-valued switch blocks and binary logic modules. Multiple-valued signaling is utilized to implement a compact switch block. A binary-controlled current-steering technique is introduced, utilizing a programmable three-level differential-pair circuit to implement a high-performance low-power arbitrary two-variable binary function, and increase the noise margins in comparison with the quaternary-controlled differential-pair circuit. A current-source sharing technique between a series-gating differential-pair circuit and a current-mode D-latch is proposed to reduce the current source count and improve the speed. It is demonstrated that the power consumption and the delay of the proposed multiple-valued cell based on the binary-controlled current-steering technique and the current-source-sharing technique are reduced to 63% and 72%, respectively, in comparison with those of a previous multiple-valued cell.

  • Multiple-Valued Fine-Grain Reconfigurable VLSI Using a Global Tree Local X-Net Network

    Xu BAI  Michitaka KAMEYAMA  

     
    PAPER-VLSI Architecture

      Vol:
    E97-D No:9
      Page(s):
    2278-2285

    A global tree local X-net network (GTLX) is introduced to realize high-performance data transfer in a multiple-valued fine-grain reconfigurable VLSI (MVFG-RVLSI). A global pipelined tree network is utilized to realize high-performance long-distance bit-parallel data transfer. Moreover, a logic-in-memory architecture is employed for solving data transfer bottleneck between a block data memory and a cell. A local X-net network is utilized to realize simple interconnections and compact switch blocks for eight-near neighborhood data transfer. Moreover, multiple-valued signaling is utilized to improve the utilization of the X-net network, where two binary data can be transferred from two adjacent cells to one common adjacent cell simultaneously at each “X” intersection. To evaluate the MVFG-RVLSI, a fast Fourier transform (FFT) operation is mapped onto a previous MVFG-RVLSI using only the X-net network and the MVFG-RVLSI using the GTLX. As a result, the computation time, the power consumption and the transistor count of the MVFG-RVLSI using the GTLX are reduced by 25%, 36% and 56%, respectively, in comparison with those of the MVFG-RVLSI using only the X-net network.