IEICE TRANSACTIONS on Fundamentals
One-Shot Voltage-Measurement Circuit Utilizing Process Variation
Summary :
A novel voltage measurement circuit which utilizes process variation is proposed. Using the proposed circuit, the voltage of a nonperiodic waveform at a particular time point can be accurately captured by a single clock pulse (one-shot measurement). The proposed circuit can be designed without compensation circuits against process variation, and thus occupies only a small area. An analytical expression of offset voltage for the comparator utilizing process variation (UPV-comparator), which plays a key role in the proposed circuit, is derived and design considerations for the proposed circuit are discussed. The circuit operation is confirmed through SPICE simulation using 90 nm CMOS device models. The -0.04 and -3 dB bandwidths (99% and 50% amplitudes) of the proposed circuit are about 10 MHz and far over 1 GHz, respectively. The circuit area is also estimated using an experimental layout.
- Publication
- IEICE TRANSACTIONS on Fundamentals Vol.E92-A No.4 pp.1024-1030
- Publication Date
- 2009/04/01
- Publicized
- Online ISSN
- 1745-1337
- DOI
- 10.1587/transfun.E92.A.1024
- Type of Manuscript
- Special Section PAPER (Special Section on Advanced Technologies Emerging Mainly from the 21st Workshop on Circuits and Systems in Karuizawa)
- Category
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Takumi UEZONO, Takashi SATO, Kazuya MASU, "One-Shot Voltage-Measurement Circuit Utilizing Process Variation" in IEICE TRANSACTIONS on Fundamentals,
vol. E92-A, no. 4, pp. 1024-1030, April 2009, doi: 10.1587/transfun.E92.A.1024.
Abstract: A novel voltage measurement circuit which utilizes process variation is proposed. Using the proposed circuit, the voltage of a nonperiodic waveform at a particular time point can be accurately captured by a single clock pulse (one-shot measurement). The proposed circuit can be designed without compensation circuits against process variation, and thus occupies only a small area. An analytical expression of offset voltage for the comparator utilizing process variation (UPV-comparator), which plays a key role in the proposed circuit, is derived and design considerations for the proposed circuit are discussed. The circuit operation is confirmed through SPICE simulation using 90 nm CMOS device models. The -0.04 and -3 dB bandwidths (99% and 50% amplitudes) of the proposed circuit are about 10 MHz and far over 1 GHz, respectively. The circuit area is also estimated using an experimental layout.
URL: https://global.ieice.org/en_transactions/fundamentals/10.1587/transfun.E92.A.1024/_p
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@ARTICLE{e92-a_4_1024,
author={Takumi UEZONO, Takashi SATO, Kazuya MASU, },
journal={IEICE TRANSACTIONS on Fundamentals},
title={One-Shot Voltage-Measurement Circuit Utilizing Process Variation},
year={2009},
volume={E92-A},
number={4},
pages={1024-1030},
abstract={A novel voltage measurement circuit which utilizes process variation is proposed. Using the proposed circuit, the voltage of a nonperiodic waveform at a particular time point can be accurately captured by a single clock pulse (one-shot measurement). The proposed circuit can be designed without compensation circuits against process variation, and thus occupies only a small area. An analytical expression of offset voltage for the comparator utilizing process variation (UPV-comparator), which plays a key role in the proposed circuit, is derived and design considerations for the proposed circuit are discussed. The circuit operation is confirmed through SPICE simulation using 90 nm CMOS device models. The -0.04 and -3 dB bandwidths (99% and 50% amplitudes) of the proposed circuit are about 10 MHz and far over 1 GHz, respectively. The circuit area is also estimated using an experimental layout.},
keywords={},
doi={10.1587/transfun.E92.A.1024},
ISSN={1745-1337},
month={April},}
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TY - JOUR
TI - One-Shot Voltage-Measurement Circuit Utilizing Process Variation
T2 - IEICE TRANSACTIONS on Fundamentals
SP - 1024
EP - 1030
AU - Takumi UEZONO
AU - Takashi SATO
AU - Kazuya MASU
PY - 2009
DO - 10.1587/transfun.E92.A.1024
JO - IEICE TRANSACTIONS on Fundamentals
SN - 1745-1337
VL - E92-A
IS - 4
JA - IEICE TRANSACTIONS on Fundamentals
Y1 - April 2009
AB - A novel voltage measurement circuit which utilizes process variation is proposed. Using the proposed circuit, the voltage of a nonperiodic waveform at a particular time point can be accurately captured by a single clock pulse (one-shot measurement). The proposed circuit can be designed without compensation circuits against process variation, and thus occupies only a small area. An analytical expression of offset voltage for the comparator utilizing process variation (UPV-comparator), which plays a key role in the proposed circuit, is derived and design considerations for the proposed circuit are discussed. The circuit operation is confirmed through SPICE simulation using 90 nm CMOS device models. The -0.04 and -3 dB bandwidths (99% and 50% amplitudes) of the proposed circuit are about 10 MHz and far over 1 GHz, respectively. The circuit area is also estimated using an experimental layout.
ER -
English
