IEICE TRANSACTIONS on Fundamentals
Improvement in Computational Accuracy of Output Transition Time Variation Considering Threshold Voltage Variations
Summary :
Process variation is becoming a primal concern in timing closure of LSI (Large Scale Integrated Circuit) with the progress of process technology scaling. To overcome this problem, SSTA (Statistical Static Timing Analysis) has been intensively studied since it is expected to be one of the most efficient ways for performance estimation. In this paper, we study variation of output transition-time. We firstly clarify that the transition-time variation can not be expressed accurately by a conventional first-order sensitivity-based approach in the case that the input transition-time is slow and the output load is small. We secondly reveal quadratic dependence of the output transition-time to operating margin in voltage. We finally propose a procedure through which the estimation of output transition-time becomes continuously accurate in wide range of input transition-time and output load combinations.
- Publication
- IEICE TRANSACTIONS on Fundamentals Vol.E92-A No.4 pp.990-997
- Publication Date
- 2009/04/01
- Publicized
- Online ISSN
- 1745-1337
- DOI
- 10.1587/transfun.E92.A.990
- Type of Manuscript
- Special Section PAPER (Special Section on Advanced Technologies Emerging Mainly from the 21st Workshop on Circuits and Systems in Karuizawa)
- Category
Authors
Takaaki OKUMURA
Atsushi KUROKAWA
Hiroo MASUDA
Toshiki KANAMOTO
Masanori HASHIMOTO
Hiroshi TAKAFUJI
Hidenari NAKASHIMA
Nobuto ONO
Tsuyoshi SAKATA
Takashi SATO
Keyword
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Takaaki OKUMURA, Atsushi KUROKAWA, Hiroo MASUDA, Toshiki KANAMOTO, Masanori HASHIMOTO, Hiroshi TAKAFUJI, Hidenari NAKASHIMA, Nobuto ONO, Tsuyoshi SAKATA, Takashi SATO, "Improvement in Computational Accuracy of Output Transition Time Variation Considering Threshold Voltage Variations" in IEICE TRANSACTIONS on Fundamentals,
vol. E92-A, no. 4, pp. 990-997, April 2009, doi: 10.1587/transfun.E92.A.990.
Abstract: Process variation is becoming a primal concern in timing closure of LSI (Large Scale Integrated Circuit) with the progress of process technology scaling. To overcome this problem, SSTA (Statistical Static Timing Analysis) has been intensively studied since it is expected to be one of the most efficient ways for performance estimation. In this paper, we study variation of output transition-time. We firstly clarify that the transition-time variation can not be expressed accurately by a conventional first-order sensitivity-based approach in the case that the input transition-time is slow and the output load is small. We secondly reveal quadratic dependence of the output transition-time to operating margin in voltage. We finally propose a procedure through which the estimation of output transition-time becomes continuously accurate in wide range of input transition-time and output load combinations.
URL: https://global.ieice.org/en_transactions/fundamentals/10.1587/transfun.E92.A.990/_p
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@ARTICLE{e92-a_4_990,
author={Takaaki OKUMURA, Atsushi KUROKAWA, Hiroo MASUDA, Toshiki KANAMOTO, Masanori HASHIMOTO, Hiroshi TAKAFUJI, Hidenari NAKASHIMA, Nobuto ONO, Tsuyoshi SAKATA, Takashi SATO, },
journal={IEICE TRANSACTIONS on Fundamentals},
title={Improvement in Computational Accuracy of Output Transition Time Variation Considering Threshold Voltage Variations},
year={2009},
volume={E92-A},
number={4},
pages={990-997},
abstract={Process variation is becoming a primal concern in timing closure of LSI (Large Scale Integrated Circuit) with the progress of process technology scaling. To overcome this problem, SSTA (Statistical Static Timing Analysis) has been intensively studied since it is expected to be one of the most efficient ways for performance estimation. In this paper, we study variation of output transition-time. We firstly clarify that the transition-time variation can not be expressed accurately by a conventional first-order sensitivity-based approach in the case that the input transition-time is slow and the output load is small. We secondly reveal quadratic dependence of the output transition-time to operating margin in voltage. We finally propose a procedure through which the estimation of output transition-time becomes continuously accurate in wide range of input transition-time and output load combinations.},
keywords={},
doi={10.1587/transfun.E92.A.990},
ISSN={1745-1337},
month={April},}
Copy
TY - JOUR
TI - Improvement in Computational Accuracy of Output Transition Time Variation Considering Threshold Voltage Variations
T2 - IEICE TRANSACTIONS on Fundamentals
SP - 990
EP - 997
AU - Takaaki OKUMURA
AU - Atsushi KUROKAWA
AU - Hiroo MASUDA
AU - Toshiki KANAMOTO
AU - Masanori HASHIMOTO
AU - Hiroshi TAKAFUJI
AU - Hidenari NAKASHIMA
AU - Nobuto ONO
AU - Tsuyoshi SAKATA
AU - Takashi SATO
PY - 2009
DO - 10.1587/transfun.E92.A.990
JO - IEICE TRANSACTIONS on Fundamentals
SN - 1745-1337
VL - E92-A
IS - 4
JA - IEICE TRANSACTIONS on Fundamentals
Y1 - April 2009
AB - Process variation is becoming a primal concern in timing closure of LSI (Large Scale Integrated Circuit) with the progress of process technology scaling. To overcome this problem, SSTA (Statistical Static Timing Analysis) has been intensively studied since it is expected to be one of the most efficient ways for performance estimation. In this paper, we study variation of output transition-time. We firstly clarify that the transition-time variation can not be expressed accurately by a conventional first-order sensitivity-based approach in the case that the input transition-time is slow and the output load is small. We secondly reveal quadratic dependence of the output transition-time to operating margin in voltage. We finally propose a procedure through which the estimation of output transition-time becomes continuously accurate in wide range of input transition-time and output load combinations.
ER -
English
