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Improvement in Computational Accuracy of Output Transition Time Variation Considering Threshold Voltage Variations

Takaaki OKUMURA, Atsushi KUROKAWA, Hiroo MASUDA, Toshiki KANAMOTO, Masanori HASHIMOTO, Hiroshi TAKAFUJI, Hidenari NAKASHIMA, Nobuto ONO, Tsuyoshi SAKATA, Takashi SATO

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Summary :

Process variation is becoming a primal concern in timing closure of LSI (Large Scale Integrated Circuit) with the progress of process technology scaling. To overcome this problem, SSTA (Statistical Static Timing Analysis) has been intensively studied since it is expected to be one of the most efficient ways for performance estimation. In this paper, we study variation of output transition-time. We firstly clarify that the transition-time variation can not be expressed accurately by a conventional first-order sensitivity-based approach in the case that the input transition-time is slow and the output load is small. We secondly reveal quadratic dependence of the output transition-time to operating margin in voltage. We finally propose a procedure through which the estimation of output transition-time becomes continuously accurate in wide range of input transition-time and output load combinations.

Publication
IEICE TRANSACTIONS on Fundamentals Vol.E92-A No.4 pp.990-997
Publication Date
2009/04/01
Publicized
Online ISSN
1745-1337
DOI
10.1587/transfun.E92.A.990
Type of Manuscript
Special Section PAPER (Special Section on Advanced Technologies Emerging Mainly from the 21st Workshop on Circuits and Systems in Karuizawa)
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