Scan Design for Two-Pattern Test without Extra Latches

Kazuteru NAMBA; Hideo ITO

doi:10.1093/ietisy/e88-d.12.2777

Scan Design for Two-Pattern Test without Extra Latches

Kazuteru NAMBA, Hideo ITO

Full Text Views

0

Cite this

Summary :

There are three well-known approaches to using scan design to apply two-pattern testing: broadside testing (functional justification), skewed-load testing and enhanced scan testing. The broadside and skewed-load testing use the standard scan design, and thus the area overheads are not high. However fault coverage is low. The enhanced scan testing uses the enhanced scan design. The design uses extra latches, and allows scan-in any two-pattern testing. While this method achieves high fault coverage, it causes high area overhead because of extra latches. This paper presents a new scan design where two-pattern testing with high fault coverage can be performed with area overhead as low as the standard scan design. The proposed scan-FFs are based on master-slave FFs. The input of each scan-FF is connected to the output of the master latch and not the slave latch of the previous FF. Every scan-FF maintains the output value during scan-shift operations.

Publication: IEICE TRANSACTIONS on Information Vol.E88-D No.12 pp.2777-2785

Publication Date: 2005/12/01

Publicized

Online ISSN

DOI: 10.1093/ietisy/e88-d.12.2777

Type of Manuscript: PAPER

Category: Dependable Computing

Cite this

Copy

Kazuteru NAMBA, Hideo ITO, "Scan Design for Two-Pattern Test without Extra Latches" in IEICE TRANSACTIONS on Information, vol. E88-D, no. 12, pp. 2777-2785, December 2005, doi: 10.1093/ietisy/e88-d.12.2777.
Abstract: There are three well-known approaches to using scan design to apply two-pattern testing: broadside testing (functional justification), skewed-load testing and enhanced scan testing. The broadside and skewed-load testing use the standard scan design, and thus the area overheads are not high. However fault coverage is low. The enhanced scan testing uses the enhanced scan design. The design uses extra latches, and allows scan-in any two-pattern testing. While this method achieves high fault coverage, it causes high area overhead because of extra latches. This paper presents a new scan design where two-pattern testing with high fault coverage can be performed with area overhead as low as the standard scan design. The proposed scan-FFs are based on master-slave FFs. The input of each scan-FF is connected to the output of the master latch and not the slave latch of the previous FF. Every scan-FF maintains the output value during scan-shift operations.
URL: https://global.ieice.org/en_transactions/information/10.1093/ietisy/e88-d.12.2777/_p

Copy

@ARTICLE{e88-d_12_2777,
author={Kazuteru NAMBA, Hideo ITO, },
journal={IEICE TRANSACTIONS on Information},
title={Scan Design for Two-Pattern Test without Extra Latches},
year={2005},
volume={E88-D},
number={12},
pages={2777-2785},
abstract={There are three well-known approaches to using scan design to apply two-pattern testing: broadside testing (functional justification), skewed-load testing and enhanced scan testing. The broadside and skewed-load testing use the standard scan design, and thus the area overheads are not high. However fault coverage is low. The enhanced scan testing uses the enhanced scan design. The design uses extra latches, and allows scan-in any two-pattern testing. While this method achieves high fault coverage, it causes high area overhead because of extra latches. This paper presents a new scan design where two-pattern testing with high fault coverage can be performed with area overhead as low as the standard scan design. The proposed scan-FFs are based on master-slave FFs. The input of each scan-FF is connected to the output of the master latch and not the slave latch of the previous FF. Every scan-FF maintains the output value during scan-shift operations.},
keywords={},
doi={10.1093/ietisy/e88-d.12.2777},
ISSN={},
month={December},}

Copy

TY - JOUR
TI - Scan Design for Two-Pattern Test without Extra Latches
T2 - IEICE TRANSACTIONS on Information
SP - 2777
EP - 2785
AU - Kazuteru NAMBA
AU - Hideo ITO
PY - 2005
DO - 10.1093/ietisy/e88-d.12.2777
JO - IEICE TRANSACTIONS on Information
SN -
VL - E88-D
IS - 12
JA - IEICE TRANSACTIONS on Information
Y1 - December 2005
AB - There are three well-known approaches to using scan design to apply two-pattern testing: broadside testing (functional justification), skewed-load testing and enhanced scan testing. The broadside and skewed-load testing use the standard scan design, and thus the area overheads are not high. However fault coverage is low. The enhanced scan testing uses the enhanced scan design. The design uses extra latches, and allows scan-in any two-pattern testing. While this method achieves high fault coverage, it causes high area overhead because of extra latches. This paper presents a new scan design where two-pattern testing with high fault coverage can be performed with area overhead as low as the standard scan design. The proposed scan-FFs are based on master-slave FFs. The input of each scan-FF is connected to the output of the master latch and not the slave latch of the previous FF. Every scan-FF maintains the output value during scan-shift operations.
ER -