Linear feed-forward/feedback shift registers are used as an effective tool of testing circuits in various fields including built-in self-test and secure scan design. In this paper, we consider the issue of testing linear feed-forward/feedback shift registers themselves. To test linear feed-forward/feedback shift registers, it is necessary to generate a test sequence for each register. We first present an experimental result such that a commercial ATPG (automatic test pattern generator) cannot always generate a test sequence with high fault coverage even for 64-stage linear feed-forward/feedback shift registers. We then show that there exists a universal test sequence with 100% of fault coverage for the class of linear feed-forward/feedback shift registers so that no test generation is required, i.e., the cost of test generation is zero. We prove the existence theorem of universal test sequences for the class of linear feed-forward/feedback shift registers.

In our previous work, we introduced new concepts of secure scan design; shift register equivalent circuits (SR-equivalents, for short) and strongly secure circuits, and also introduced generalized shift registers (GSRs, for short) to apply them to secure scan design. In this paper, we combine both concepts of SR-equivalents and strongly secure circuits and apply them to GSRs, and consider the synthesis problem of strongly secure SR-equivalents using GSRs. We also consider the enumeration problem of GSRs that are strongly secure and SR-equivalent, i.e., the cardinality of the class of strongly secure SR-equivalent GSRs to clarify the security level of the secure scan architecture.

We reported a secure scan design approach using shift register equivalents (SR-equivalents, for short) that are functionally equivalent but not structurally equivalent to shift registers [10 and also introduced generalized shift registers (GSRs, for short) to apply them to secure scan design [11]-[13]. In this paper, we combine both concepts of SR-equivalents and GSRs and consider the synthesis problem of SR-equivalent GSRs, i.e., how to modify a given GSR to an SR-equivalent GSR. We also consider the enumeration problem of SR-equivalent GFSRs, i.e., the cardinality of the class of SR-equivalent GSRs to clarify the security level of the secure scan architecture.

In our previous work [12], [13], we introduced generalized feed-forward shift registers (GF2SR, for short) to apply them to secure and testable scan design. In this paper, we introduce another class of generalized shift registers called generalized feedback shift registers (GFSR, for short), and consider the properties of GFSR that are useful for secure scan design. We present how to control/observe GFSR to guarantee scan-in and scan-out operations that can be overlapped in the same way as the conventional scan testing. Testability and security of scan design using GFSR are considered. The cardinality of each class is clarified. We also present how to design strongly secure GFSR as well as GF2SR considered in [13].

In our previous work [12], [13], we introduced generalized feed-forward shift registers (GF2SR, for short) to apply them to secure and testable scan design, where we considered the security problem from the viewpoint of the complexity of identifying the structure of GF2SRs. Although the proposed scan design is secure in the sense that the structure of a GF2SR cannot be identified only from the primary input/output relation, it may not be secure if part of the contents of the circuit leak out. In this paper, we introduce a more secure concept called strong security such that no internal state of strongly secure circuits leaks out, and present how to design such strongly secure GF2SRs.

In this paper, we introduce generalized feed-forward shift registers (GF2SR) to apply them to secure and testable scan design. Previously, we introduced SR-equivalents and SR-quasi-equivalents which can be used in secure and testable scan design, and showed that inversion-inserted linear feed-forward shift registers (I2LF2SR) are useful circuits for the secure and testable scan design. GF2SR is an extension of I2LF2SR and the class is much wider than that of I2LF2SR. Since the cardinality of the class of GF2SR is much larger than that of I2LF2SR, the security level of scan design with GF2SR is much higher than that of I2LF2SR. We consider how to control/observe GF2SR to guarantee easy scan-in/out operations, i.e., state-justification and state-identification problems are considered. Both scan-in and scan-out operations can be overlapped in the same way as the conventional scan testing, and hence the test sequence for the proposed scan design is of the same length as the conventional scan design. A program called WAGSR (Web Application for Generalized feed-forward Shift Registers) is presented to solve those problems.

In this paper, we propose a hybrid test application in partial skewed-load (PSL) scan design. The PSL scan design in which some flip-flops (FFs) are controlled as skewed-load FFs and the others are controlled as broad-side FFs was proposed in [1]. We notice that the PSL scan design potentially has a capability of two test application modes: one is the broad-side test mode, and the other is the hybrid test mode which corresponds to the test application considered in [1]. According to this observation, we present a hybrid test application of the two test modes in the PSL scan design. In addition, we also address a way of skewed-load FF selection based on propagation dominance of FFs in order to take advantage of the hybrid test application. Experimental results for ITC'99 benchmark circuits show that the hybrid test application in the proposed PSL scan design can achieve higher fault coverage than the design based on the skewed-load FF selection [1] does.

It is important to find an efficient design-for-testability methodology that satisfies both security and testability, although there exists an inherent contradiction between security and testability for digital circuits. In our previous work, we reported a secure and testable scan design approach by using extended shift registers that are functionally equivalent but not structurally equivalent to shift registers, and showed a security level by clarifying the cardinality of those classes of shift register equivalents (SR-equivalents). However, SR-equivalents are not always secure for scan-based side-channel attacks. In this paper, we consider a scan-based differential-behavior attack and propose several classes of SR-equivalent scan circuits using dummy flip-flops in order to protect the scan-based differential-behavior attack. To show the security level of those SR-equivalent scan circuits, we introduce a differential-behavior equivalent relation and clarify the number of SR-equivalent scan circuits, the number of differential-behavior equivalent classes and the cardinality of those equivalent classes.

This paper presents a scan design for delay fault testability of 2-rail logic circuits. The flip flops used in the scan design are based on master-slave ones. The proposed scan design provides complete fault coverage in delay fault testing of 2-rail logic circuits. In two-pattern testing with the proposed scan design, initial vectors are set using the set-reset operation, and the scan-in operation for initial vectors is not required. Hence, the test application time is reduced to about half that of the enhanced scan design. Because the additional function is only the set-reset operation of the slave latch, the area overhead is small. The evaluation shows that the differences in the area overhead of the proposed scan design from those of the standard scan design and the enhanced scan design are 2.1 and -14.5 percent on average, respectively.

There are three well-known approaches to using scan design to apply two-pattern testing: broadside testing (functional justification), skewed-load testing and enhanced scan testing. The broadside and skewed-load testing use the standard scan design, and thus the area overheads are not high. However fault coverage is low. The enhanced scan testing uses the enhanced scan design. The design uses extra latches, and allows scan-in any two-pattern testing. While this method achieves high fault coverage, it causes high area overhead because of extra latches. This paper presents a new scan design where two-pattern testing with high fault coverage can be performed with area overhead as low as the standard scan design. The proposed scan-FFs are based on master-slave FFs. The input of each scan-FF is connected to the output of the master latch and not the slave latch of the previous FF. Every scan-FF maintains the output value during scan-shift operations.

This paper presents a non-scan design scheme to enhance delay fault testability of controllers. In this scheme, we utilize a given state transition graph (STG) to test delay faults in its synthesized controller. The original behavior of the STG is used during test application. For faults that cannot be detected by using the original behavior, we design an extra logic, called an invalid test state and transition generator, to make those faults detectable. Our scheme allows achieving short test application time and at-speed testing. We show the effectiveness of our method by experiments.

A two stage non-scan design for testability method is proposed. The first stage selects test points based on an earlier testability measure conflict. A new design for testability algorithm is proposed to select test points by a fault-oriented testability measure conflict+ in the second stage. Test points are selected in the second stage based on the hard faults after the initial ATPG run of the design for testability circuit in the preliminary stage. The new testability measure conflict+ based on conflict analysis of hard-faults in the process of test generation is introduced, which emulates most general features of sequential ATPG. The new testability measure reduces testability of a fault to the minimum D or controllability of the primary outputs, and therefore, does not need observability measure any more. Effective approximate schemes are adopted to get reasonable estimation of the testability measure. A couple of effective techniques are also adopted to accelerate the process of the proposed design for testability algorithm. Experimental results show that the proposed method gets even better results than two of the recent non-scan design for testability methods nscan and lcdft.

As LSIs are two-dimensional structures, the number of external pins increases at a lower rate than the corresponding increase in the number of gates on the LSI. Therefore, the number of flip-flops on a scan path increases as the density of gates on LSIs rises, resulting in longer test application times. In this paper, three novel DFT strategies aimed at reducing test application time are proposed. DFT strategy 1 is a full scan design method with test point insertion, DFT strategy 2 is a partial scan design method, and DFT strategy 3 is a partial scan design method with test point insertion. Experimental results show that these DFT strategies reduced the test application times by 45% to 82% compared with conventional full scan design methods.

We will present a partial scan design method based on n-fold line-up structures in order to achieve high fault efficiency and reduce test pattern generation time for practical LSIs. We will also present a partial scan design method based on the state justification of pure load/hold FFs in order to achieve high fault efficiency and reduce the number of scan FFs for practical LSIs with lots of load/hold FFs. Experimental results for practical LSIs show that our presented methods can achieve high fault efficiency (more than 99%) and reduce the number of scan FFs for the LSI with lots of load/hold FFs.

We present a high-level synthesis scheme that considers weak testability of generated register-transfer level (RTL) data paths, as well as their area and performance. The weak testability, proposed in our previous work, is a testability measure of RTL data paths for non-scan design. In our scheme, we first extract a condition on resource sharing sufficient for weak testability from a data flow graph before synthesis, and treat the condition as design objectives in the following synthesis tasks. We propose heuristic synthesis algorithms which optimize area and the design objectives under the performance constraint.

We have previously proposed a scannable memory configuration which is useful in testing logic blocks around memory arrays. Although the configuration is supposed to be effective in testing the memory array itself by its frequent read/write access during the scan operation, it has not been theoretically shown what types of faults can be detected. In this paper, from a viewpoint of memory testing, we investigate the testability of the scannable memory configuration and propose a memory array test using the scan path. It is shown that we can detect (1) all stuck-at faults in memory cells, (2) all stuck-at faults in address decoders, (3) all stuck-at faults in read/write logic, (4) static, dynamic and 2-coupling faults between memory cells of adjacent words, and (5) static coupling faults between memory cells in the same word. The test can be accomplished simply by comparing scan-in data and scan-out data. The test vector is 20ms bit long, where m is the number of words of the memory array under test and s is the total scan path length.

This paper describes the design and evaluation of fully scannable embedded memory arrays. A memory array, such as a register file, is made scannable by adding a small auxiliary circuit including a counter and multiplexers. Plural memory arrays can be chained into a single scan path along with ordinary flip-flops. Detailed configuration and implementation of the scannable CMOS and bipolar LCML register file macros are discussed. The overhead ratio of the CMOS register file macro with 16-word by 16-bit results in an 8.6% transistor count and a 6.4% die area. The access time overhaead is 7.8% and the set-up time increases by about 50ps. Bipolar LCML register file macros have been applied to gate array LSIs which have successfully achieved average stuck-at fault coverage of 99.2%.

An approach to design for testability using register-transfer level (RTL) partial scan selection is described. We define an RTL circuit model which enables efficient description in an electronic system design automation (ESDA) tool and testability analysis which leads to effective partial scan selection for RTL design including data path circuits and control circuits such as state machines. We also introduced a method of partial scan selection at RTL which selects critical registers and state machines based on RTL testability analysis. DFT techniques using gate level testability measures have been studied and concluded that they are not successful in achieving high fault coverage [15]. However, we started this work for the following reasons, 1) In sequential ATPG procedure, more than two memory elements belonging to a functional units such as registers and state machines are often required to be justified at a time. At RTL, state machines and registers are explicitly described and recognized as functional units while gate level memory elements are scattered over the circuit. 2) As discussed in [6], if the circuit is modified so that the test sequence which causes state transition between initial and final states of sequential ATPG can be easily obtained, ATPG results can be also improved. Complex state machines can be identified at RTL. According to the experimental results, our gate level DFT achieves high fault coverage comparable with the previously published most successful DFT methods, and DFT at RTL resulted in higher fault coverage than gate level DFT at much shorter CPU time.

Full scan design of sequential circuits results in greatly reducing the cost of their test generation. However, it introduces the extra expense of many test clocks to control and observe the values of flip-flops because of the need to shift values for the flip-flops into the scan panh. In this paper we propose a new method of generating compact test sequences for scan-based sequential circuits on the assumption that the number of shift clocks is allowed to vary for each test vector. The method is based on Boolean function manipulation using a shared binary decision diagram (SBDD). Although the test generation algorithm is basically for general sequential circuits, the computational cost is much lower for scan-based sequential circuits than for non-scanbased sequential circuits because the length of a test sequence for each fault is limited. Experimental results show that, for all the tested circuits, test sequences generated by the method require much smaller number of test clocks than compact or minimum test sets for combinational logic part of scan-based sequential circuits. The reduction rate was 48% on the average in the experiments.