IEICE TRANSACTIONS on Information
Universal Testing for Linear Feed-Forward/Feedback Shift Registers
Summary :
Linear feed-forward/feedback shift registers are used as an effective tool of testing circuits in various fields including built-in self-test and secure scan design. In this paper, we consider the issue of testing linear feed-forward/feedback shift registers themselves. To test linear feed-forward/feedback shift registers, it is necessary to generate a test sequence for each register. We first present an experimental result such that a commercial ATPG (automatic test pattern generator) cannot always generate a test sequence with high fault coverage even for 64-stage linear feed-forward/feedback shift registers. We then show that there exists a universal test sequence with 100% of fault coverage for the class of linear feed-forward/feedback shift registers so that no test generation is required, i.e., the cost of test generation is zero. We prove the existence theorem of universal test sequences for the class of linear feed-forward/feedback shift registers.
- Publication
- IEICE TRANSACTIONS on Information Vol.E103-D No.5 pp.1023-1030
- Publication Date
- 2020/05/01
- Publicized
- 2020/02/25
- Online ISSN
- 1745-1361
- DOI
- 10.1587/transinf.2019EDP7205
- Type of Manuscript
- PAPER
- Category
- Dependable Computing
Authors
Hideo FUJIWARA
Osaka Gakuin University
Katsuya FUJIWARA
Akita University
Toshinori HOSOKAWA
Nihon University
Keyword
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Hideo FUJIWARA, Katsuya FUJIWARA, Toshinori HOSOKAWA, "Universal Testing for Linear Feed-Forward/Feedback Shift Registers" in IEICE TRANSACTIONS on Information,
vol. E103-D, no. 5, pp. 1023-1030, May 2020, doi: 10.1587/transinf.2019EDP7205.
Abstract: Linear feed-forward/feedback shift registers are used as an effective tool of testing circuits in various fields including built-in self-test and secure scan design. In this paper, we consider the issue of testing linear feed-forward/feedback shift registers themselves. To test linear feed-forward/feedback shift registers, it is necessary to generate a test sequence for each register. We first present an experimental result such that a commercial ATPG (automatic test pattern generator) cannot always generate a test sequence with high fault coverage even for 64-stage linear feed-forward/feedback shift registers. We then show that there exists a universal test sequence with 100% of fault coverage for the class of linear feed-forward/feedback shift registers so that no test generation is required, i.e., the cost of test generation is zero. We prove the existence theorem of universal test sequences for the class of linear feed-forward/feedback shift registers.
URL: https://global.ieice.org/en_transactions/information/10.1587/transinf.2019EDP7205/_p
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@ARTICLE{e103-d_5_1023,
author={Hideo FUJIWARA, Katsuya FUJIWARA, Toshinori HOSOKAWA, },
journal={IEICE TRANSACTIONS on Information},
title={Universal Testing for Linear Feed-Forward/Feedback Shift Registers},
year={2020},
volume={E103-D},
number={5},
pages={1023-1030},
abstract={Linear feed-forward/feedback shift registers are used as an effective tool of testing circuits in various fields including built-in self-test and secure scan design. In this paper, we consider the issue of testing linear feed-forward/feedback shift registers themselves. To test linear feed-forward/feedback shift registers, it is necessary to generate a test sequence for each register. We first present an experimental result such that a commercial ATPG (automatic test pattern generator) cannot always generate a test sequence with high fault coverage even for 64-stage linear feed-forward/feedback shift registers. We then show that there exists a universal test sequence with 100% of fault coverage for the class of linear feed-forward/feedback shift registers so that no test generation is required, i.e., the cost of test generation is zero. We prove the existence theorem of universal test sequences for the class of linear feed-forward/feedback shift registers.},
keywords={},
doi={10.1587/transinf.2019EDP7205},
ISSN={1745-1361},
month={May},}
Copy
TY - JOUR
TI - Universal Testing for Linear Feed-Forward/Feedback Shift Registers
T2 - IEICE TRANSACTIONS on Information
SP - 1023
EP - 1030
AU - Hideo FUJIWARA
AU - Katsuya FUJIWARA
AU - Toshinori HOSOKAWA
PY - 2020
DO - 10.1587/transinf.2019EDP7205
JO - IEICE TRANSACTIONS on Information
SN - 1745-1361
VL - E103-D
IS - 5
JA - IEICE TRANSACTIONS on Information
Y1 - May 2020
AB - Linear feed-forward/feedback shift registers are used as an effective tool of testing circuits in various fields including built-in self-test and secure scan design. In this paper, we consider the issue of testing linear feed-forward/feedback shift registers themselves. To test linear feed-forward/feedback shift registers, it is necessary to generate a test sequence for each register. We first present an experimental result such that a commercial ATPG (automatic test pattern generator) cannot always generate a test sequence with high fault coverage even for 64-stage linear feed-forward/feedback shift registers. We then show that there exists a universal test sequence with 100% of fault coverage for the class of linear feed-forward/feedback shift registers so that no test generation is required, i.e., the cost of test generation is zero. We prove the existence theorem of universal test sequences for the class of linear feed-forward/feedback shift registers.
ER -
English
