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Universal Testing for Linear Feed-Forward/Feedback Shift Registers

Hideo FUJIWARA, Katsuya FUJIWARA, Toshinori HOSOKAWA

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Summary :

Linear feed-forward/feedback shift registers are used as an effective tool of testing circuits in various fields including built-in self-test and secure scan design. In this paper, we consider the issue of testing linear feed-forward/feedback shift registers themselves. To test linear feed-forward/feedback shift registers, it is necessary to generate a test sequence for each register. We first present an experimental result such that a commercial ATPG (automatic test pattern generator) cannot always generate a test sequence with high fault coverage even for 64-stage linear feed-forward/feedback shift registers. We then show that there exists a universal test sequence with 100% of fault coverage for the class of linear feed-forward/feedback shift registers so that no test generation is required, i.e., the cost of test generation is zero. We prove the existence theorem of universal test sequences for the class of linear feed-forward/feedback shift registers.

Publication
IEICE TRANSACTIONS on Information Vol.E103-D No.5 pp.1023-1030
Publication Date
2020/05/01
Publicized
2020/02/25
Online ISSN
1745-1361
DOI
10.1587/transinf.2019EDP7205
Type of Manuscript
PAPER
Category
Dependable Computing

Authors

Hideo FUJIWARA
  Osaka Gakuin University
Katsuya FUJIWARA
  Akita University
Toshinori HOSOKAWA
  Nihon University

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