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IEICE TRANSACTIONS on Information

High-Level Synthesis for Weakly Testable Data Paths

Michiko INOUE, Kenji NODA, Takeshi HIGASHIMURA, Toshimitsu MASUZAWA, Hideo FUJIWARA

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Summary :

We present a high-level synthesis scheme that considers weak testability of generated register-transfer level (RTL) data paths, as well as their area and performance. The weak testability, proposed in our previous work, is a testability measure of RTL data paths for non-scan design. In our scheme, we first extract a condition on resource sharing sufficient for weak testability from a data flow graph before synthesis, and treat the condition as design objectives in the following synthesis tasks. We propose heuristic synthesis algorithms which optimize area and the design objectives under the performance constraint.

Publication
IEICE TRANSACTIONS on Information Vol.E81-D No.7 pp.645-653
Publication Date
1998/07/25
Publicized
Online ISSN
DOI
Type of Manuscript
Special Section PAPER (Special Issue on Test and Diagnosis of VLSI)
Category
Test Synthesis

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