Design of Repairable Cellular Arrays on Multiple-Valued Logic

Naotake KAMIURA; Yutaka HATA; Kazuharu YAMATO

Design of Repairable Cellular Arrays on Multiple-Valued Logic

Naotake KAMIURA, Yutaka HATA, Kazuharu YAMATO

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This paper proposes a repairable and diagnosable k-valued cellular array. We assume a single fault, i.e., either stuck-at-O fault or stuck-at-(k1) fault of switches occurs in the array. By building in a duplicate column iteratively, when a stuck-at-(k1) fault occurs in the array, the fault never influences the output of the array. That is, we can construct a fault-tolerant array for the stuck-at-(k1) fault. While, for the stuck-at-O fault, the diagnosing method is simple and easy because we don't have to diagnose the stuck-at-(k1) fault. Moreover, our array can be repaired easily for the fault. The comparison with other rectangular arrays shows that our array has advantages for the number of cells and the cost of the fault diagnosis.

Publication: IEICE TRANSACTIONS on Information Vol.E77-D No.8 pp.877-884

Publication Date: 1994/08/25

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Type of Manuscript: PAPER

Category: Fault Tolerant Computing

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Naotake KAMIURA, Yutaka HATA, Kazuharu YAMATO, "Design of Repairable Cellular Arrays on Multiple-Valued Logic" in IEICE TRANSACTIONS on Information, vol. E77-D, no. 8, pp. 877-884, August 1994, doi: .
Abstract: This paper proposes a repairable and diagnosable k-valued cellular array. We assume a single fault, i.e., either stuck-at-O fault or stuck-at-(k1) fault of switches occurs in the array. By building in a duplicate column iteratively, when a stuck-at-(k1) fault occurs in the array, the fault never influences the output of the array. That is, we can construct a fault-tolerant array for the stuck-at-(k1) fault. While, for the stuck-at-O fault, the diagnosing method is simple and easy because we don't have to diagnose the stuck-at-(k1) fault. Moreover, our array can be repaired easily for the fault. The comparison with other rectangular arrays shows that our array has advantages for the number of cells and the cost of the fault diagnosis.
URL: https://global.ieice.org/en_transactions/information/10.1587/e77-d_8_877/_p

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@ARTICLE{e77-d_8_877,
author={Naotake KAMIURA, Yutaka HATA, Kazuharu YAMATO, },
journal={IEICE TRANSACTIONS on Information},
title={Design of Repairable Cellular Arrays on Multiple-Valued Logic},
year={1994},
volume={E77-D},
number={8},
pages={877-884},
abstract={This paper proposes a repairable and diagnosable k-valued cellular array. We assume a single fault, i.e., either stuck-at-O fault or stuck-at-(k1) fault of switches occurs in the array. By building in a duplicate column iteratively, when a stuck-at-(k1) fault occurs in the array, the fault never influences the output of the array. That is, we can construct a fault-tolerant array for the stuck-at-(k1) fault. While, for the stuck-at-O fault, the diagnosing method is simple and easy because we don't have to diagnose the stuck-at-(k1) fault. Moreover, our array can be repaired easily for the fault. The comparison with other rectangular arrays shows that our array has advantages for the number of cells and the cost of the fault diagnosis.},
keywords={},
doi={},
ISSN={},
month={August},}

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TY - JOUR
TI - Design of Repairable Cellular Arrays on Multiple-Valued Logic
T2 - IEICE TRANSACTIONS on Information
SP - 877
EP - 884
AU - Naotake KAMIURA
AU - Yutaka HATA
AU - Kazuharu YAMATO
PY - 1994
DO -
JO - IEICE TRANSACTIONS on Information
SN -
VL - E77-D
IS - 8
JA - IEICE TRANSACTIONS on Information
Y1 - August 1994
AB - This paper proposes a repairable and diagnosable k-valued cellular array. We assume a single fault, i.e., either stuck-at-O fault or stuck-at-(k1) fault of switches occurs in the array. By building in a duplicate column iteratively, when a stuck-at-(k1) fault occurs in the array, the fault never influences the output of the array. That is, we can construct a fault-tolerant array for the stuck-at-(k1) fault. While, for the stuck-at-O fault, the diagnosing method is simple and easy because we don't have to diagnose the stuck-at-(k1) fault. Moreover, our array can be repaired easily for the fault. The comparison with other rectangular arrays shows that our array has advantages for the number of cells and the cost of the fault diagnosis.
ER -