IEICE TRANSACTIONS on Information
On the Effect of Scheduling in Test Generation
Summary :
The order of faults which are targeted for test-pattern generation affects both of the processing time for test generation and the number of generated test-patterns. This order is referred to as a test generation schedule. In this paper, we consider the effect of scheduling in test generation. We formulate the test generation scheduling problem which minimizes the cost of testing. We propose schedulings based on test-pattern generation time, dominating probability and dominated probability, and analyze the effect of these schedulings. In the analysis, we show that the total test-pattern generation time and the total number of test-patterns can be reduced by the scheduling according to the descending order of dominating probability prior to the ascending order of test-pattern generation. This is confirmed by the experiments using ISCAS'85 benchmark circuits. Further, in the experiments, we consider eight schedulings, and show that the scheduling according to the ascending order of dominated probability is the most effective of them.
- Publication
- IEICE TRANSACTIONS on Information Vol.E79-D No.8 pp.1190-1197
- Publication Date
- 1996/08/25
- Publicized
- Online ISSN
- DOI
- Type of Manuscript
- PAPER
- Category
- Fault Tolerant Computing
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Tomoo INOUE, Hironori MAEDA, Hideo FUJIWARA, "On the Effect of Scheduling in Test Generation" in IEICE TRANSACTIONS on Information,
vol. E79-D, no. 8, pp. 1190-1197, August 1996, doi: .
Abstract: The order of faults which are targeted for test-pattern generation affects both of the processing time for test generation and the number of generated test-patterns. This order is referred to as a test generation schedule. In this paper, we consider the effect of scheduling in test generation. We formulate the test generation scheduling problem which minimizes the cost of testing. We propose schedulings based on test-pattern generation time, dominating probability and dominated probability, and analyze the effect of these schedulings. In the analysis, we show that the total test-pattern generation time and the total number of test-patterns can be reduced by the scheduling according to the descending order of dominating probability prior to the ascending order of test-pattern generation. This is confirmed by the experiments using ISCAS'85 benchmark circuits. Further, in the experiments, we consider eight schedulings, and show that the scheduling according to the ascending order of dominated probability is the most effective of them.
URL: https://global.ieice.org/en_transactions/information/10.1587/e79-d_8_1190/_p
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@ARTICLE{e79-d_8_1190,
author={Tomoo INOUE, Hironori MAEDA, Hideo FUJIWARA, },
journal={IEICE TRANSACTIONS on Information},
title={On the Effect of Scheduling in Test Generation},
year={1996},
volume={E79-D},
number={8},
pages={1190-1197},
abstract={The order of faults which are targeted for test-pattern generation affects both of the processing time for test generation and the number of generated test-patterns. This order is referred to as a test generation schedule. In this paper, we consider the effect of scheduling in test generation. We formulate the test generation scheduling problem which minimizes the cost of testing. We propose schedulings based on test-pattern generation time, dominating probability and dominated probability, and analyze the effect of these schedulings. In the analysis, we show that the total test-pattern generation time and the total number of test-patterns can be reduced by the scheduling according to the descending order of dominating probability prior to the ascending order of test-pattern generation. This is confirmed by the experiments using ISCAS'85 benchmark circuits. Further, in the experiments, we consider eight schedulings, and show that the scheduling according to the ascending order of dominated probability is the most effective of them.},
keywords={},
doi={},
ISSN={},
month={August},}
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TY - JOUR
TI - On the Effect of Scheduling in Test Generation
T2 - IEICE TRANSACTIONS on Information
SP - 1190
EP - 1197
AU - Tomoo INOUE
AU - Hironori MAEDA
AU - Hideo FUJIWARA
PY - 1996
DO -
JO - IEICE TRANSACTIONS on Information
SN -
VL - E79-D
IS - 8
JA - IEICE TRANSACTIONS on Information
Y1 - August 1996
AB - The order of faults which are targeted for test-pattern generation affects both of the processing time for test generation and the number of generated test-patterns. This order is referred to as a test generation schedule. In this paper, we consider the effect of scheduling in test generation. We formulate the test generation scheduling problem which minimizes the cost of testing. We propose schedulings based on test-pattern generation time, dominating probability and dominated probability, and analyze the effect of these schedulings. In the analysis, we show that the total test-pattern generation time and the total number of test-patterns can be reduced by the scheduling according to the descending order of dominating probability prior to the ascending order of test-pattern generation. This is confirmed by the experiments using ISCAS'85 benchmark circuits. Further, in the experiments, we consider eight schedulings, and show that the scheduling according to the ascending order of dominated probability is the most effective of them.
ER -
English
