IEICE TRANSACTIONS on Information
Performance Analysis of Parallel Test Generation for Combinational Circuits
Summary :
The problem of test generation for VLSI circuits computationally requires prohibitive costs. Parallel processing on a multiprocessor system is one of available methods in order to speedup the process for such time-consuming problems. In this paper, we analyze the performance of parallel test generation for combinational circuits. We present two types of parallel test generation systems in which the communication methods are different; vector broadcasting (VB) and fault broadcasting (FB) systems, and analyze the number of generated test vectors, the costs of test vector generation, fault simulation and communication, and the speedup of these parallel test generation systems, where the two types of communication factors; the communication cut-off factor and the communication period, are applied. We also present experimental results on the VB and FB systems implemented on a network of workstations using ISCAS'85 and ISCAS'89 benchmark circuits. The analytical and experimental results show that the total number of test vectors generated in the VB system is the same as that in the FB system, the speedup of the FB system is larger than that of the VB, and it is effective in reducing the communication cost to switch broadcasted data from vectors to faults.
- Publication
- IEICE TRANSACTIONS on Information Vol.E79-D No.9 pp.1257-1265
- Publication Date
- 1996/09/25
- Publicized
- Online ISSN
- DOI
- Type of Manuscript
- PAPER
- Category
- Fault Tolerant Computing
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Tomoo INOUE, Takaharu FUJII, Hideo FUJIWARA, "Performance Analysis of Parallel Test Generation for Combinational Circuits" in IEICE TRANSACTIONS on Information,
vol. E79-D, no. 9, pp. 1257-1265, September 1996, doi: .
Abstract: The problem of test generation for VLSI circuits computationally requires prohibitive costs. Parallel processing on a multiprocessor system is one of available methods in order to speedup the process for such time-consuming problems. In this paper, we analyze the performance of parallel test generation for combinational circuits. We present two types of parallel test generation systems in which the communication methods are different; vector broadcasting (VB) and fault broadcasting (FB) systems, and analyze the number of generated test vectors, the costs of test vector generation, fault simulation and communication, and the speedup of these parallel test generation systems, where the two types of communication factors; the communication cut-off factor and the communication period, are applied. We also present experimental results on the VB and FB systems implemented on a network of workstations using ISCAS'85 and ISCAS'89 benchmark circuits. The analytical and experimental results show that the total number of test vectors generated in the VB system is the same as that in the FB system, the speedup of the FB system is larger than that of the VB, and it is effective in reducing the communication cost to switch broadcasted data from vectors to faults.
URL: https://global.ieice.org/en_transactions/information/10.1587/e79-d_9_1257/_p
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@ARTICLE{e79-d_9_1257,
author={Tomoo INOUE, Takaharu FUJII, Hideo FUJIWARA, },
journal={IEICE TRANSACTIONS on Information},
title={Performance Analysis of Parallel Test Generation for Combinational Circuits},
year={1996},
volume={E79-D},
number={9},
pages={1257-1265},
abstract={The problem of test generation for VLSI circuits computationally requires prohibitive costs. Parallel processing on a multiprocessor system is one of available methods in order to speedup the process for such time-consuming problems. In this paper, we analyze the performance of parallel test generation for combinational circuits. We present two types of parallel test generation systems in which the communication methods are different; vector broadcasting (VB) and fault broadcasting (FB) systems, and analyze the number of generated test vectors, the costs of test vector generation, fault simulation and communication, and the speedup of these parallel test generation systems, where the two types of communication factors; the communication cut-off factor and the communication period, are applied. We also present experimental results on the VB and FB systems implemented on a network of workstations using ISCAS'85 and ISCAS'89 benchmark circuits. The analytical and experimental results show that the total number of test vectors generated in the VB system is the same as that in the FB system, the speedup of the FB system is larger than that of the VB, and it is effective in reducing the communication cost to switch broadcasted data from vectors to faults.},
keywords={},
doi={},
ISSN={},
month={September},}
Copy
TY - JOUR
TI - Performance Analysis of Parallel Test Generation for Combinational Circuits
T2 - IEICE TRANSACTIONS on Information
SP - 1257
EP - 1265
AU - Tomoo INOUE
AU - Takaharu FUJII
AU - Hideo FUJIWARA
PY - 1996
DO -
JO - IEICE TRANSACTIONS on Information
SN -
VL - E79-D
IS - 9
JA - IEICE TRANSACTIONS on Information
Y1 - September 1996
AB - The problem of test generation for VLSI circuits computationally requires prohibitive costs. Parallel processing on a multiprocessor system is one of available methods in order to speedup the process for such time-consuming problems. In this paper, we analyze the performance of parallel test generation for combinational circuits. We present two types of parallel test generation systems in which the communication methods are different; vector broadcasting (VB) and fault broadcasting (FB) systems, and analyze the number of generated test vectors, the costs of test vector generation, fault simulation and communication, and the speedup of these parallel test generation systems, where the two types of communication factors; the communication cut-off factor and the communication period, are applied. We also present experimental results on the VB and FB systems implemented on a network of workstations using ISCAS'85 and ISCAS'89 benchmark circuits. The analytical and experimental results show that the total number of test vectors generated in the VB system is the same as that in the FB system, the speedup of the FB system is larger than that of the VB, and it is effective in reducing the communication cost to switch broadcasted data from vectors to faults.
ER -
English
