Efficient Test Generation Using Redundancy Identification
Summary :
To accomplish an efficient test pattern generation, the isomorphism identification algorithm and the pseudo dominator identification algorithm are developed which are used to identify redundant faults efficiently. Results show that test pattern generation using these algorithms is very efficient.
- Publication
- IEICE TRANSACTIONS on Information Vol.E83-D No.9 pp.1814-1815
- Publication Date
- 2000/09/25
- Publicized
- Online ISSN
- DOI
- Type of Manuscript
- LETTER
- Category
- Fault Tolerance
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Keyword
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Sangyoon HAN, Sungho KANG, "Efficient Test Generation Using Redundancy Identification" in IEICE TRANSACTIONS on Information,
vol. E83-D, no. 9, pp. 1814-1815, September 2000, doi: .
Abstract: To accomplish an efficient test pattern generation, the isomorphism identification algorithm and the pseudo dominator identification algorithm are developed which are used to identify redundant faults efficiently. Results show that test pattern generation using these algorithms is very efficient.
URL: https://global.ieice.org/en_transactions/information/10.1587/e83-d_9_1814/_p
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@ARTICLE{e83-d_9_1814,
author={Sangyoon HAN, Sungho KANG, },
journal={IEICE TRANSACTIONS on Information},
title={Efficient Test Generation Using Redundancy Identification},
year={2000},
volume={E83-D},
number={9},
pages={1814-1815},
abstract={To accomplish an efficient test pattern generation, the isomorphism identification algorithm and the pseudo dominator identification algorithm are developed which are used to identify redundant faults efficiently. Results show that test pattern generation using these algorithms is very efficient.},
keywords={},
doi={},
ISSN={},
month={September},}
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TY - JOUR
TI - Efficient Test Generation Using Redundancy Identification
T2 - IEICE TRANSACTIONS on Information
SP - 1814
EP - 1815
AU - Sangyoon HAN
AU - Sungho KANG
PY - 2000
DO -
JO - IEICE TRANSACTIONS on Information
SN -
VL - E83-D
IS - 9
JA - IEICE TRANSACTIONS on Information
Y1 - September 2000
AB - To accomplish an efficient test pattern generation, the isomorphism identification algorithm and the pseudo dominator identification algorithm are developed which are used to identify redundant faults efficiently. Results show that test pattern generation using these algorithms is very efficient.
ER -
English
