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The Impact of Defect (Re) Prediction on Software Testing

Yukasa MURAKAMI, Yuta YAMASAKI, Masateru TSUNODA, Akito MONDEN, Amjed TAHIR, Kwabena Ebo BENNIN, Koji TODA, Keitaro NAKASAI

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Summary :

Publication
IEICE TRANSACTIONS on Information Vol.0 No.0 pp.0-0
Publicized
2024/09/09
DOI
10.1587/10.1587/transinf.2024MPL0002
Type of Manuscript
LETTER

Authors

Contents