Referenceless Signature Testing Using Bi-Directional LFSR
Summary :
This paper proposes a unique type of signature testing for VLSIs, called referenceless signature testing. This testing automatically produces a reference value, i.e., correct signature, during its test intervals and compares it with compacted output of the circuit under test, i.e., signature. This makes testing much easier because it does not need the reference value, usually pre-calculated by simulation. This paper also proposes an extended form of this testing which offers economical and highly accurate one by using by-directional LFSRs for RAMs and sequential circuits. The proposed approach is successfully applied to these circuits, because the reference value can be automatically produced with their store operations and bi-directional input sequences for test data. An application of this testing to self-dual combinational circuits is also demonstrated in this paper.
- Publication
- IEICE TRANSACTIONS on transactions Vol.E71-E No.10 pp.1013-1022
- Publication Date
- 1988/10/25
- Publicized
- Online ISSN
- DOI
- Type of Manuscript
- PAPER
- Category
- Fault Tolerant Computing
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Eiji FUJIWARA, "Referenceless Signature Testing Using Bi-Directional LFSR" in IEICE TRANSACTIONS on transactions,
vol. E71-E, no. 10, pp. 1013-1022, October 1988, doi: .
Abstract: This paper proposes a unique type of signature testing for VLSIs, called referenceless signature testing. This testing automatically produces a reference value, i.e., correct signature, during its test intervals and compares it with compacted output of the circuit under test, i.e., signature. This makes testing much easier because it does not need the reference value, usually pre-calculated by simulation. This paper also proposes an extended form of this testing which offers economical and highly accurate one by using by-directional LFSRs for RAMs and sequential circuits. The proposed approach is successfully applied to these circuits, because the reference value can be automatically produced with their store operations and bi-directional input sequences for test data. An application of this testing to self-dual combinational circuits is also demonstrated in this paper.
URL: https://global.ieice.org/en_transactions/transactions/10.1587/e71-e_10_1013/_p
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@ARTICLE{e71-e_10_1013,
author={Eiji FUJIWARA, },
journal={IEICE TRANSACTIONS on transactions},
title={Referenceless Signature Testing Using Bi-Directional LFSR},
year={1988},
volume={E71-E},
number={10},
pages={1013-1022},
abstract={This paper proposes a unique type of signature testing for VLSIs, called referenceless signature testing. This testing automatically produces a reference value, i.e., correct signature, during its test intervals and compares it with compacted output of the circuit under test, i.e., signature. This makes testing much easier because it does not need the reference value, usually pre-calculated by simulation. This paper also proposes an extended form of this testing which offers economical and highly accurate one by using by-directional LFSRs for RAMs and sequential circuits. The proposed approach is successfully applied to these circuits, because the reference value can be automatically produced with their store operations and bi-directional input sequences for test data. An application of this testing to self-dual combinational circuits is also demonstrated in this paper.},
keywords={},
doi={},
ISSN={},
month={October},}
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TY - JOUR
TI - Referenceless Signature Testing Using Bi-Directional LFSR
T2 - IEICE TRANSACTIONS on transactions
SP - 1013
EP - 1022
AU - Eiji FUJIWARA
PY - 1988
DO -
JO - IEICE TRANSACTIONS on transactions
SN -
VL - E71-E
IS - 10
JA - IEICE TRANSACTIONS on transactions
Y1 - October 1988
AB - This paper proposes a unique type of signature testing for VLSIs, called referenceless signature testing. This testing automatically produces a reference value, i.e., correct signature, during its test intervals and compares it with compacted output of the circuit under test, i.e., signature. This makes testing much easier because it does not need the reference value, usually pre-calculated by simulation. This paper also proposes an extended form of this testing which offers economical and highly accurate one by using by-directional LFSRs for RAMs and sequential circuits. The proposed approach is successfully applied to these circuits, because the reference value can be automatically produced with their store operations and bi-directional input sequences for test data. An application of this testing to self-dual combinational circuits is also demonstrated in this paper.
ER -
English
