An advantage of an RLD (reconfigurable logic device) such as an FPGA (field programmable gate array) is that it can be customized after being manufactured. Due to the aggressive technology scaling, device density is increasing, and it has become a serious problem in power consumption accordingly. In SoC of embedded systems, power gating is one of the major power reduction techniques. However, it is difficult to adopt SRAM-based RLDs because of the high overhead and SRAM being volatile. In this paper, we describe a TEG (test element group) chip of a reconfigurable logic based FeRAM (ferroelectric random access memory) technology. FeRAM brings reconfigurable logic devices the advantage of being a genuine power gater. The chip employs island-style routing architecture and uses a variable grain logic cell as a logic block. A NV-FF (non-volatile flip-flop), which contains FeRAM, a FF, and power-gating control circuits, is used as both configuration memories and FFs in a logic block. The NV-FF can transmit data between FeRAM and FF automatically when a power source is turned off/on. Thus chip-level power gating is possible. The hibernate/restore time is less than 1 ms. The chip has 1818 logic blocks and an area of 54.76 mm2.

The most widely used open-source field programmable gate array (FPGA) placement and routing tool is the Versatile Packing, Placement and Routing (VPR) software developed at the University of Toronto, Canada. VPR calculates area and timing using target FPGA architecture and physical information. However, it cannot be used in FPGA IP design efficiently for two reasons. First, VPR cannot directly support most newly developed FPGA architectures, and modifying the C-coded VPR so that it can be used to evaluate a number of new architectures is time consuming. Second, the accuracy of the VPR performance results is inadequate for the evaluation of a complete FPGA IP in a design that targets the production of LSI. We propose an FPGA design framework that is focused on improving FPGA IP design efficiency. A novel FPGA routing tool is developed in this framework, namely the EasyRouter which uses the C# language. When an object-oriented programming method is used, there is less source code and it is easier to manage compared to VPR, thus shortening the development time. By using simple HDL code templates, EasyRouter can automatically generate the entire HDL code for a chip and the configuration bitstream. With these files, the FPGA IP can be evaluated with commercial VLSI CAD systems with high accuracy and reliability.

Fault tolerance is an important feature for the system LSIs used in reliability-critical systems. Although redundancy techniques are generally used to provide fault tolerance, these techniques have significantly hardware costs. However, FPGAs can easily provide high reliability due to their reconfiguration ability. Even if faults occur, the implemented circuit can perform correctly by reconfiguring to a fault-free region of the FPGA. In this paper, we examine an FPGA-IP core loaded in SoC and introduce a fault-tolerant technology based on fault detection and recovery as a CAD-level approach. To detect fault position, we add a route to the manufacturing test method proposed in earlier research and identify fault areas. Furthermore, we perform fault recovery at the logic tile and multiplexer levels using reconfiguration. The evaluation results for the FPGA-IP core loaded in the system LSI demonstrate that it was able to completely identify and avoid fault areas relative to the faults in the routing area.

Generally, a programmable LSI such as an FPGA is difficult to test compared to an ASIC. There are two major reasons for this. The first is that an automatic test pattern generator (ATPG) cannot be used because of the programmability of the FPGA. The other reason is that the FPGA architecture is very complex. In this paper, we propose a new FPGA architecture that will simplify the testing of the device. The base of our architecture is general island-style FPGA architecture, but it consists of a few types of circuit blocks and orderly wire connections. This paper also presents efficient test configurations for our proposed architecture. We evaluated our architecture and test configurations using a prototype chip. As a result, the chip was fully tested using our configurations in a short test time. Moreover, our architecture can provide comparable performance to a conventional FPGA architecture.