This paper proposes a reconfigurable parallel processor based on a two-dimensional linear celular automaton model. The processor based on the model can be reconfigured quickly by utilizing the characteristics of the automaton used for its model. Moreover, the processor has short data path length between processing elements compared with the length of the processor based on one-dimensional linear cellular automaton model which has been already discussed. The processing elements of the processor based on the two-dimensional linear cellular automaton model are regarded as cells and the operational states of the processor are treated as the states of the automaton. When faults are detected, the processor can be reconfigured by changing its state under the state transition function of the processor determined by the weighting function of the automaton model. The processor can be reconfigured within a clock period required for making a state transition. This processor is extremely effective for real-time data processing systems required high reliability.

Current testing has been proposed as an alternative technique for testing fully CMOS digital LSIs. Current testing has higher fault coverage than conventional stuck-at fault (SAF) testing and is more economical because it detects a wide range of faults and requires fewer test vectors than does SAF testing. We have proposed a current testing that measures the integral of the power supply current (IDD) during one clock period including the switching current. Since this method cannot be affected by the switching current, it can be used to test an LSI operating at a relatively high clock freuqnecy. This paper presents an improved current testing method for CMOS digital and analog LSIs. The method uses two current values (i.e., an upper limit and a lower limit) and judges the circuit under test to be faulty if the measured IDD is outside these limits. The proposed current testing is evaluated here for some kinds of faults (e.g., the bridging fault and the breaking fault) in digital and mixed-signal LSIs, and its efficiency of the current testing using SPICE3.

This paper presents a new language for writing specifications for digital systems. In the language (Buffer) to be described much attention has been given to its constructs for making the specifications understandable, precise enough, unambiguous, and easy to check for completeness and consistency.

This paper describes a new method for verifying designs at the RTL with respect to their specifications at the functional level. The base of the verification method shown here is the translation of the specification and design representations to graph models, where the descriptions common to both representations have a symbolic representation. These symbol labeled graphs are then simplified and, by solving the all node-pair path expression problem for them, a pair of regular expressions is obtained for every two nodes in the graphs. The first regular expression in each pair represents the flow of control and the second one the flow of data between the corresponding nodes. The process of verification is carried out by checking whether or not every pair of regular expressions of the specification has a corresponding pair in the design.

This letter proposes a concurrent fault detection scheme for a butterfly unit in an FFT processor. A fault in a butterfly unit is detected by recomuting. Input data to the butterfly unit is coded by a bit rotation and used for recomputing. The recomputed outputs are decoded and compared with the output for the first computation. The hardware overhead for the scheme is O(N) and the time overhead is O(log (N)) where N is the number of input data.