Boundary Constraints of VLSI floorplanning require a set of blocks to be placed along the boundaries of the chip. Thus, this set of blocks can be adjacent to I/O pads for external communication. Furthermore, these blocks are kept away from the central area so that they do not form blockage for internal routing. In the paper, we devise an algorithm of VLSI floorplanning with boundary constraints using a Corner Block List (CBL) representation. We identify the necessary and sufficient conditions of the CBL representation for the boundary constraints. We design a linear time approach to scan the conditions and formulate a penalty function to punish the constraint violation. A simulated annealing process is adopted to optimize the floorplan. Experiments on MCNC benchmarks show promising results.

Due to the increased power density and lower thermal conductivity, 3D ICs are faced with heat dissipation and temperature problem seriously. TSV (Through-Silicon-Via) has been shown as an effective way to help heat removal, but they introduce several issues related with cost and reliability as well. Previous researches of TSV planning didn't pay much attention to the impact of leakage power, which will bring in error on estimation of temperature, TSV number and also critical path delay. The leakage-temperature-delay dependence can potentially negate the performance improvement of 3D designs. In this paper, we analyze the impact of leakage power on TSV planning and integrate leakage-temperature-delay dependence into thermal via planning of 3D ICs. A weighted via insertion approach, considering the influence on both module delay and wire delay, is proposed to achieve the best balance among temperature, via number and performance. Experiment results show that, with leakage power and resource constraint considered, temperature and the required via number can be quite different, and the weighted TSV insertion approach with iterative process can obtain the trade-off between different factors including thermal, power consumption, via number and performance.

In 3D IC design, thermal issue is a critical challenge. To eliminate hotspots, physical layouts are always adjusted by some incremental changes, such as shifting or duplicating hot blocks. In this paper, we distinguish the thermal-aware incremental changes in three different categories: migrating computation, growing unit and moving hotspot blocks. However, these modifications may degrade the packing area as well as interconnect distribution greatly. In this paper, mixed integer linear programming (MILP) models are devised according to these different incremental changes so that multiple objectives can be optimized simultaneously. Furthermore, to avoid random incremental modification, which may be inefficient and need long runtime to converge, here potential gain is modeled for each candidate incremental change. Based on the potential gain, a novel thermal optimization flow to intelligently choose the best incremental operation is presented. Experimental results show that migrating computation, growing unit and moving hotspot can reduce max on-chip temperature by 7%, 13% and 15% respectively on MCNC/GSRC benchmarks. Still, experimental results also show that the thermal optimization flow can reduce max on-chip temperature by 14% to the initial packings generated by an existing 3D floorplanning tool CBA, and achieve better area and total wirelength improvement than individual operations do. The results with the initial packings from CBA_T (Thermal-aware CBA floorplanner) show that 13.5% temperature reduction can be obtained by our incremental optimization flow.