This paper presents a simple numerical method for calculating the stationary transmission and reflection characteristics of a variety of nonlinear Fably-Perot resonators. In nonlinear media, Maxwell's equations are directly solved by using a numerical integration of complex variables. The input-output characteristics of the Kerr-like nonlinear film without reflection mirrors and with multilayer mirrors have been calculated to demonstrate the usefulness and versatility of the proposed method and to find out resonator configurations exhibiting optical bistability at low incident-power levels. The effects of saturation in the nonlinear permittivity on the input-output characteristics have also been investigated. It has been found that a single nonlinear film with oblique incidence exhibits optical bistability without using reflection mirrors even if the refractive index of the film is low. This offers a simple method for measuring third-order nonlinearities of optical materials.

Signature analysis using a Multiple-Input LFSR as the output response compaction circuit is widely adopted in actual BIST schemes. While aliasing probabilities for random errors are usually very small, MI-LFSRs are tend to fail detecting diagonal errors. A spot error, which include the diagonal error as a particular case, is defined as multiple bit crrors adjacent in space and in time domain. Then, shuffling of interconnection between CUT output and MI-LFSR input is studied as a scheme to prevent aliasing for such errors. The condition for preventing aliasing due to a predetermined size of single spot error is shown. Block based shuffling and the shortened one are proposed to realize required distance properties. Effect of shuffling for multiple spot errors is examined by simulation showing that shuffling is effective also for a certain extend of multiple spot errors.

MISRs are widely used as signature circuits for VLSI built-in self tests. To improve the aliasing probability of MISRs, multiple MISRs and M-stage MISRs with m inputs are available, where M is grater than m. The aliasing probability as a function of the test length is analyzed for the compaction circuits for a binary symmetric channel. It is observed that the peak aliasing probability of the double MISRs is less than that of M-stage MISRs with m inputs. It is also shown that the final aliasing probability for a multiple MISR with d MISRs is 2dm and that for an M-stage MISR with m imputs is 2M if it is characterized by a primitive polynomial.