In this paper, we propose a novel migration method. In this method, the resultant placement retains the structure of the original placement, called model placement, as much as possible. For this purpose, we minimize the sum of the difference in area between the model placement and the relocated one and the total amount of displacement between them. Moreover, to achieve a short runtime, we limit the solution space and change the packing origin in the optimization process. We construct the system on Sequence-Pair. Experimental results show that our approach preserves the chip area and the overall circuit structure with 98% less runtime than that realized by naive simulated annealing.

The outputs of all gates in a circuit are assumed to be observable unber the highly observable condition, which is mainly based on the use of E-beam testers. When using the E-beam tester, it is desirable that the test set for a circuit is small and the test vectors in the test set can be applied in a successive and repetitive manner. For a combinational circuit, these requirements can be satisfied by modifying the circuit into a k-UCP circuit, which needs only a small number of tests for diagnosis. For a sequential circuit, however, even if the combinational portion has been modified into a k-UCP circuit, it is impossible that the test vectors for the combinational portion can always be applied in a successive and repetitive manner because of the existence of feedback loops. To solve this problem, the concept of k-UCP scan circuits is proposed in this paper. It is shown that the test vectors for the combinational portion in a k-UCP scan circuit can be applied in a successive and repetitive manner through a specially constructed scan-path. An efficient method of modifying a sequential circuit into a k-UCP scan circuit is also presented.