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[Keyword] high-speed DAC(2hit)

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  • Design of a Small-Offset 12-Bit CMOS DAC Using Weighted Mean Sample-and-Hold Circuit

    Masayuki UNO  Shoji KAWAHITO  

     
    PAPER

      Vol:
    E89-C No:6
      Page(s):
    702-709

    This paper describes the design of a small-offset 12-bit CMOS charge-redistribution DAC using a weighted-mean flip-around sample-and-hold circuit (S/H). Flip-around S/H topology can realize small-offset characteristics, and it is effective to reduce power dissipation and chip area because independent feedback capacitors are not necessary. In this DAC the small-offset characteristic remains not only in amplification phase but also in sampling phase with the circuit technique. The design of 1.8 V, 50 MS/s fully differential DAC with output swing of 2 Vp-p has very small offset of 100 µV for the reset switch mismatch of 2%. A technique to improve dynamic performance measured by SFDR using damping resistors and switches at the output stage is also presented. The designed 12-bit DAC with 0.25 µm CMOS technology has low-power dissipation of 35 mW at 50 MS/s.

  • The Design of a 2.7 V, 200 MS/s, and 14-Bit CMOS D/A Converter with 63 dB of SFDR Characteristics for the 90 MHz Output Signal

    Hiroki SAKURAI  Yasuhiro SUGIMOTO  

     
    PAPER

      Vol:
    E86-C No:6
      Page(s):
    1077-1084

    This paper describes the design of a 2.7 V operational, 200 MS/s, 14-bit CMOS D/A converter (DAC). The DAC consists of 63 current cells in matrix form for an upper 6-bit sub-DAC, and 8 current cells and R-2R ladder resistors for a lower 8-bit sub-DAC. A source degeneration resistor, for which a transistor in the triode operational region is used, is connected to the source of a MOS current source transistor in a current cell in order to reduce the influence of threshold voltage (Vth) variation and to satisfy the differential nonlinearity error specification as a 14-bit DAC. In conventional high-speed and high-resolution DACs that have the same design specifications described here, spurious-free dynamic range (SFDR) characteristics commonly deteriorate drastically as the frequency of the reconstructed waveform increases. The causes of this deterioration were carefully examined in the present study, finding that the deterioration is caused in part by the input-data-dependent time-constant change at the output terminal. Unexpected current flow in parasitic capacitors associated with current sources causes the change in the output current depending on the input data, resulting in time-constant change. In order to solve this problem, we propose a new output circuit to fix the voltage at the node where the outputs of the current sources are combined. SPICE circuit simulation demonstrates that 63 dB of SFDR characteristics for the 90 MHz reconstructed waveform at the output can be realizable when the supply voltage is 2.7 V, the clock rate is 200 MS/s, and the power dissipation is estimated to be 300 mW.