A 150 MS/s 10-bit MOS-inverter-based subranging analog-to-digital converter (ADC) dedicated to a high-speed low-power application is presented in this paper. A new time constant reduction technique is proposed in the multi-stage preamplifier design which aims to further increase the speed of the coarse ADC. A synchronized switch is introduced to minimize the sample-time mismatch in the interleaved architecture of fine ADCs. An internal pipelined scheme incorporating the double sampling and interleaving techniques in fine ADCs allows the ADC sample input signal to run on a consecutive clock, thus maximizing the throughput. The prototype ADC achieves 52 dB SNDR for a 10 MHz input frequency at 150 MS/s. Without calibration, the measured differential nonlinearity (DNL) is 0.5 LSB, while the integral nonlinearity (INL) is 0.9 LSB. The CMOS ADC is fabricated in a 0.35 µm CMOS technology, with an active area of 2.7 mm2, consuming only 178 mW from a single 3 V supply. Comparing technology normalized figure-of-merits, it achieves better power-speed efficiency than other similar types of ADCs.

This work describes an 8b 200 MHz time-interleaved subranging analog-to-digital converter (ADC) based on a single-poly digital CMOS process. Two fine ADCs for lower digital bits of the proposed ADC employ a time-sharing double- channel architecture to increase the sampling speed and a new reference voltage switching scheme to reduce the settling time of the reference voltages and the chip area. The proposed intermeshed resistor string, which generates reference voltages for fine ADCs, improves the linearity and the settling time of the reference voltages simultaneously. The proposed sample-and-hold amplifier employs an input dynamic common mode feedback circuit for high dynamic performance, based on conventional common-drain amplifiers and passive differential circuits.