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[Keyword] successive approximation register ADC(2hit)

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  • Digital Calibration Algorithm of Conversion Error Influenced by Parasitic Capacitance in C-C SAR-ADC Based on γ-Estimation

    Satoshi SEKINE  Tatsuji MATSUURA  Ryo KISHIDA  Akira HYOGO  

     
    PAPER

      Vol:
    E104-A No:2
      Page(s):
    516-524

    C-C successive approximation register analog-to-digital converter (C-C SAR-ADC) is space-saving architecture compared to SAR-ADC with binary weighted capacitive digital-to-analog converter (CDAC). However, the accuracy of C-C SAR-ADC is degraded due to parasitic capacitance of floating nodes. This paper proposes an algorithm calibrating the non-linearity by γ-estimation to accurately estimate radix greater than 2 required to realize C-C SAR-ADC. Behavioral analyses show that the radix γ-estimation error become within 1.5, 0.4 and 0.1% in case of 8-, 10- and 12-bit resolution ADC, respectively. SPICE simulations show that the γ-estimation satisfies the requirement of 10-bit resolution C-C SAR-ADC. The C-C SAR-ADC using γ-estimation achieves 9.72bit of ENOB, 0.8/-0.5LSB and 0.5/-0.4LSB of DNL/INL.

  • An 11-Bit Single-Ended SAR ADC with an Inverter-Based Comparator for Design Automation

    Guan-Wei JEN  Wei-Liang LIN  

     
    BRIEF PAPER-Electronic Circuits

      Vol:
    E99-C No:12
      Page(s):
    1331-1334

    This paper proposes a low power single-ended successive approximation register (SAR) analog-to-digital converter (ADC) to replace the only analog active circuit, the comparator, with a digital circuit, which is an inverter-based comparator. The replacement helps possible design automation. The inverter threshold voltage variation impact is minimal because an SAR ADC has only one comparator, and many applications are either insensitive to the resulting ADC offset or easily corrected digitally. The proposed resetting approach mitigates leakage when the input is close to the threshold voltage. As an intrinsic headroom-free, and thus low-rail-voltage, friendly structure, an inverter-based comparator also occupies a small area. Furthermore, an 11-bit ADC was designed and manufactured through a 0.35-µm CMOS process by adopting a low-power switching procedure. The ADC achieves an FOM of 181fJ/Conv.-step at a 25kS/s sampling rate when the supply voltage VDD is 1.2V.