2-Transistor, 1.5-Gate Redundancy Technology for Color TFT-LCDs

Tadamichi KAWADA; Hideki NAKAJIMA; Shigeto KOHDA; Shigenobu SAKAI

2-Transistor, 1.5-Gate Redundancy Technology for Color TFT-LCDs

Tadamichi KAWADA, Hideki NAKAJIMA, Shigeto KOHDA, Shigenobu SAKAI

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This paper proposes a new duplication redundancy technology, 2 Transistors for 1.5 Gates, that is capable of automatic defect tolerance, so making large, high-resolution, color TFT-LCD panel fabrication both easy and economical. This redundancy technology with automatic defect tolerant capability has a low hardware overhead and is very capable of compensating for open circuit defects in a large active-matrix panel. This technology was confirmed by fabricating a 9.5-inch color TFT-LCD panel with 640480 pixels(960960 dots). This panel showed excellent display performance and produced pictures without defects. The yield improvement effect of this technology was also confirmed by calculation based on the Boltzmann statistics model. Consequently, this technology is clearly seen to have a yield improvement effect equal to defect density reduction of about one order, compared to non redundancy. This technology drastically reduces dot and line defects, enabling fabrication of large, high-resolution, color TFT-LCD panels at a relatively low cost.

Publication: IEICE TRANSACTIONS on Electronics Vol.E79-C No.8 pp.1083-1090

Publication Date: 1996/08/25

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Type of Manuscript: Special Section PAPER (Special Issue on Liquid-Crystal Displays)

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Tadamichi KAWADA, Hideki NAKAJIMA, Shigeto KOHDA, Shigenobu SAKAI, "2-Transistor, 1.5-Gate Redundancy Technology for Color TFT-LCDs" in IEICE TRANSACTIONS on Electronics, vol. E79-C, no. 8, pp. 1083-1090, August 1996, doi: .
Abstract: This paper proposes a new duplication redundancy technology, 2 Transistors for 1.5 Gates, that is capable of automatic defect tolerance, so making large, high-resolution, color TFT-LCD panel fabrication both easy and economical. This redundancy technology with automatic defect tolerant capability has a low hardware overhead and is very capable of compensating for open circuit defects in a large active-matrix panel. This technology was confirmed by fabricating a 9.5-inch color TFT-LCD panel with 640480 pixels(960960 dots). This panel showed excellent display performance and produced pictures without defects. The yield improvement effect of this technology was also confirmed by calculation based on the Boltzmann statistics model. Consequently, this technology is clearly seen to have a yield improvement effect equal to defect density reduction of about one order, compared to non redundancy. This technology drastically reduces dot and line defects, enabling fabrication of large, high-resolution, color TFT-LCD panels at a relatively low cost.
URL: https://global.ieice.org/en_transactions/electronics/10.1587/e79-c_8_1083/_p

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@ARTICLE{e79-c_8_1083,
author={Tadamichi KAWADA, Hideki NAKAJIMA, Shigeto KOHDA, Shigenobu SAKAI, },
journal={IEICE TRANSACTIONS on Electronics},
title={2-Transistor, 1.5-Gate Redundancy Technology for Color TFT-LCDs},
year={1996},
volume={E79-C},
number={8},
pages={1083-1090},
abstract={This paper proposes a new duplication redundancy technology, 2 Transistors for 1.5 Gates, that is capable of automatic defect tolerance, so making large, high-resolution, color TFT-LCD panel fabrication both easy and economical. This redundancy technology with automatic defect tolerant capability has a low hardware overhead and is very capable of compensating for open circuit defects in a large active-matrix panel. This technology was confirmed by fabricating a 9.5-inch color TFT-LCD panel with 640480 pixels(960960 dots). This panel showed excellent display performance and produced pictures without defects. The yield improvement effect of this technology was also confirmed by calculation based on the Boltzmann statistics model. Consequently, this technology is clearly seen to have a yield improvement effect equal to defect density reduction of about one order, compared to non redundancy. This technology drastically reduces dot and line defects, enabling fabrication of large, high-resolution, color TFT-LCD panels at a relatively low cost.},
keywords={},
doi={},
ISSN={},
month={August},}

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TY - JOUR
TI - 2-Transistor, 1.5-Gate Redundancy Technology for Color TFT-LCDs
T2 - IEICE TRANSACTIONS on Electronics
SP - 1083
EP - 1090
AU - Tadamichi KAWADA
AU - Hideki NAKAJIMA
AU - Shigeto KOHDA
AU - Shigenobu SAKAI
PY - 1996
DO -
JO - IEICE TRANSACTIONS on Electronics
SN -
VL - E79-C
IS - 8
JA - IEICE TRANSACTIONS on Electronics
Y1 - August 1996
AB - This paper proposes a new duplication redundancy technology, 2 Transistors for 1.5 Gates, that is capable of automatic defect tolerance, so making large, high-resolution, color TFT-LCD panel fabrication both easy and economical. This redundancy technology with automatic defect tolerant capability has a low hardware overhead and is very capable of compensating for open circuit defects in a large active-matrix panel. This technology was confirmed by fabricating a 9.5-inch color TFT-LCD panel with 640480 pixels(960960 dots). This panel showed excellent display performance and produced pictures without defects. The yield improvement effect of this technology was also confirmed by calculation based on the Boltzmann statistics model. Consequently, this technology is clearly seen to have a yield improvement effect equal to defect density reduction of about one order, compared to non redundancy. This technology drastically reduces dot and line defects, enabling fabrication of large, high-resolution, color TFT-LCD panels at a relatively low cost.
ER -